DE3468446D1 - Porous semiconductor dopant carriers - Google Patents

Porous semiconductor dopant carriers

Info

Publication number
DE3468446D1
DE3468446D1 DE8484303901T DE3468446T DE3468446D1 DE 3468446 D1 DE3468446 D1 DE 3468446D1 DE 8484303901 T DE8484303901 T DE 8484303901T DE 3468446 T DE3468446 T DE 3468446T DE 3468446 D1 DE3468446 D1 DE 3468446D1
Authority
DE
Germany
Prior art keywords
dopant
porous semiconductor
carriers
semiconductor dopant
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484303901T
Other languages
English (en)
Inventor
Gregory Allyn Kaiser
Gabriel Paul Demunda
Richard Ernest Tressler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Stemcor Corp
Original Assignee
Stemcor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stemcor Corp filed Critical Stemcor Corp
Application granted granted Critical
Publication of DE3468446D1 publication Critical patent/DE3468446D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/06Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
    • C30B31/16Feed and outlet means for the gases; Modifying the flow of the gases
    • C30B31/165Diffusion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/2225Diffusion sources
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S252/00Compositions
    • Y10S252/95Doping agent source material
    • Y10S252/951Doping agent source material for vapor transport
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12014All metal or with adjacent metals having metal particles
    • Y10T428/12153Interconnected void structure [e.g., permeable, etc.]

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Ceramic Products (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)
  • Weting (AREA)
  • Formation Of Insulating Films (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Element Separation (AREA)
DE8484303901T 1983-06-08 1984-06-08 Porous semiconductor dopant carriers Expired DE3468446D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/502,287 US4525429A (en) 1983-06-08 1983-06-08 Porous semiconductor dopant carriers

Publications (1)

Publication Number Publication Date
DE3468446D1 true DE3468446D1 (de) 1988-02-11

Family

ID=23997152

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484303901T Expired DE3468446D1 (de) 1983-06-08 1984-06-08 Porous semiconductor dopant carriers

Country Status (8)

Country Link
US (1) US4525429A (de)
EP (1) EP0151851B1 (de)
JP (1) JPS6024010A (de)
KR (1) KR850000777A (de)
AT (1) ATE31747T1 (de)
CA (1) CA1217784A (de)
DE (1) DE3468446D1 (de)
IE (1) IE55723B1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4596716A (en) * 1983-06-08 1986-06-24 Kennecott Corporation Porous silicon nitride semiconductor dopant carriers
DE3430912A1 (de) * 1984-08-22 1986-02-27 Hutschenreuther Ag, 8672 Selb Abgaskatalysator und verfahren zu seiner herstellung
US4892786A (en) * 1986-09-16 1990-01-09 Lanxide Technology Company, Lp Ceramic articles with a polymer component and methods of making same
US5110675A (en) * 1986-09-16 1992-05-05 Lanxide Technology Company, Lp Ceramic articles with a polymer component and methods of making same
US4749615A (en) * 1986-10-31 1988-06-07 Stemcor Corporation Semiconductor dopant source
JPH0628250B2 (ja) * 1988-07-18 1994-04-13 古河機械金属株式会社 砒素拡散剤とその成形物の製法およびこれを使用した半導体装置の製造方法
GB8817886D0 (en) * 1988-07-27 1988-09-01 British Telecomm Avalanche photodiode structure
US5298767A (en) * 1992-10-06 1994-03-29 Kulite Semiconductor Products, Inc. Porous silicon carbide (SiC) semiconductor device
KR100358129B1 (ko) * 1995-02-27 2003-01-24 주식회사 하이닉스반도체 산화물이도핑된폴리실리콘막을사용한반도체소자제조방법
US5904892A (en) * 1996-04-01 1999-05-18 Saint-Gobain/Norton Industrial Ceramics Corp. Tape cast silicon carbide dummy wafer
US5770324A (en) * 1997-03-03 1998-06-23 Saint-Gobain Industrial Ceramics, Inc. Method of using a hot pressed silicon carbide dummy wafer
JP4442892B2 (ja) * 2004-03-29 2010-03-31 コバレントマテリアル株式会社 シリコン単結晶引上げ用砒素ドーパントの製造方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS454134Y1 (de) * 1968-06-03 1970-02-25
US3658606A (en) * 1969-04-01 1972-04-25 Ibm Diffusion source and method of producing same
US3640806A (en) * 1970-01-05 1972-02-08 Nippon Telegraph & Telephone Semiconductor device and method of producing the same
JPS4995567A (de) * 1973-01-12 1974-09-10
US3951587A (en) * 1974-12-06 1976-04-20 Norton Company Silicon carbide diffusion furnace components
US4028149A (en) * 1976-06-30 1977-06-07 Ibm Corporation Process for forming monocrystalline silicon carbide on silicon substrates
JPS554712A (en) * 1978-06-22 1980-01-14 Tdk Corp Base for magnetic recording tape
US4292264A (en) * 1978-07-18 1981-09-29 Motorola, Inc. Method for producing polycrystalline ribbon
US4277320A (en) * 1979-10-01 1981-07-07 Rockwell International Corporation Process for direct thermal nitridation of silicon semiconductor devices
US4381233A (en) * 1980-05-19 1983-04-26 Asahi Kasei Kogyo Kabushiki Kaisha Photoelectrolyzer
JPS5746897A (en) * 1981-07-22 1982-03-17 Sharp Corp Diluting liquid for ink to be jetted
IE56118B1 (en) * 1983-06-08 1991-04-24 Kennecott Corp Foam semiconductor dopant carriers
US4596716A (en) * 1983-06-08 1986-06-24 Kennecott Corporation Porous silicon nitride semiconductor dopant carriers
CA1221388A (en) * 1983-06-08 1987-05-05 Martin R. Kasprzyk Composite refractory foams

Also Published As

Publication number Publication date
ATE31747T1 (de) 1988-01-15
CA1217784A (en) 1987-02-10
IE841412L (en) 1984-12-08
EP0151851A3 (en) 1985-09-25
EP0151851B1 (de) 1988-01-07
JPS6024010A (ja) 1985-02-06
KR850000777A (ko) 1985-03-09
EP0151851A2 (de) 1985-08-21
IE55723B1 (en) 1991-01-02
US4525429A (en) 1985-06-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee