DE3850710D1 - Signalanalysator mit automatischer Frequenzmesseinrichtung. - Google Patents

Signalanalysator mit automatischer Frequenzmesseinrichtung.

Info

Publication number
DE3850710D1
DE3850710D1 DE3850710T DE3850710T DE3850710D1 DE 3850710 D1 DE3850710 D1 DE 3850710D1 DE 3850710 T DE3850710 T DE 3850710T DE 3850710 T DE3850710 T DE 3850710T DE 3850710 D1 DE3850710 D1 DE 3850710D1
Authority
DE
Germany
Prior art keywords
measuring device
signal analyzer
automatic frequency
frequency measuring
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3850710T
Other languages
English (en)
Other versions
DE3850710T2 (de
Inventor
Seiryo Fukaya
Mitsuyoshi Takano
Narushi Amamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of DE3850710D1 publication Critical patent/DE3850710D1/de
Publication of DE3850710T2 publication Critical patent/DE3850710T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/173—Wobbulating devices similar to swept panoramic receivers
DE3850710T 1987-07-01 1988-06-30 Signalanalysator mit automatischer Frequenzmesseinrichtung. Expired - Fee Related DE3850710T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16504087 1987-07-01

Publications (2)

Publication Number Publication Date
DE3850710D1 true DE3850710D1 (de) 1994-08-25
DE3850710T2 DE3850710T2 (de) 1995-03-16

Family

ID=15804692

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3850710T Expired - Fee Related DE3850710T2 (de) 1987-07-01 1988-06-30 Signalanalysator mit automatischer Frequenzmesseinrichtung.

Country Status (3)

Country Link
US (1) US4839582A (de)
EP (1) EP0297590B1 (de)
DE (1) DE3850710T2 (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2766685B2 (ja) * 1988-09-26 1998-06-18 アンリツ株式会社 スペクトラムアナライザ
US5065334A (en) * 1989-04-28 1991-11-12 Hewlett-Packard Company Method and apparatus for distinguishing narrowband continuous wave signals from broadband and impulsive signals
US4998217A (en) * 1989-05-01 1991-03-05 Motorola, Inc. Sweep generator linearization system and method
JP2891497B2 (ja) * 1990-01-25 1999-05-17 アンリツ株式会社 スペクトラムアナライザ
DE69117409T2 (de) * 1990-03-30 1996-11-14 Anritsu Corp Wellenformanzeigegerät zur einfachen beobachtung hoch-auflösender wellenformen
US5579463A (en) * 1990-03-30 1996-11-26 Anritsu Corporation Waveform display apparatus of frequency sweep type for facilitating display of a high definition waveform
US5617523A (en) * 1990-11-30 1997-04-01 Anritsu Corporation Waveform display apparatus for easily realizing high-definition waveform observation
US5869959A (en) * 1991-09-02 1999-02-09 Advantest Corporation Spectrum analyzer
US5550747A (en) * 1994-03-07 1996-08-27 Hewlett-Packard Company Unbounded marker for spectrum analysis
US6229316B1 (en) * 1995-09-08 2001-05-08 Advantest Corporation Measuring method by spectrum analyzer
JPH09196977A (ja) * 1996-01-16 1997-07-31 Advantest Corp スペクトラムアナライザ
US6356067B1 (en) * 1998-08-10 2002-03-12 Sony/Tektronix Corporation Wide band signal analyzer with wide band and narrow band signal processors
US6236950B1 (en) * 1998-10-30 2001-05-22 Caterpiller Inc. Automatic stencil generation system and method
US6507624B1 (en) 1999-04-21 2003-01-14 Tektronix, Inc. Bandpass sampling architecture for wide-frequency band signal analysis
US6714605B2 (en) 2002-04-22 2004-03-30 Cognio, Inc. System and method for real-time spectrum analysis in a communication device
US7424268B2 (en) * 2002-04-22 2008-09-09 Cisco Technology, Inc. System and method for management of a shared frequency band
WO2003090387A1 (en) * 2002-04-22 2003-10-30 Cognio, Inc. System and method for real-time spectrum analysis
US7254191B2 (en) * 2002-04-22 2007-08-07 Cognio, Inc. System and method for real-time spectrum analysis in a radio device
US7292656B2 (en) * 2002-04-22 2007-11-06 Cognio, Inc. Signal pulse detection scheme for use in real-time spectrum analysis
US7269151B2 (en) * 2002-04-22 2007-09-11 Cognio, Inc. System and method for spectrum management of a shared frequency band
US6911196B2 (en) * 2002-07-31 2005-06-28 Samir I. Hamtini Topical medicament for treating nappy rash
US7408907B2 (en) * 2002-09-11 2008-08-05 Cisco Technology, Inc. System and method for management of a shared frequency band using client-specific management techniques
US7184777B2 (en) * 2002-11-27 2007-02-27 Cognio, Inc. Server and multiple sensor system for monitoring activity in a shared radio frequency band
US7110756B2 (en) * 2003-10-03 2006-09-19 Cognio, Inc. Automated real-time site survey in a shared frequency band environment
US7460837B2 (en) * 2004-03-25 2008-12-02 Cisco Technology, Inc. User interface and time-shifted presentation of data in a system that monitors activity in a shared radio frequency band
EP1635181A1 (de) * 2004-09-13 2006-03-15 Rohde & Schwarz GmbH & Co. KG Vorrichtung und Verfahren zur Pulsmessung
EP2426919A3 (de) * 2004-10-04 2012-06-06 Cine-Tal Systems, Inc. Videoüberwachungssystem
US7525302B2 (en) * 2005-01-31 2009-04-28 Formfactor, Inc. Method of estimating channel bandwidth from a time domain reflectometer (TDR) measurement using rise time and maximum slope
US20060270371A1 (en) * 2005-05-31 2006-11-30 Sugar Gary L Tracking short-term maximum power spectrum density for improved visibility of low duty cycle signals
WO2007134108A2 (en) * 2006-05-09 2007-11-22 Cognio, Inc. System and method for identifying wireless devices using pulse fingerprinting and sequence analysis
US20080195977A1 (en) * 2007-02-12 2008-08-14 Carroll Robert C Color management system
US7596461B2 (en) * 2007-07-06 2009-09-29 Cisco Technology, Inc. Measurement of air quality in wireless networks
JP4881997B2 (ja) * 2009-12-17 2012-02-22 アンリツ株式会社 スペクトラムアナライザおよびスペクトラム分析方法
JP6132518B2 (ja) * 2012-11-21 2017-05-24 オリンパス株式会社 マルチキャスト送信端末、マルチキャストシステム、プログラムおよびマルチキャスト送信方法
US9858240B2 (en) * 2012-12-13 2018-01-02 Tektronix, Inc. Automatic center frequency and span setting in a test and measurement instrument
US10411867B2 (en) * 2015-04-30 2019-09-10 Sony Corporation Communication apparatus and communication method
CN106872775B (zh) * 2015-12-11 2020-12-18 普源精电科技股份有限公司 一种频谱分析仪及其信号处理方法
US10608916B2 (en) * 2017-03-23 2020-03-31 Rohde & Schwarz Gmbh & Co. Kg Measuring device and method for dynamically selecting a channel bandwidth
US11137429B2 (en) 2019-03-28 2021-10-05 Keysight Technologies, Inc. Functional noise floor adjustment of signal measurement device
CN112948747B (zh) * 2021-02-05 2023-02-03 深圳市贝斯达医疗股份有限公司 查找中心频率的方法、装置、终端设备和存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4264958A (en) * 1978-08-10 1981-04-28 Hewlett-Packard Company Video processor for a spectrum analyzer
JPS5926902B2 (ja) * 1979-03-31 1984-07-02 アンリツ株式会社 周波数マ−カ表示装置
JPS59157574A (ja) * 1983-02-27 1984-09-06 Anritsu Corp スペクトラムアナライザ
JPS59157576A (ja) * 1983-02-27 1984-09-06 Anritsu Corp スペクトラムアナライザ
DE3504759C2 (de) * 1984-02-16 1997-08-28 Hewlett Packard Co Wobbel-Messvorrichtung
US4649496A (en) * 1984-02-16 1987-03-10 Hewlett-Packard Company Spectrum analyzer with improved data analysis and display features
JPH0769364B2 (ja) * 1987-03-06 1995-07-31 アンリツ株式会社 スペクトラムアナライザ

Also Published As

Publication number Publication date
DE3850710T2 (de) 1995-03-16
EP0297590B1 (de) 1994-07-20
EP0297590A3 (en) 1990-12-12
EP0297590A2 (de) 1989-01-04
US4839582A (en) 1989-06-13

Similar Documents

Publication Publication Date Title
DE3850710T2 (de) Signalanalysator mit automatischer Frequenzmesseinrichtung.
DE68927155D1 (de) Vermessungsgerät mit automatischer verfolgung
DE58902531D1 (de) Fuellstandsmessgeraet.
DK468088A (da) Indretning til fastgoerelse af signaltekniske forbindelseslister
DE3782167T2 (de) Messwertumformer.
DE68909568D1 (de) Analytisches testgeraet.
DE3878822T2 (de) Signalerkennungseinrichtung mit hoher impedanz.
DE69024533D1 (de) Schnelle Empfangssignalpegelangabe
ES287851Y (es) Un dispositivo de rotulo luminoso.
KR860004554A (ko) 신호 샘플 디디더링 장치
DE3880648D1 (de) Impedanzmessgeraet.
DE68924802D1 (de) Testvorrichtung mit gradientreguliertem lokalisiertem Signal.
FR2610110B1 (fr) Dispositif de detection de defauts structurels
DE68900525D1 (de) Waegevorrichtung mit dehnungsmessstreifen.
DE68908430T2 (de) Messgerät.
DE3485931D1 (de) Einrichtung zur entfernungsmessung.
DE69011482T2 (de) Füllstands-Messeinrichtung.
ATE33897T1 (de) Signalgeraet.
DE3852718D1 (de) Signalerkennungsschaltung.
DE3879889T2 (de) Testmeter.
DE3764797D1 (de) Einrichtung zur unwuchterkennung.
DE3764738D1 (de) Elekronische messeinrichtung.
DE3861633D1 (de) Waegevorrichtung mit dehnungsmessstreifen.
DE3877222T2 (de) Messfuehler.
DE69000164D1 (de) Festigkeitsmessgeraet.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee