DE68908430T2 - Messgerät. - Google Patents

Messgerät.

Info

Publication number
DE68908430T2
DE68908430T2 DE89300738T DE68908430T DE68908430T2 DE 68908430 T2 DE68908430 T2 DE 68908430T2 DE 89300738 T DE89300738 T DE 89300738T DE 68908430 T DE68908430 T DE 68908430T DE 68908430 T2 DE68908430 T2 DE 68908430T2
Authority
DE
Germany
Prior art keywords
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89300738T
Other languages
English (en)
Other versions
DE68908430D1 (de
Inventor
Shigeru Tanimoto
Kouichi Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE68908430D1 publication Critical patent/DE68908430D1/de
Application granted granted Critical
Publication of DE68908430T2 publication Critical patent/DE68908430T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
DE89300738T 1988-01-29 1989-01-26 Messgerät. Expired - Fee Related DE68908430T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63020955A JP2720970B2 (ja) 1988-01-29 1988-01-29 測定器

Publications (2)

Publication Number Publication Date
DE68908430D1 DE68908430D1 (de) 1993-09-23
DE68908430T2 true DE68908430T2 (de) 1994-04-21

Family

ID=12041607

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89300738T Expired - Fee Related DE68908430T2 (de) 1988-01-29 1989-01-26 Messgerät.

Country Status (4)

Country Link
US (1) US5019781A (de)
EP (1) EP0327254B1 (de)
JP (1) JP2720970B2 (de)
DE (1) DE68908430T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0175839B1 (ko) * 1992-08-04 1999-05-15 윤종용 전류벡터에 의한 수동소자값의 연산장치
US5734373A (en) * 1993-07-16 1998-03-31 Immersion Human Interface Corporation Method and apparatus for controlling force feedback interface systems utilizing a host computer
JP3809223B2 (ja) * 1996-05-30 2006-08-16 アジレント・テクノロジーズ・インク インピーダンス測定装置
JP2001201524A (ja) * 2000-01-20 2001-07-27 Agilent Technologies Japan Ltd 電気信号の比率測定装置、電気素子測定装置、電気素子測定装置の校正方法及び電気信号の比率測定方法
JP2004317391A (ja) * 2003-04-18 2004-11-11 Agilent Technol Inc 電流電圧変換器およびインピーダンス測定装置
US10693415B2 (en) 2007-12-05 2020-06-23 Solaredge Technologies Ltd. Testing of a photovoltaic panel
JP4735250B2 (ja) * 2005-12-28 2011-07-27 横河電機株式会社 計測装置
JP2010038699A (ja) * 2008-08-04 2010-02-18 Hitachi Kokusai Denki Engineering:Kk 測定電流値決定方法及び４探針抵抗率測定装置
US8217667B2 (en) * 2009-01-16 2012-07-10 Hill-Rom Services, Inc. Method and apparatus for piezoelectric sensor status assessment
US8547120B1 (en) * 2009-05-13 2013-10-01 Keithley Instruments, Inc. High speed AC current source
LU93211B1 (en) * 2016-09-14 2018-04-05 Iee Sa Method for determining a sense impedance in a guard-sense capacitive sensor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3325727A (en) * 1964-11-05 1967-06-13 Honeywell Inc Capacity measuring device including an integrating analog to digital converter
US4080562A (en) * 1976-03-25 1978-03-21 Gull Airborne Instruments, Inc. Apparatus for measuring capacitance or resistance and for testing a capacitance responsive gaging system
DE2838257A1 (de) * 1978-09-01 1980-03-13 Udo Dr Ing Unrau Pegelgeregelte hochfrequenz-messanordnung mit nur einem detektor
JPS56126769A (en) * 1980-03-11 1981-10-05 Yokogawa Hewlett Packard Ltd Impedance meter
US4315219A (en) * 1980-04-07 1982-02-09 Canadian Patents & Development Limited Amplitude controlled digital oscillator
US4458196A (en) * 1981-08-05 1984-07-03 John Fluke Mfg. Co., Inc. Method and apparatus for high speed resistance, inductance and capacitance measurement
JPS5875074A (ja) * 1981-10-30 1983-05-06 Yokogawa Hewlett Packard Ltd 容量あるいは他のパラメ−タの測定装置
JPS6071966A (ja) * 1983-09-28 1985-04-23 Advantest Corp デジタルスペクトルアナライザ
GB8604125D0 (en) * 1986-02-19 1986-03-26 Rowlands S L Resistance element simulator

Also Published As

Publication number Publication date
JPH01195371A (ja) 1989-08-07
EP0327254A1 (de) 1989-08-09
DE68908430D1 (de) 1993-09-23
EP0327254B1 (de) 1993-08-18
US5019781A (en) 1991-05-28
JP2720970B2 (ja) 1998-03-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee