DE3788855D1 - Modulareingerichteter Speicherprüfer. - Google Patents

Modulareingerichteter Speicherprüfer.

Info

Publication number
DE3788855D1
DE3788855D1 DE87114570T DE3788855T DE3788855D1 DE 3788855 D1 DE3788855 D1 DE 3788855D1 DE 87114570 T DE87114570 T DE 87114570T DE 3788855 T DE3788855 T DE 3788855T DE 3788855 D1 DE3788855 D1 DE 3788855D1
Authority
DE
Germany
Prior art keywords
modular memory
memory checker
checker
modular
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE87114570T
Other languages
English (en)
Other versions
DE3788855T2 (de
Inventor
Richard Bogholtz
Louis Joseph Bosch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3788855D1 publication Critical patent/DE3788855D1/de
Publication of DE3788855T2 publication Critical patent/DE3788855T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE3788855T 1986-11-24 1987-10-06 Modulareingerichteter Speicherprüfer. Expired - Fee Related DE3788855T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/934,046 US4730318A (en) 1986-11-24 1986-11-24 Modular organized storage tester

Publications (2)

Publication Number Publication Date
DE3788855D1 true DE3788855D1 (de) 1994-03-03
DE3788855T2 DE3788855T2 (de) 1994-06-23

Family

ID=25464873

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3788855T Expired - Fee Related DE3788855T2 (de) 1986-11-24 1987-10-06 Modulareingerichteter Speicherprüfer.

Country Status (4)

Country Link
US (1) US4730318A (de)
EP (1) EP0268789B1 (de)
JP (1) JPH0650338B2 (de)
DE (1) DE3788855T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3773773D1 (de) * 1986-06-25 1991-11-21 Nec Corp Pruefschaltung fuer eine speichereinrichtung mit willkuerlichem zugriff.
GB2214314B (en) * 1988-01-07 1992-01-02 Genrad Ltd Automatic circuit tester
US4965799A (en) * 1988-08-05 1990-10-23 Microcomputer Doctors, Inc. Method and apparatus for testing integrated circuit memories
US5321700A (en) * 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
JP2831767B2 (ja) * 1990-01-10 1998-12-02 株式会社アドバンテスト 半導体メモリ試験装置
US5222067A (en) * 1990-03-08 1993-06-22 Terenix Co., Ltd. Detection of pattern-sensitive faults in RAM by use of M-sequencers
JP2813237B2 (ja) * 1990-06-08 1998-10-22 株式会社アドバンテスト Ｉｃ試験用クロック遅延時間の設定方法
US5195097A (en) * 1990-10-19 1993-03-16 International Business Machines Corporation High speed tester
FR2684208B1 (fr) * 1990-10-30 1995-01-27 Teradyne Inc Circuit destine a fournir une information de periode.
JPH05143476A (ja) * 1991-11-20 1993-06-11 Fujitsu Ltd 命令キユーの診断方式
FR2733324B1 (fr) * 1995-04-19 1997-05-30 Schlumberger Ind Sa Procede et equipement de test automatique en parallele de composants electroniques
JP2976276B2 (ja) * 1996-05-31 1999-11-10 安藤電気株式会社 タイミング発生器
US6275962B1 (en) * 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
US20110087861A1 (en) * 2009-10-12 2011-04-14 The Regents Of The University Of Michigan System for High-Efficiency Post-Silicon Verification of a Processor
US20190056288A1 (en) * 2017-08-17 2019-02-21 Crystal Instruments Corporation Integrated control system and method for environmental testing chamber
US11726904B2 (en) 2021-09-23 2023-08-15 International Business Machines Corporation Controlled input/output in progress state during testcase processing

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1354827A (en) * 1971-08-25 1974-06-05 Ibm Data processing systems
SE408985B (sv) * 1977-12-27 1979-07-16 Philips Svenska Ab Pulsgenerator
US4317200A (en) * 1978-10-20 1982-02-23 Vlsi Technology Research Association Method and device for testing a sequential circuit divided into a plurality of partitions
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
JPS6030973B2 (ja) * 1980-01-18 1985-07-19 日本電気株式会社 高速パタ−ン発生器
DE3047239C2 (de) * 1980-12-16 1982-12-30 Wandel & Goltermann Gmbh & Co, 7412 Eningen Verfahren und Schaltungsanordnung zum Messen der Güte digitaler Übertragungsstrecken und -einrichtungen
JPS57173220A (en) * 1981-04-17 1982-10-25 Toshiba Corp Comparator circuit
US4433414A (en) * 1981-09-30 1984-02-21 Fairchild Camera And Instrument Corporation Digital tester local memory data storage system
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4451918A (en) * 1981-10-09 1984-05-29 Teradyne, Inc. Test signal reloader
US4456995A (en) * 1981-12-18 1984-06-26 International Business Machines Corporation Apparatus for high speed fault mapping of large memories
JPS5990067A (ja) * 1982-11-15 1984-05-24 Advantest Corp 論理回路試験用パタ−ン発生装置
US4649516A (en) * 1984-06-01 1987-03-10 International Business Machines Corp. Dynamic row buffer circuit for DRAM
US4696005A (en) * 1985-06-03 1987-09-22 International Business Machines Corporation Apparatus for reducing test data storage requirements for high speed VLSI circuit testing
US4635261A (en) * 1985-06-26 1987-01-06 Motorola, Inc. On chip test system for configurable gate arrays
US4682330A (en) * 1985-10-11 1987-07-21 International Business Machines Corporation Hierarchical test system architecture

Also Published As

Publication number Publication date
JPH0650338B2 (ja) 1994-06-29
DE3788855T2 (de) 1994-06-23
EP0268789B1 (de) 1994-01-19
EP0268789A2 (de) 1988-06-01
US4730318A (en) 1988-03-08
JPS63140966A (ja) 1988-06-13
EP0268789A3 (en) 1990-04-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee