DE3817739C2 - - Google Patents

Info

Publication number
DE3817739C2
DE3817739C2 DE3817739A DE3817739A DE3817739C2 DE 3817739 C2 DE3817739 C2 DE 3817739C2 DE 3817739 A DE3817739 A DE 3817739A DE 3817739 A DE3817739 A DE 3817739A DE 3817739 C2 DE3817739 C2 DE 3817739C2
Authority
DE
Germany
Prior art keywords
atomic
light
sample
elements
heating furnace
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3817739A
Other languages
German (de)
English (en)
Other versions
DE3817739A1 (de
Inventor
Konosuke Mito Jp Oishi
Masamichi Ibaraki Jp Tsukada
Masatoshi Mito Jp Kitagawa
Toyoharu Katsuta Jp Okumoto
Hayato Mito Jp Tobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE3817739A1 publication Critical patent/DE3817739A1/de
Application granted granted Critical
Publication of DE3817739C2 publication Critical patent/DE3817739C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis
    • G01N2021/3111—Atomic absorption analysis using Zeeman split
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis
    • G01N2021/3114—Multi-element AAS arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/74—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06166—Line selective sources

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE3817739A 1987-05-25 1988-05-25 Atomabsorptionsspektrophotometer Granted DE3817739A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62127793A JPH0623691B2 (ja) 1987-05-25 1987-05-25 原子吸光分光光度計

Publications (2)

Publication Number Publication Date
DE3817739A1 DE3817739A1 (de) 1988-12-08
DE3817739C2 true DE3817739C2 (enExample) 1992-11-19

Family

ID=14968816

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3817739A Granted DE3817739A1 (de) 1987-05-25 1988-05-25 Atomabsorptionsspektrophotometer

Country Status (3)

Country Link
US (1) US4867562A (enExample)
JP (1) JPH0623691B2 (enExample)
DE (1) DE3817739A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0672841B2 (ja) * 1988-03-04 1994-09-14 株式会社日立製作所 原子吸光分光光度計
JPH06100538B2 (ja) * 1989-08-02 1994-12-12 株式会社日立製作所 原子吸光分光光度計
US5283624A (en) * 1989-10-18 1994-02-01 Hitachi, Ltd. Multi-element simultaneous analysis atomic absorption spectroscopy photometer and multi-element simultaneous analytic method
US5135305A (en) * 1991-03-01 1992-08-04 Thermo Jarrell Ash Corporation Spectroanalytical system
US5095205A (en) * 1991-03-01 1992-03-10 Thermo Jarrell Ash Corporation Spectroanalytical system
DE4115401C2 (de) * 1991-05-10 1994-04-14 Rainer Dr Uhl Fluoreszenz-Meßvorrichtung zum Bestimmen der Ionenkonzentration eines Untersuchungsobjekts, das mit einem Fluoreszenzfarbstoff eingefärbt ist, dessen Anregungsmaximum sich in Abhängigkeit von der zu bestimmenden Ionenkonzentration ändert
DE4413096B4 (de) * 1994-04-15 2004-09-09 Berthold Gmbh & Co. Kg Multielement-Atomabsorptionsspektrometer sowie Meßverfahren unter Nutzung eines solchen Atomabsorptionsspektrometers
US6534768B1 (en) 2000-10-30 2003-03-18 Euro-Oeltique, S.A. Hemispherical detector
JP4491277B2 (ja) * 2004-05-21 2010-06-30 株式会社日立ハイテクノロジーズ 試料分析装置
JP2009041941A (ja) * 2007-08-06 2009-02-26 Fuji Electric Systems Co Ltd ガス濃度測定装置およびガス濃度測定方法
CN110579564B (zh) * 2019-10-29 2021-03-23 长沙开元弘盛科技有限公司 一种同时测定汞、镉、锌、铅的装置和方法
FR3152057A1 (fr) * 2023-08-11 2025-02-14 Centre National De La Recherche Scientifique Système de contrôle de dépôt de couches minces comportant une source de lumière continue et une cavité optique.

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3552657A (en) * 1967-02-20 1971-01-05 Bausch & Lomb Aspirator assembly for a premix burner
US3544789A (en) * 1968-03-04 1970-12-01 Irwin Wieder Atomic absorption detection of given substances independent of absorption by background substances
JPS526587A (en) * 1975-07-04 1977-01-19 Hitachi Ltd Light flux unifying device
JPS526586A (en) * 1975-07-04 1977-01-19 Hitachi Ltd Atom extinction analyzer
DE2950105C2 (de) * 1979-12-13 1982-05-19 Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen Atomabsorptionsspektrometer mit verschiedenen, wahlweise einsetzbaren Atomisierungsvorrichtungen
JPH05262493A (ja) * 1992-03-19 1993-10-12 Arai Jidosha Seibi Kojo:Kk 移動クレーン用フック固定装置

Also Published As

Publication number Publication date
JPS63292040A (ja) 1988-11-29
JPH0623691B2 (ja) 1994-03-30
US4867562A (en) 1989-09-19
DE3817739A1 (de) 1988-12-08

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee