DE3689931D1 - Schnell schaltende laterale Transistoren mit isoliertem Gate. - Google Patents
Schnell schaltende laterale Transistoren mit isoliertem Gate.Info
- Publication number
- DE3689931D1 DE3689931D1 DE3689931T DE3689931T DE3689931D1 DE 3689931 D1 DE3689931 D1 DE 3689931D1 DE 3689931 T DE3689931 T DE 3689931T DE 3689931 T DE3689931 T DE 3689931T DE 3689931 D1 DE3689931 D1 DE 3689931D1
- Authority
- DE
- Germany
- Prior art keywords
- insulated gate
- fast switching
- lateral transistors
- switching lateral
- transistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/083—Anode or cathode regions of thyristors or gated bipolar-mode devices
- H01L29/0834—Anode regions of thyristors or gated bipolar-mode devices, e.g. supplementary regions surrounding anode regions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
- H01L29/41716—Cathode or anode electrodes for thyristors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/107—Substrate region of field-effect devices
- H01L29/1075—Substrate region of field-effect devices of field-effect transistors
- H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
- H01L29/1083—Substrate region of field-effect devices of field-effect transistors with insulated gate with an inactive supplementary region, e.g. for preventing punch-through, improving capacity effect or leakage current
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US80278185A | 1985-11-27 | 1985-11-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3689931D1 true DE3689931D1 (de) | 1994-07-28 |
DE3689931T2 DE3689931T2 (de) | 1995-02-02 |
Family
ID=25184664
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19863650606 Expired - Fee Related DE3650606T2 (de) | 1985-11-27 | 1986-11-24 | Schnellschaltender, lateraler Feldeffekttransistor mit isolierter Steuerelektrode |
DE19863689931 Expired - Fee Related DE3689931T2 (de) | 1985-11-27 | 1986-11-24 | Schnell schaltende laterale Transistoren mit isoliertem Gate. |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19863650606 Expired - Fee Related DE3650606T2 (de) | 1985-11-27 | 1986-11-24 | Schnellschaltender, lateraler Feldeffekttransistor mit isolierter Steuerelektrode |
Country Status (4)
Country | Link |
---|---|
EP (2) | EP0228107B1 (de) |
JP (1) | JPH0732249B2 (de) |
CA (1) | CA1252225A (de) |
DE (2) | DE3650606T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6380569A (ja) * | 1986-09-24 | 1988-04-11 | Fuji Electric Co Ltd | 伝導度変調型横型mos−fet |
JPS63173365A (ja) * | 1986-11-26 | 1988-07-16 | ゼネラル・エレクトリック・カンパニイ | ラテラル形絶縁ゲート半導体装置とその製法 |
JPS6459947A (en) * | 1987-08-31 | 1989-03-07 | Toshiba Corp | Semiconductor device |
JPH0680832B2 (ja) * | 1987-09-30 | 1994-10-12 | 日本電気株式会社 | 半導体装置 |
US4939566A (en) * | 1987-10-30 | 1990-07-03 | North American Philips Corporation | Semiconductor switch with parallel DMOS and IGT |
US4926074A (en) * | 1987-10-30 | 1990-05-15 | North American Philips Corporation | Semiconductor switch with parallel lateral double diffused MOS transistor and lateral insulated gate transistor |
JP2728453B2 (ja) * | 1988-09-14 | 1998-03-18 | 株式会社日立製作所 | 出力回路 |
JP2901621B2 (ja) * | 1988-10-19 | 1999-06-07 | 株式会社日立製作所 | 導電変調型mosデバイス |
EP0371785B1 (de) * | 1988-11-29 | 1996-05-01 | Kabushiki Kaisha Toshiba | Lateraler Leitfähigkeitsmodulations-MOSFET |
US5017992A (en) * | 1989-03-29 | 1991-05-21 | Asea Brown Boveri Ltd. | High blocking-capacity semiconductor component |
US5027177A (en) * | 1989-07-24 | 1991-06-25 | Hughes Aircraft Company | Floating base lateral bipolar phototransistor with field effect gate voltage control |
US5378912A (en) * | 1993-11-10 | 1995-01-03 | Philips Electronics North America Corporation | Lateral semiconductor-on-insulator (SOI) semiconductor device having a lateral drift region |
DE19538090A1 (de) * | 1995-10-13 | 1997-04-17 | Asea Brown Boveri | Leistungshalbleiterelement |
JP3918209B2 (ja) * | 1996-09-11 | 2007-05-23 | 株式会社デンソー | 絶縁ゲート型バイポーラトランジスタ及びその製造方法 |
WO2001075979A1 (de) | 2000-03-31 | 2001-10-11 | Ihp Gmbh-Innovations For High Performance Microelectronics | Cmos-kompatibler lateraler dmos-transistor und verfahren zur herstellung eines derartigen transistors |
DE10057611C2 (de) * | 2000-11-21 | 2002-10-24 | Infineon Technologies Ag | Laterales Halbleiterbauelement |
GB2374456A (en) * | 2000-12-09 | 2002-10-16 | Esm Ltd | High-voltage metal oxide semiconductor device and method of forming the device |
JP2006287250A (ja) * | 2006-05-29 | 2006-10-19 | Rohm Co Ltd | 二重拡散型mosfetおよびこれを用いた半導体装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2706031A1 (de) * | 1977-02-12 | 1978-08-17 | Engl Walter L Prof Dr Rer Nat | Integrierte schaltung mit einem thyristor |
JPS55128870A (en) * | 1979-03-26 | 1980-10-06 | Semiconductor Res Found | Electrostatic induction thyristor and semiconductor device |
US4300150A (en) * | 1980-06-16 | 1981-11-10 | North American Philips Corporation | Lateral double-diffused MOS transistor device |
EP0273030A3 (de) * | 1982-12-13 | 1988-09-21 | General Electric Company | Laterale Gleichrichter mit isoliertem Gate |
DE3370410D1 (en) * | 1982-12-27 | 1987-04-23 | Philips Nv | Lateral dmos transistor device having an injector region |
GB2173037A (en) * | 1985-03-29 | 1986-10-01 | Philips Electronic Associated | Semiconductor devices employing conductivity modulation |
-
1986
- 1986-11-20 CA CA000523450A patent/CA1252225A/en not_active Expired
- 1986-11-24 EP EP19860202083 patent/EP0228107B1/de not_active Expired - Lifetime
- 1986-11-24 DE DE19863650606 patent/DE3650606T2/de not_active Expired - Fee Related
- 1986-11-24 DE DE19863689931 patent/DE3689931T2/de not_active Expired - Fee Related
- 1986-11-24 EP EP92203132A patent/EP0522670B1/de not_active Expired - Lifetime
- 1986-11-25 JP JP27889386A patent/JPH0732249B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0228107B1 (de) | 1994-06-22 |
DE3689931T2 (de) | 1995-02-02 |
DE3650606D1 (de) | 1997-04-30 |
EP0522670A1 (de) | 1993-01-13 |
EP0522670B1 (de) | 1997-03-26 |
DE3650606T2 (de) | 1997-09-11 |
EP0228107A2 (de) | 1987-07-08 |
JPH0732249B2 (ja) | 1995-04-10 |
JPS62131580A (ja) | 1987-06-13 |
EP0228107A3 (en) | 1988-08-31 |
CA1252225A (en) | 1989-04-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL |
|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N |
|
8339 | Ceased/non-payment of the annual fee |