DE3868488D1 - Direktzugriffsspeichereinheit mit mehreren testbetriebsarten und rechner, ausgeruestet mit solchen einheiten. - Google Patents
Direktzugriffsspeichereinheit mit mehreren testbetriebsarten und rechner, ausgeruestet mit solchen einheiten.Info
- Publication number
- DE3868488D1 DE3868488D1 DE8888202543T DE3868488T DE3868488D1 DE 3868488 D1 DE3868488 D1 DE 3868488D1 DE 8888202543 T DE8888202543 T DE 8888202543T DE 3868488 T DE3868488 T DE 3868488T DE 3868488 D1 DE3868488 D1 DE 3868488D1
- Authority
- DE
- Germany
- Prior art keywords
- units
- computer
- storage unit
- operating modes
- direct access
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/006—Identification
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8716115A FR2623652A1 (fr) | 1987-11-20 | 1987-11-20 | Unite de memoire statique a plusieurs modes de test et ordinateur muni de telles unites |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3868488D1 true DE3868488D1 (de) | 1992-03-26 |
Family
ID=9357010
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8888202543T Expired - Lifetime DE3868488D1 (de) | 1987-11-20 | 1988-11-15 | Direktzugriffsspeichereinheit mit mehreren testbetriebsarten und rechner, ausgeruestet mit solchen einheiten. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4951254A (de) |
EP (1) | EP0317014B1 (de) |
JP (1) | JP2790296B2 (de) |
KR (1) | KR960001303B1 (de) |
DE (1) | DE3868488D1 (de) |
FR (1) | FR2623652A1 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02255925A (ja) * | 1988-11-30 | 1990-10-16 | Hitachi Ltd | メモリテスト方法および装置 |
JPH03104100A (ja) * | 1989-09-18 | 1991-05-01 | Fujitsu Ltd | 半導体メモリ装置 |
US5113399A (en) * | 1989-10-16 | 1992-05-12 | Rockwell International Corporation | Memory test methodology |
NL9001333A (nl) * | 1990-06-13 | 1992-01-02 | Philips Nv | Werkwijze voor het besturen van een zelftest in een dataverwerkend systeem en dataverwerkend systeem geschikt voor deze werkwijze. |
US5675544A (en) * | 1990-06-25 | 1997-10-07 | Texas Instruments Incorporated | Method and apparatus for parallel testing of memory circuits |
US5161159A (en) * | 1990-08-17 | 1992-11-03 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with multiple clocking for test mode entry |
US5299203A (en) * | 1990-08-17 | 1994-03-29 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a flag for indicating test mode |
US5072137A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a clocked access code for test mode entry |
DE69120483T2 (de) * | 1990-08-17 | 1996-11-14 | Sgs Thomson Microelectronics | Halbleiter-Speicher mit unterdrücktem Testmodus-Eingang während des Strom-Einschaltens |
US5072138A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with sequential clocked access codes for test mode entry |
US5177745A (en) * | 1990-09-26 | 1993-01-05 | Intel Corporation | Memory device with a test mode |
JP2557594B2 (ja) * | 1992-04-16 | 1996-11-27 | 株式会社東芝 | 半導体記憶装置 |
US5452418A (en) * | 1992-04-24 | 1995-09-19 | Digital Equipment Corporation | Method of using stream buffer to perform operation under normal operation mode and selectively switching to test mode to check data integrity during system operation |
US5455517A (en) * | 1992-06-09 | 1995-10-03 | International Business Machines Corporation | Data output impedance control |
JP2888081B2 (ja) * | 1993-03-04 | 1999-05-10 | 日本電気株式会社 | 半導体記憶装置 |
JP2914843B2 (ja) * | 1993-03-10 | 1999-07-05 | 株式会社東芝 | ダイナミック型半導体メモリ |
US5488691A (en) * | 1993-11-17 | 1996-01-30 | International Business Machines Corporation | Memory card, computer system and method of operation for differentiating the use of read-modify-write cycles in operating and initializaiton modes |
US5452429A (en) * | 1993-11-17 | 1995-09-19 | International Business Machines Corporation | Error correction code on add-on cards for writing portions of data words |
BR9406125A (pt) * | 1993-12-18 | 1996-02-13 | Sony Corp | Suporte de armazenamento de dados e aparelho de reprodução de dados |
DE69427277T2 (de) * | 1994-01-31 | 2001-09-13 | St Microelectronics Srl | Verfahren zur Programmierung und Prüfung eines nichtflüchtigen Speichers |
KR0140176B1 (ko) * | 1994-11-30 | 1998-07-15 | 김광호 | 반도체 메모리장치의 동작모드 제어장치 및 방법 |
JP3753190B2 (ja) * | 1995-04-26 | 2006-03-08 | 三菱電機株式会社 | 半導体装置 |
US5592422A (en) * | 1995-06-07 | 1997-01-07 | Sgs-Thomson Microelectronics, Inc. | Reduced pin count stress test circuit for integrated memory devices and method therefor |
JP2786152B2 (ja) * | 1996-04-25 | 1998-08-13 | 日本電気アイシーマイコンシステム株式会社 | 半導体集積回路装置 |
US6115836A (en) * | 1997-09-17 | 2000-09-05 | Cypress Semiconductor Corporation | Scan path circuitry for programming a variable clock pulse width |
US5953285A (en) * | 1997-09-17 | 1999-09-14 | Cypress Semiconductor Corp. | Scan path circuitry including an output register having a flow through mode |
US5936977A (en) | 1997-09-17 | 1999-08-10 | Cypress Semiconductor Corp. | Scan path circuitry including a programmable delay circuit |
US6111800A (en) * | 1997-12-05 | 2000-08-29 | Cypress Semiconductor Corporation | Parallel test for asynchronous memory |
DE102004051345B9 (de) * | 2004-10-21 | 2014-01-02 | Qimonda Ag | Halbleiter-Bauelement, Verfahren zum Ein- und/oder Ausgeben von Testdaten, sowie Speichermodul |
DE102004057532A1 (de) * | 2004-11-29 | 2006-06-01 | Infineon Technologies Ag | Verfahren zum Testen von Halbleiter-Chips unter Verwendung von Registersätzen |
GB0526448D0 (en) * | 2005-12-23 | 2006-02-08 | Advanced Risc Mach Ltd | Diagnostic mode switching |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4451903A (en) * | 1981-09-14 | 1984-05-29 | Seeq Technology, Inc. | Method and device for encoding product and programming information in semiconductors |
US4507761A (en) * | 1982-04-20 | 1985-03-26 | Mostek Corporation | Functional command for semiconductor memory |
DE3232215A1 (de) * | 1982-08-30 | 1984-03-01 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierte digitale halbleiterschaltung |
JPS62250593A (ja) * | 1986-04-23 | 1987-10-31 | Hitachi Ltd | ダイナミツク型ram |
-
1987
- 1987-11-20 FR FR8716115A patent/FR2623652A1/fr not_active Withdrawn
-
1988
- 1988-11-15 EP EP88202543A patent/EP0317014B1/de not_active Expired - Lifetime
- 1988-11-15 DE DE8888202543T patent/DE3868488D1/de not_active Expired - Lifetime
- 1988-11-16 US US07/272,180 patent/US4951254A/en not_active Expired - Fee Related
- 1988-11-17 KR KR1019880015109A patent/KR960001303B1/ko not_active IP Right Cessation
- 1988-11-19 JP JP63291112A patent/JP2790296B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR960001303B1 (ko) | 1996-01-25 |
KR890008850A (ko) | 1989-07-12 |
JPH01169800A (ja) | 1989-07-05 |
JP2790296B2 (ja) | 1998-08-27 |
FR2623652A1 (fr) | 1989-05-26 |
EP0317014A1 (de) | 1989-05-24 |
EP0317014B1 (de) | 1992-02-19 |
US4951254A (en) | 1990-08-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N |
|
8339 | Ceased/non-payment of the annual fee |