DE69030040D1 - Informationsspeicherung, -zugriff und -verarbeitung - Google Patents
Informationsspeicherung, -zugriff und -verarbeitungInfo
- Publication number
- DE69030040D1 DE69030040D1 DE69030040T DE69030040T DE69030040D1 DE 69030040 D1 DE69030040 D1 DE 69030040D1 DE 69030040 T DE69030040 T DE 69030040T DE 69030040 T DE69030040 T DE 69030040T DE 69030040 D1 DE69030040 D1 DE 69030040D1
- Authority
- DE
- Germany
- Prior art keywords
- access
- processing
- information storage
- storage
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1463—Record carriers for recording or reproduction involving the use of microscopic probe means
- G11B9/1472—Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the form
- G11B9/1481—Auxiliary features, e.g. reference or indexing surfaces
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/06—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using record carriers having variable electrical capacitance; Record carriers therefor
- G11B9/061—Record carriers characterised by their structure or form or by the selection of the material; Apparatus or processes specially adapted for the manufacture of record carriers
- G11B9/063—Record carriers characterised by their structure or form or by the selection of the material; Apparatus or processes specially adapted for the manufacture of record carriers characterised by the selection of the material
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/861—Scanning tunneling probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/872—Positioner
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
- Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23365189 | 1989-09-07 | ||
JP22170890A JP2744341B2 (ja) | 1989-09-07 | 1990-08-22 | アクセス方法及びこれを利用した情報処理方法、情報処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69030040D1 true DE69030040D1 (de) | 1997-04-10 |
DE69030040T2 DE69030040T2 (de) | 1997-07-03 |
Family
ID=26524450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69030040T Expired - Fee Related DE69030040T2 (de) | 1989-09-07 | 1990-09-05 | Informationsspeicherung, -zugriff und -verarbeitung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5222060A (de) |
EP (1) | EP0416882B1 (de) |
CA (1) | CA2024648C (de) |
DE (1) | DE69030040T2 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0522168A1 (de) * | 1991-01-11 | 1993-01-13 | Hitachi, Ltd. | Verfahren und gerät zur atomaren oberflächenbearbeitung |
JP2744359B2 (ja) * | 1991-04-24 | 1998-04-28 | キヤノン株式会社 | 情報再生及び/又は情報記録装置 |
JP3029143B2 (ja) * | 1991-06-11 | 2000-04-04 | キヤノン株式会社 | 情報再生方法 |
DE69228103T2 (de) * | 1991-10-15 | 1999-07-15 | Canon Kk | Informationsverarbeitungsgerät mit Spurausrichtungsmechanismus |
JPH06187675A (ja) * | 1992-09-25 | 1994-07-08 | Canon Inc | 情報処理装置、及びそれを用いる情報処理方法 |
JP3581475B2 (ja) * | 1995-02-13 | 2004-10-27 | キヤノン株式会社 | 情報処理装置 |
US5757760A (en) * | 1996-01-18 | 1998-05-26 | Canon Kabushiki Kaisha | Information recording and/or reproducing apparatus and method for performing recording and/or reproduction of information by using probe |
JP3679525B2 (ja) * | 1996-10-07 | 2005-08-03 | キヤノン株式会社 | 情報記録再生装置、および情報記録再生方法 |
JP3827105B2 (ja) * | 1997-02-12 | 2006-09-27 | 株式会社モリタユージー | 天井裏設置型自動消火装置 |
US7260051B1 (en) | 1998-12-18 | 2007-08-21 | Nanochip, Inc. | Molecular memory medium and molecular memory integrated circuit |
EP1210714A4 (de) * | 1999-07-01 | 2006-01-04 | Univ | Nicht flüchtige speicheranordnung mit hoher dichte |
US6381169B1 (en) | 1999-07-01 | 2002-04-30 | The Regents Of The University Of California | High density non-volatile memory device |
US6324091B1 (en) | 2000-01-14 | 2001-11-27 | The Regents Of The University Of California | Tightly coupled porphyrin macrocycles for molecular memory storage |
WO2002077633A1 (en) | 2001-03-23 | 2002-10-03 | The Regents Of The University Of California | Open circuit potential amperometry and voltammetry |
US6728129B2 (en) * | 2002-02-19 | 2004-04-27 | The Regents Of The University Of California | Multistate triple-decker dyads in three distinct architectures for information storage applications |
US7233517B2 (en) | 2002-10-15 | 2007-06-19 | Nanochip, Inc. | Atomic probes and media for high density data storage |
US20050232061A1 (en) | 2004-04-16 | 2005-10-20 | Rust Thomas F | Systems for writing and reading highly resolved domains for high density data storage |
US20060238696A1 (en) * | 2005-04-20 | 2006-10-26 | Chien-Hui Wen | Method of aligning negative dielectric anisotropic liquid crystals |
US20070041237A1 (en) * | 2005-07-08 | 2007-02-22 | Nanochip, Inc. | Media for writing highly resolved domains |
US7463573B2 (en) | 2005-06-24 | 2008-12-09 | Nanochip, Inc. | Patterned media for a high density data storage device |
US7367119B2 (en) * | 2005-06-24 | 2008-05-06 | Nanochip, Inc. | Method for forming a reinforced tip for a probe storage device |
US7309630B2 (en) | 2005-07-08 | 2007-12-18 | Nanochip, Inc. | Method for forming patterned media for a high density data storage device |
US7995216B2 (en) * | 2008-07-02 | 2011-08-09 | Ut-Battelle, Llc | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis |
CN102866266B (zh) * | 2012-09-07 | 2014-08-06 | 上海交通大学 | 三维微驱四电极可置换探头 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4087842A (en) * | 1976-11-05 | 1978-05-02 | Graham Magnetics Inc. | Recording track eccentricity compensation method and means |
DE3679319D1 (de) * | 1986-05-27 | 1991-06-20 | Ibm | Speichereinheit mit direktem zugriff. |
JP2556492B2 (ja) * | 1986-12-24 | 1996-11-20 | キヤノン株式会社 | 再生装置及び再生法 |
JP2556491B2 (ja) * | 1986-12-24 | 1996-11-20 | キヤノン株式会社 | 記録装置及び記録法 |
JP2557964B2 (ja) * | 1988-01-22 | 1996-11-27 | インターナシヨナル・ビジネス・マシーンズ・コーポレイーシヨン | データ記憶装置 |
JP2760508B2 (ja) * | 1988-06-23 | 1998-06-04 | 工業技術院長 | 走査型トンネル顕微鏡 |
NL8802335A (nl) * | 1988-09-21 | 1990-04-17 | Philips Nv | Werkwijze en inrichting voor het op sub-mikron schaal bewerken van een materiaal-oppervlak. |
JP2896794B2 (ja) * | 1988-09-30 | 1999-05-31 | キヤノン株式会社 | 走査型トンネル電流検出装置,走査型トンネル顕微鏡,及び記録再生装置 |
JP2547869B2 (ja) * | 1988-11-09 | 1996-10-23 | キヤノン株式会社 | プローブユニット,該プローブの駆動方法及び該プローブユニットを備えた走査型トンネル電流検知装置 |
US5091880A (en) * | 1989-02-02 | 1992-02-25 | Olympus Optical Co., Ltd. | Memory device |
JP2821005B2 (ja) * | 1989-10-02 | 1998-11-05 | オリンパス光学工業株式会社 | 微細表面形状計測装置 |
JPH0687003B2 (ja) * | 1990-02-09 | 1994-11-02 | 株式会社日立製作所 | 走査型トンネル顕微鏡付き走査型電子顕微鏡 |
US5066858A (en) * | 1990-04-18 | 1991-11-19 | Digital Instruments, Inc. | Scanning tunneling microscopes with correction for coupling effects |
US5053699A (en) * | 1990-05-25 | 1991-10-01 | Texas Instruments Incorporated | Scanning electron microscope based parametric testing method and apparatus |
-
1990
- 1990-09-05 DE DE69030040T patent/DE69030040T2/de not_active Expired - Fee Related
- 1990-09-05 CA CA002024648A patent/CA2024648C/en not_active Expired - Fee Related
- 1990-09-05 EP EP90309686A patent/EP0416882B1/de not_active Expired - Lifetime
- 1990-09-05 US US07/577,551 patent/US5222060A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0416882B1 (de) | 1997-03-05 |
US5222060A (en) | 1993-06-22 |
CA2024648A1 (en) | 1991-03-08 |
EP0416882A2 (de) | 1991-03-13 |
DE69030040T2 (de) | 1997-07-03 |
CA2024648C (en) | 1994-10-18 |
EP0416882A3 (en) | 1992-05-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |