DE3880648D1 - Impedanzmessgeraet. - Google Patents
Impedanzmessgeraet.Info
- Publication number
- DE3880648D1 DE3880648D1 DE8888121429T DE3880648T DE3880648D1 DE 3880648 D1 DE3880648 D1 DE 3880648D1 DE 8888121429 T DE8888121429 T DE 8888121429T DE 3880648 T DE3880648 T DE 3880648T DE 3880648 D1 DE3880648 D1 DE 3880648D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- impedance measuring
- impedance
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32827687A JP2587970B2 (ja) | 1987-12-23 | 1987-12-23 | インピーダンス測定装置 |
JP107088A JPH01176949A (ja) | 1988-01-06 | 1988-01-06 | 過渡インピーダンス測定装置 |
JP5715088A JPH01229979A (ja) | 1988-03-09 | 1988-03-09 | インピーダンス測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3880648D1 true DE3880648D1 (de) | 1993-06-03 |
DE3880648T2 DE3880648T2 (de) | 1993-12-23 |
Family
ID=27274750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE88121429T Expired - Fee Related DE3880648T2 (de) | 1987-12-23 | 1988-12-21 | Impedanzmessgerät. |
Country Status (3)
Country | Link |
---|---|
US (1) | US4947130A (de) |
EP (1) | EP0321963B1 (de) |
DE (1) | DE3880648T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2787078B2 (ja) * | 1989-09-11 | 1998-08-13 | 株式会社アドバンテスト | 測定装置 |
EP0497994B1 (de) * | 1991-01-28 | 1995-04-12 | KNICK ELEKTRONISCHE MESSGERÄTE GMBH & CO. | Verfahren und Schaltungsanordnung zur Überwachung von ionen- oder redoxpotential-sensitiven Messketten |
KR0175839B1 (ko) * | 1992-08-04 | 1999-05-15 | 윤종용 | 전류벡터에 의한 수동소자값의 연산장치 |
WO1994015222A1 (en) * | 1992-12-24 | 1994-07-07 | Elcorp Pty. Ltd. | Method and apparatus for determining the charge condition of an electrochemical cell |
US5467021A (en) * | 1993-05-24 | 1995-11-14 | Atn Microwave, Inc. | Calibration method and apparatus |
SE514499C2 (sv) * | 1995-01-13 | 2001-03-05 | Colibri Pro Dev Ab | Metod och anordning för kompensering av elektriska störningar |
US5977774A (en) * | 1997-10-31 | 1999-11-02 | Hewlett-Packard Company | Method for detecting open circuits with a measurement device |
DE19755417C2 (de) * | 1997-12-12 | 1999-11-04 | Fraunhofer Ges Forschung | Auswerteschaltung zur Ermittlung komplexer Impedanzen, Vorrichtung zur Messung komplexer Impedanzen und Verwendung der Vorrichtung |
JP3608952B2 (ja) * | 1998-07-30 | 2005-01-12 | Necエレクトロニクス株式会社 | インピーダンス測定装置およびインピーダンス測定方法 |
US6525522B1 (en) | 2001-06-07 | 2003-02-25 | Tektronix, Inc. | System for determining the phase and magnitude of an incident signal relative to a cyclical reference signal |
US9093215B2 (en) * | 2012-05-07 | 2015-07-28 | Qualcomm Incorporated | Push-pull driver for generating a signal for wireless power transfer |
JP6226261B2 (ja) | 2012-12-27 | 2017-11-08 | 学校法人早稲田大学 | 電気化学システム |
EP3422572B1 (de) * | 2016-03-02 | 2020-04-22 | Mitsubishi Electric Corporation | Vektorsynthesephasenschieber |
CN111722137B (zh) * | 2020-07-01 | 2023-05-12 | 重庆西南集成电路设计有限责任公司 | 基于四线法的微电阻测试系统及数字化抗干扰电路 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2305829A1 (de) * | 1973-02-07 | 1974-08-08 | Kleinwaechter Hans | Messverfahren und geraet zur messung und getrennten registrierung der reaktanz und des ohmschen wirkwiderstandes passiver zweipole |
JPS56126769A (en) * | 1980-03-11 | 1981-10-05 | Yokogawa Hewlett Packard Ltd | Impedance meter |
JPS5875074A (ja) * | 1981-10-30 | 1983-05-06 | Yokogawa Hewlett Packard Ltd | 容量あるいは他のパラメ−タの測定装置 |
US4482974A (en) * | 1982-08-13 | 1984-11-13 | Hewlett-Packard Company | Apparatus and method of phase-to-amplitude conversion in a sine function generator |
US4604719A (en) * | 1983-10-21 | 1986-08-05 | Crown International, Inc. | Oscillator having a sixteen bit signal generation utilizing an eight bit processor |
GB2198246B (en) * | 1986-11-15 | 1991-05-08 | Schlumberger Ind Ltd | Improvements in or relating to frequency response analysis |
-
1988
- 1988-12-14 US US07/284,352 patent/US4947130A/en not_active Expired - Fee Related
- 1988-12-21 EP EP88121429A patent/EP0321963B1/de not_active Expired - Lifetime
- 1988-12-21 DE DE88121429T patent/DE3880648T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3880648T2 (de) | 1993-12-23 |
EP0321963A1 (de) | 1989-06-28 |
US4947130A (en) | 1990-08-07 |
EP0321963B1 (de) | 1993-04-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |