DE3471368D1 - Interferometric thickness analyzer and measuring method - Google Patents

Interferometric thickness analyzer and measuring method

Info

Publication number
DE3471368D1
DE3471368D1 DE8484113059T DE3471368T DE3471368D1 DE 3471368 D1 DE3471368 D1 DE 3471368D1 DE 8484113059 T DE8484113059 T DE 8484113059T DE 3471368 T DE3471368 T DE 3471368T DE 3471368 D1 DE3471368 D1 DE 3471368D1
Authority
DE
Germany
Prior art keywords
measurement
measuring method
mirrors
incident
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484113059T
Other languages
English (en)
Inventor
Walter Dr Dipl Phys Jaerisch
Gunter Dipl Phys Makosch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IBM Deutschland GmbH
International Business Machines Corp
Original Assignee
IBM Deutschland GmbH
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IBM Deutschland GmbH, International Business Machines Corp filed Critical IBM Deutschland GmbH
Application granted granted Critical
Publication of DE3471368D1 publication Critical patent/DE3471368D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE8484113059T 1984-10-31 1984-10-31 Interferometric thickness analyzer and measuring method Expired DE3471368D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP84113059A EP0179935B1 (de) 1984-10-31 1984-10-31 Interferometrischer Dickenanalysierer und Messmethode

Publications (1)

Publication Number Publication Date
DE3471368D1 true DE3471368D1 (en) 1988-06-23

Family

ID=8192252

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484113059T Expired DE3471368D1 (en) 1984-10-31 1984-10-31 Interferometric thickness analyzer and measuring method

Country Status (4)

Country Link
US (1) US4653922A (de)
EP (1) EP0179935B1 (de)
JP (1) JPS61108904A (de)
DE (1) DE3471368D1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4747683A (en) * 1986-01-17 1988-05-31 Eye Research Institute Of Retina Foundation Method and device for in vivo wetting determinations
US5654798A (en) * 1995-01-19 1997-08-05 Tropel Corporation Interferometric measurement of surfaces with diffractive optics at grazing incidence
DE19602445A1 (de) * 1996-01-24 1997-07-31 Nanopro Luftlager Produktions Vorrichtung und Verfahren zum Vermessen von zwei einander gegenüberliegenden Oberflächen eines Körpers
US5719676A (en) * 1996-04-12 1998-02-17 Tropel Corporation Diffraction management for grazing incidence interferometer
EP0902874B1 (de) * 1996-05-31 2004-01-28 Tropel Corporation Interferometer zur dickevariationsmessung von halbleitersubstraten
US5889591A (en) * 1996-10-17 1999-03-30 Tropel Corporation Interferometric measurement of toric surfaces at grazing incidence
US5777738A (en) * 1997-03-17 1998-07-07 Tropel Corporation Interferometric measurement of absolute dimensions of cylindrical surfaces at grazing incidence
SE514004C2 (sv) * 1998-03-20 2000-12-11 Precimeter Ab Tjockleksmätning med en detektor genom belysning av två ytor hos ett föremål, anordning, apparat och metod
US6249351B1 (en) 1999-06-03 2001-06-19 Zygo Corporation Grazing incidence interferometer and method
JP5112588B2 (ja) * 2000-01-25 2013-01-09 ザイゴ コーポレーション 精密工業部品の形状および幾何学的寸法を測定するための方法並びに装置
AU2001253139A1 (en) * 2000-04-05 2001-10-23 Kla-Tencor Corporation Reduced coherence symmetric grazing incidence differential interferometer
US6847458B2 (en) * 2003-03-20 2005-01-25 Phase Shift Technology, Inc. Method and apparatus for measuring the shape and thickness variation of polished opaque plates
NL2028788A (en) * 2020-08-27 2022-04-29 Asml Netherlands Bv Compact dual pass interferometer for a plane mirror interferometer
CN115560682B (zh) * 2022-12-05 2023-02-03 上海拜安传感技术有限公司 一种位移测量装置及其制造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE708100A (de) * 1967-05-05 1968-06-17
FR1562548A (de) * 1967-05-05 1969-04-04
NL7404593A (en) * 1974-04-04 1975-10-07 Stichting Reactor Centrum System with laser interferometer measuring relative positions - compares object beam with reference reflected from opposite sides of object
SU759845A1 (ru) * 1977-05-03 1980-08-30 Aleksandr G Flejsher ИНТЕРФЕРОМЕТР ДЛЯ ИЗМЕРЕНИЯ НАРУЖНЫХ РАЗМЕРОВ ДЕТАЛЕЙ 1 "" ' /
DE2803466A1 (de) * 1978-01-27 1979-08-02 Erhard Dipl Ing Debler Optisches ebenheitsmessverfahren

Also Published As

Publication number Publication date
EP0179935B1 (de) 1988-05-18
JPH043806B2 (de) 1992-01-24
JPS61108904A (ja) 1986-05-27
US4653922A (en) 1987-03-31
EP0179935A1 (de) 1986-05-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee