DE3886767D1 - Kalibrierungssystem für koordinatenmessvorrichtung. - Google Patents

Kalibrierungssystem für koordinatenmessvorrichtung.

Info

Publication number
DE3886767D1
DE3886767D1 DE88910276T DE3886767T DE3886767D1 DE 3886767 D1 DE3886767 D1 DE 3886767D1 DE 88910276 T DE88910276 T DE 88910276T DE 3886767 T DE3886767 T DE 3886767T DE 3886767 D1 DE3886767 D1 DE 3886767D1
Authority
DE
Germany
Prior art keywords
measuring device
calibration system
coordinate measuring
calibration
coordinate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88910276T
Other languages
English (en)
Other versions
DE3886767T3 (de
DE3886767T2 (de
Inventor
Walter Beckwith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Brown and Sharpe Manufacturing Co
Original Assignee
Brown and Sharpe Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22404668&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3886767(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Brown and Sharpe Manufacturing Co filed Critical Brown and Sharpe Manufacturing Co
Application granted granted Critical
Publication of DE3886767D1 publication Critical patent/DE3886767D1/de
Publication of DE3886767T2 publication Critical patent/DE3886767T2/de
Publication of DE3886767T3 publication Critical patent/DE3886767T3/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE3886767T 1987-11-19 1988-10-31 Kalibrierungssystem für koordinatenmessvorrichtung. Expired - Fee Related DE3886767T3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/122,771 US4884889A (en) 1987-11-19 1987-11-19 Calibration system for coordinate measuring machine
PCT/US1988/003855 WO1989004945A1 (en) 1987-11-19 1988-10-31 Calibration system for coordinate measuring machine

Publications (3)

Publication Number Publication Date
DE3886767D1 true DE3886767D1 (de) 1994-02-10
DE3886767T2 DE3886767T2 (de) 1994-05-11
DE3886767T3 DE3886767T3 (de) 1998-03-12

Family

ID=22404668

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3886767T Expired - Fee Related DE3886767T3 (de) 1987-11-19 1988-10-31 Kalibrierungssystem für koordinatenmessvorrichtung.

Country Status (5)

Country Link
US (1) US4884889A (de)
EP (1) EP0386115B2 (de)
JP (1) JP2694986B2 (de)
DE (1) DE3886767T3 (de)
WO (1) WO1989004945A1 (de)

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GB8713715D0 (en) * 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
GB8820777D0 (en) * 1988-09-02 1988-10-05 Renishaw Plc Tape scale applicator
ES2014184A6 (es) * 1989-07-28 1990-06-16 Garcia Pastor Daniel Equipo movil para la verificacion de superficies rectificadas o en proceso de rectificacion.
US5168454A (en) * 1989-10-30 1992-12-01 International Business Machines Corporation Formation of high quality patterns for substrates and apparatus therefor
FR2662793B1 (fr) * 1990-05-30 1994-03-18 Renault Installation de mesure en continu des defauts de forme d'une piece, et procede de mesure mis en óoeuvre dans cette installation.
US5251156A (en) * 1990-08-25 1993-10-05 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method and apparatus for non-contact measurement of object surfaces
WO1993008449A1 (en) * 1991-10-12 1993-04-29 Renishaw Transducer Systems Limited Measuring the accuracy of multi-axis machines
JP3410779B2 (ja) * 1993-09-28 2003-05-26 株式会社ソキア 画像入力装置における移動ステージの校正方法
DE4343810C1 (de) * 1993-12-22 1995-04-20 Roland Man Druckmasch Fotoelektrischer Meßkopf
DE4421302C1 (de) * 1994-06-17 1995-12-07 Leitz Mestechnik Gmbh Verfahren zur Eliminierung des Rollwinkels einer Meßachse einer Koordinatenmeßmaschine sowie Vorrichtung zur Durchführung des Verfahrens
DE4434014A1 (de) 1994-09-23 1996-03-28 Zeiss Carl Fa Verfahren zur Kalibrierung eines Koordinatenmeßgerätes mit zwei rotatorischen Achsen
WO1996013355A1 (en) * 1994-10-31 1996-05-09 Philips Electronics N.V. Method of measuring a reference position of a tool relative to a workpiece, and machine tool for carrying out said method
GB9517214D0 (en) * 1995-08-23 1995-10-25 Renishaw Plc Calibration of an articulating probe head for a coordinating positioning machine
US5832416A (en) * 1995-09-01 1998-11-03 Brown & Sharpe Manufacturing Company Calibration system for coordinate measuring machine
US5671053A (en) * 1995-11-16 1997-09-23 Virtek Vision Corp. Method of calibrating laser projector using moving reflector
US5917600A (en) * 1997-06-18 1999-06-29 Cybo Robots, Inc Displacement sensor
US6069700A (en) * 1997-07-31 2000-05-30 The Boeing Company Portable laser digitizing system for large parts
DE19818405B4 (de) * 1998-04-24 2006-11-09 Hexagon Metrology Gmbh Verfahren zur Erfassung von Geometrieabweichungen wenigstens einer Achse eines Koordinatenmeßgerätes
US6112423A (en) * 1999-01-15 2000-09-05 Brown & Sharpe Manufacturing Co. Apparatus and method for calibrating a probe assembly of a measuring machine
JP3210963B2 (ja) * 1999-06-18 2001-09-25 経済産業省産業技術総合研究所長 ボールステップゲージ
JP3905771B2 (ja) * 2001-03-02 2007-04-18 株式会社ミツトヨ 測定機の校正方法及び装置
DE10118392A1 (de) * 2001-04-13 2002-11-07 Zeiss Carl System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren
GB0215557D0 (en) * 2002-07-05 2002-08-14 Renishaw Plc Laser calibration apparatus
US7627197B2 (en) * 2003-04-07 2009-12-01 Honda Motor Co., Ltd. Position measurement method, an apparatus, a computer program and a method for generating calibration information
US6829838B1 (en) * 2003-09-09 2004-12-14 Hexagon Metrology Ab Temperature compensation system for a coordinate measuring machine
DE102004011404A1 (de) * 2004-03-05 2005-09-22 Prüftechnik Dieter Busch AG Messgerät zur Bestimmung der Geradheit von Wellen oder Wellentunneln
US7191541B1 (en) 2005-12-06 2007-03-20 Hexagon Metrology Ab Temperature compensation system for a coordinate measuring machine
US7249421B2 (en) * 2005-12-22 2007-07-31 Hexagon Metrology Ab Hysteresis compensation in a coordinate measurement machine
ITTO20070318A1 (it) * 2007-05-10 2008-11-11 Hexagon Metrology Spa Metodo per la determinazione degli errori geometrici in una macchina utensile o di misura
US7752003B2 (en) * 2008-06-27 2010-07-06 Hexagon Metrology, Inc. Hysteresis compensation in a coordinate measurement machine
KR101016229B1 (ko) * 2008-11-06 2011-02-25 한양대학교 산학협력단 초정밀 리니어 스테이지의 운동오차 측정방법 및 측정시스템
US8325333B2 (en) * 2009-11-04 2012-12-04 National Formosa University Geometric error measuring device
FR2978824B1 (fr) * 2011-08-05 2014-03-21 Thales Sa Systeme a detection de posture interferometrique
FR2981742B1 (fr) * 2011-10-24 2016-01-22 Renault Sas Procede de verification de la precision de mesure d'un laser de poursuite
EP2754992A1 (de) * 2013-01-09 2014-07-16 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Optischer Profilmesser
CZ310064B6 (en) * 2013-02-27 2024-07-10 České vysoké učení technické v Praze A method of increasing an accuracy of optical measurement of position of a point in space using redundant measurement
US9151587B2 (en) * 2013-11-11 2015-10-06 General Electric Company Bucket tip shroud measurement fixture and method of measuring bucket tip shroud orientation
GB201321594D0 (en) * 2013-12-06 2014-01-22 Renishaw Plc Calibration of motion systems
WO2016115704A1 (zh) * 2015-01-22 2016-07-28 北京交通大学 一种可检测21项几何误差的激光测量系统与方法
JP6490158B2 (ja) 2017-07-19 2019-03-27 ファナック株式会社 真直度確認方法
CN110470250B (zh) * 2019-07-30 2021-06-15 湖北三江航天万山特种车辆有限公司 一种零件表面平面度的检测装置及检测方法

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US2924768A (en) * 1956-08-27 1960-02-09 Inductosyn Corp Machine tool control with compensation for non-linear guide ways
US3551055A (en) * 1968-02-12 1970-12-29 Optomechanisms Inc Interferometer for making angular and linear measurements
US3622244A (en) * 1970-01-29 1971-11-23 Optomechanisms Inc Dual axes interferometer
FR2088675A5 (de) * 1970-04-21 1972-01-07 Thomson Csf
US3790284A (en) * 1972-05-08 1974-02-05 Hewlett Packard Co Interferometer system for measuring straightness and roll
US3765772A (en) * 1972-06-30 1973-10-16 Us Army Interferometric angular sensor and reference
US3884580A (en) * 1973-09-07 1975-05-20 Gerber Scientific Instr Co Apparatus for measuring and positioning by interferometry
FR2330997A1 (fr) * 1975-11-07 1977-06-03 Sagem Perfectionnements aux procedes et machines de mesure des dimensions de pieces
US4215938A (en) * 1978-09-28 1980-08-05 Farrand Industries, Inc. Method and apparatus for correcting the error of a position measuring interferometer
US4261107A (en) * 1980-03-06 1981-04-14 Caterpillar Tractor Co. Coordinate locating device
US4500200A (en) * 1980-11-14 1985-02-19 Rockwell International Corporation Electro-optic sensor for measuring angular orientation
GB8420096D0 (en) * 1984-08-07 1984-09-12 Putra Siregar N I Measurement of errors
US4676649A (en) * 1985-11-27 1987-06-30 Compact Spindle Bearing Corp. Multi-axis gas bearing stage assembly
JPH01502530A (ja) * 1987-03-06 1989-08-31 レニショウ パブリック リミテッド カンパニー 位置決定装置

Also Published As

Publication number Publication date
EP0386115A1 (de) 1990-09-12
EP0386115B2 (de) 1997-08-20
JPH03501052A (ja) 1991-03-07
DE3886767T3 (de) 1998-03-12
JP2694986B2 (ja) 1997-12-24
DE3886767T2 (de) 1994-05-11
US4884889A (en) 1989-12-05
WO1989004945A1 (en) 1989-06-01
EP0386115B1 (de) 1993-12-29
EP0386115A4 (en) 1991-12-27

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8366 Restricted maintained after opposition proceedings
8339 Ceased/non-payment of the annual fee