DE3874422D1 - Feldeffekttransistor mit kurzer kanallaenge und verfahren zu dessen herstellung. - Google Patents
Feldeffekttransistor mit kurzer kanallaenge und verfahren zu dessen herstellung.Info
- Publication number
- DE3874422D1 DE3874422D1 DE8888109529T DE3874422T DE3874422D1 DE 3874422 D1 DE3874422 D1 DE 3874422D1 DE 8888109529 T DE8888109529 T DE 8888109529T DE 3874422 T DE3874422 T DE 3874422T DE 3874422 D1 DE3874422 D1 DE 3874422D1
- Authority
- DE
- Germany
- Prior art keywords
- production
- field effect
- effect transistor
- channel length
- short channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005669 field effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66568—Lateral single gate silicon transistors
- H01L29/66651—Lateral single gate silicon transistors with a single crystalline channel formed on the silicon substrate after insulating device isolation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66787—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a gate at the side of the channel
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62151837A JPS63314870A (ja) | 1987-06-17 | 1987-06-17 | 絶縁ゲ−ト電界効果トランジスタおよびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3874422D1 true DE3874422D1 (de) | 1992-10-15 |
DE3874422T2 DE3874422T2 (de) | 1993-04-08 |
Family
ID=15527382
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8888109529T Expired - Fee Related DE3874422T2 (de) | 1987-06-17 | 1988-06-15 | Feldeffekttransistor mit kurzer kanallaenge und verfahren zu dessen herstellung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4876581A (de) |
EP (1) | EP0295643B1 (de) |
JP (1) | JPS63314870A (de) |
DE (1) | DE3874422T2 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5525536A (en) * | 1991-12-26 | 1996-06-11 | Rohm Co., Ltd. | Method for producing SOI substrate and semiconductor device using the same |
US5308997A (en) * | 1992-06-22 | 1994-05-03 | Motorola, Inc. | Self-aligned thin film transistor |
US6716728B2 (en) | 1999-08-03 | 2004-04-06 | Bae Systems Information And Electronic Systems Integration, Inc. | Radiation hardened silicon-on-insulator (SOI) transistor having a body contact |
US6399989B1 (en) | 1999-08-03 | 2002-06-04 | Bae Systems Information And Electronic Systems Integration Inc. | Radiation hardened silicon-on-insulator (SOI) transistor having a body contact |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0077737A3 (de) * | 1981-10-19 | 1984-11-07 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Feldeffekttransistor mit kleiner Kapazität |
JPH0682837B2 (ja) * | 1982-09-16 | 1994-10-19 | 財団法人半導体研究振興会 | 半導体集積回路 |
JPS59175161A (ja) * | 1983-03-25 | 1984-10-03 | Hitachi Ltd | 絶縁ゲ−ト半導体装置とその製造方法 |
FR2561822B1 (fr) * | 1984-03-23 | 1986-06-27 | Thomson Csf | Dispositif semi-conducteur a effet de champ a faible tension de dechet |
-
1987
- 1987-06-17 JP JP62151837A patent/JPS63314870A/ja active Granted
-
1988
- 1988-06-15 EP EP88109529A patent/EP0295643B1/de not_active Expired - Lifetime
- 1988-06-15 DE DE8888109529T patent/DE3874422T2/de not_active Expired - Fee Related
- 1988-06-17 US US07/207,837 patent/US4876581A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0295643A2 (de) | 1988-12-21 |
EP0295643A3 (en) | 1989-08-23 |
EP0295643B1 (de) | 1992-09-09 |
DE3874422T2 (de) | 1993-04-08 |
JPH0583196B2 (de) | 1993-11-25 |
JPS63314870A (ja) | 1988-12-22 |
US4876581A (en) | 1989-10-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |