DE3671668D1 - Hochfrequenzimpedanzmessgeraet. - Google Patents

Hochfrequenzimpedanzmessgeraet.

Info

Publication number
DE3671668D1
DE3671668D1 DE8686401708T DE3671668T DE3671668D1 DE 3671668 D1 DE3671668 D1 DE 3671668D1 DE 8686401708 T DE8686401708 T DE 8686401708T DE 3671668 T DE3671668 T DE 3671668T DE 3671668 D1 DE3671668 D1 DE 3671668D1
Authority
DE
Germany
Prior art keywords
measuring device
impedance measuring
frequency impedance
frequency
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686401708T
Other languages
English (en)
Inventor
Daniel Solal
Jean-Charles Bolomey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Application granted granted Critical
Publication of DE3671668D1 publication Critical patent/DE3671668D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE8686401708T 1985-08-02 1986-07-31 Hochfrequenzimpedanzmessgeraet. Expired - Fee Related DE3671668D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8511886A FR2585557B1 (fr) 1985-08-02 1985-08-02 Dispositif de mesure de caracteristiques electriques de tissus vivants, et en particulier de la temperature pour hyperthermie capacitive ou radiative

Publications (1)

Publication Number Publication Date
DE3671668D1 true DE3671668D1 (de) 1990-07-05

Family

ID=9321935

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686401708T Expired - Fee Related DE3671668D1 (de) 1985-08-02 1986-07-31 Hochfrequenzimpedanzmessgeraet.

Country Status (4)

Country Link
US (1) US4780661A (de)
EP (1) EP0214015B1 (de)
DE (1) DE3671668D1 (de)
FR (1) FR2585557B1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0336370A3 (de) * 1988-04-04 1991-02-27 OMRON Corporation Hochfrequenz-Wärmetherapiesystem
US5046495A (en) * 1988-04-04 1991-09-10 Omron Tateisi Electronics Co. High frequency heat therapy system
US4899750A (en) * 1988-04-19 1990-02-13 Siemens-Pacesetter, Inc. Lead impedance scanning system for pacemakers
US5030956A (en) * 1989-04-25 1991-07-09 Murphy Quentin M Radar tomography
US5227797A (en) * 1989-04-25 1993-07-13 Murphy Quentin M Radar tomography
GB9016972D0 (en) * 1990-08-02 1990-09-19 Farnell Instr Improvements relating to lcr meters
US5063937A (en) * 1990-09-12 1991-11-12 Wright State University Multiple frequency bio-impedance measurement system
JPH0526944A (ja) * 1991-07-24 1993-02-05 Nippon Sheet Glass Co Ltd 導電パターンの検査装置
US5334941A (en) * 1992-09-14 1994-08-02 Kdc Technology Corp. Microwave reflection resonator sensors
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
DE4401068C2 (de) * 1993-08-30 1997-04-10 Rohde & Schwarz Netzwerkanalysator und Verfahren zum Kalibrieren
FR2724231B1 (fr) * 1994-09-02 1997-01-03 Gec Alsthom T & D Sa Voie d'acquisition d'une impulsion en tension, procede et systeme de mesure de decharges partielles pourvu d'une telle voie
US6213934B1 (en) 1995-06-01 2001-04-10 Hyper3D Corp. Electromagnetic bone-assessment and treatment: apparatus and method
US5782763A (en) * 1995-06-01 1998-07-21 Cyberlogic Inc. Electromagnetic bone-assessment apparatus and method
US6169410B1 (en) * 1998-11-09 2001-01-02 Anritsu Company Wafer probe with built in RF frequency conversion module
US6400984B1 (en) 2000-06-09 2002-06-04 Medtronic Physio-Control Manufacturing Corp. Method and apparatus for detecting whether a load is a patient or a test device
US6832111B2 (en) * 2001-07-06 2004-12-14 Hosheng Tu Device for tumor diagnosis and methods thereof
US8417327B2 (en) * 2002-06-20 2013-04-09 Physio-Control, Inc. Variable frequency impedance measurement
US7041096B2 (en) * 2002-10-24 2006-05-09 Synergetics Usa, Inc. Electrosurgical generator apparatus
US7030627B1 (en) * 2003-12-05 2006-04-18 Aea Technology Inc. Wideband complex radio frequency impedance measurement
CN101141914B (zh) * 2004-11-24 2012-08-01 测量有限公司 用于确定人体阻抗的双线振荡器系统
US7019510B1 (en) * 2004-12-14 2006-03-28 Anritsu Company Portable ultra wide band handheld VNA
US7526392B2 (en) * 2005-03-30 2009-04-28 Rockwell Automation Technologies, Inc. Power line parameter analysis method and system
US7200502B2 (en) * 2005-03-30 2007-04-03 Rockwell Automation Technologies, Inc. Dual connection power line parameter analysis method and system
US20070118334A1 (en) * 2005-10-05 2007-05-24 Klaus Guenter Data logger for a measuring device
US20110152661A1 (en) * 2005-12-22 2011-06-23 Board Of Regents, The University Of Texas System Method and apparatus for identifying the viability of ischemic myocardium of a patient
US7521939B2 (en) * 2005-12-22 2009-04-21 Anritsu Company Circuits to increase VNA measurement bandwidth
US7373272B2 (en) * 2006-07-26 2008-05-13 Honeywell International, Inc. Temperature compensated resonant transmission line sensor
US20110074442A1 (en) * 2008-05-12 2011-03-31 Tallinn University Of Technology Method and device using shortened square wave waveforms in synchronous signal processing
CN102137621B (zh) * 2008-08-29 2013-05-08 皇家飞利浦电子股份有限公司 电生理信号的电容测量中对运动伪影的补偿
US8882759B2 (en) 2009-12-18 2014-11-11 Covidien Lp Microwave ablation system with dielectric temperature probe
US8568404B2 (en) 2010-02-19 2013-10-29 Covidien Lp Bipolar electrode probe for ablation monitoring
DE102010009104A1 (de) * 2010-02-24 2011-08-25 Epcos Ag, 81669 Detektorschaltung
RU2586457C1 (ru) * 2015-02-25 2016-06-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Тамбовский государственный технический университет" ФГБОУ ВПО ТГТУ Способ определения составляющих импеданса биообъекта
US20170093442A1 (en) 2015-09-28 2017-03-30 Skyworks Solutions, Inc. Integrated front-end architecture for carrier aggregation
EP3933416B1 (de) 2020-06-30 2024-09-18 Imec VZW Rf-impedanz-messschaltung
CN113671257B (zh) * 2021-08-12 2022-10-04 合肥工业大学 扰动方式切换的阻抗测量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2931900A (en) * 1955-01-31 1960-04-05 David M Goodman Electrical testing
GB953477A (en) * 1961-03-03 1964-03-25 Lothar Rohde Apparatus for the automatic display of complex electrical characteristics of networks
US3986113A (en) * 1973-11-23 1976-10-12 Hewlett-Packard Company Two channel test instrument with active electronicphase shift means
FR2497947A1 (fr) * 1981-01-09 1982-07-16 Technologie Biomedicale Centre Procede et dispositif de thermographie-hyperthermie en micro-ondes
US4506209A (en) * 1982-12-27 1985-03-19 Rockwell International Corporation Tracking impedance measuring system
SU1160331A1 (ru) * 1983-11-30 1985-06-07 Sevastopol Priborostroit Inst Измеритель комплексного коэффициента отражения
FR2560998B1 (fr) * 1984-03-09 1987-07-10 Centre Nat Rech Scient Procede de mesure d'impedance en haute frequence et installation de mesure d'impedance en haute frequence pour la mise en oeuvre de ce procede

Also Published As

Publication number Publication date
EP0214015B1 (de) 1990-05-30
FR2585557A1 (fr) 1987-02-06
US4780661A (en) 1988-10-25
FR2585557B1 (fr) 1987-11-06
EP0214015A1 (de) 1987-03-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee