DE3445677A1 - Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung - Google Patents

Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung

Info

Publication number
DE3445677A1
DE3445677A1 DE19843445677 DE3445677A DE3445677A1 DE 3445677 A1 DE3445677 A1 DE 3445677A1 DE 19843445677 DE19843445677 DE 19843445677 DE 3445677 A DE3445677 A DE 3445677A DE 3445677 A1 DE3445677 A1 DE 3445677A1
Authority
DE
Germany
Prior art keywords
radiation
screen
measuring probe
probe housing
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19843445677
Other languages
German (de)
English (en)
Other versions
DE3445677C2 (cg-RX-API-DMAC7.html
Inventor
Günter Hempowitz
Gustav Dr. 5170 Jülich Meyer-Kretschmer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Uranit GmbH
Original Assignee
Uranit GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Uranit GmbH filed Critical Uranit GmbH
Priority to DE19843445677 priority Critical patent/DE3445677A1/de
Priority to NL8502666A priority patent/NL192634C/nl
Priority to GB08527183A priority patent/GB2170315B/en
Priority to US06/796,099 priority patent/US4679948A/en
Priority to AU50012/85A priority patent/AU579682B2/en
Priority to JP60278112A priority patent/JPH0625698B2/ja
Priority to CA000497583A priority patent/CA1258191A/en
Publication of DE3445677A1 publication Critical patent/DE3445677A1/de
Application granted granted Critical
Publication of DE3445677C2 publication Critical patent/DE3445677C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
DE19843445677 1984-12-14 1984-12-14 Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung Granted DE3445677A1 (de)

Priority Applications (7)

Application Number Priority Date Filing Date Title
DE19843445677 DE3445677A1 (de) 1984-12-14 1984-12-14 Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung
NL8502666A NL192634C (nl) 1984-12-14 1985-09-30 Stralingsmeetsonde voor contactloze, van emissiegraad onafhankelijke temperatuurmeting.
GB08527183A GB2170315B (en) 1984-12-14 1985-11-05 Radiation measuring probe for contactless measurement of the surface temperature of an object independent of the emissivity of the object
US06/796,099 US4679948A (en) 1984-12-14 1985-11-07 Radiation probe for contactless measurement of the surface temperature of an object
AU50012/85A AU579682B2 (en) 1984-12-14 1985-11-18 Radiation measuring probe for contact-less measurement of the surface temperature of an object independent of the emissivity of the object
JP60278112A JPH0625698B2 (ja) 1984-12-14 1985-12-12 物体表面の温度を放射率と無関係に無接触測定する放射センサ
CA000497583A CA1258191A (en) 1984-12-14 1985-12-13 Radiation measuring probe for contactless measurement of the surface temperature of an object independent of the emissivity of the object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843445677 DE3445677A1 (de) 1984-12-14 1984-12-14 Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung

Publications (2)

Publication Number Publication Date
DE3445677A1 true DE3445677A1 (de) 1986-06-19
DE3445677C2 DE3445677C2 (cg-RX-API-DMAC7.html) 1989-11-23

Family

ID=6252808

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843445677 Granted DE3445677A1 (de) 1984-12-14 1984-12-14 Strahlungsmesssonde zur beruehrungslosen, emissionsgradunabhaengigen temperaturmessung

Country Status (7)

Country Link
US (1) US4679948A (cg-RX-API-DMAC7.html)
JP (1) JPH0625698B2 (cg-RX-API-DMAC7.html)
AU (1) AU579682B2 (cg-RX-API-DMAC7.html)
CA (1) CA1258191A (cg-RX-API-DMAC7.html)
DE (1) DE3445677A1 (cg-RX-API-DMAC7.html)
GB (1) GB2170315B (cg-RX-API-DMAC7.html)
NL (1) NL192634C (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0270299A3 (en) * 1986-11-29 1990-01-10 THORN EMI plc A temperature sensing arrangement
DE19549311C2 (de) * 1995-12-29 1999-12-23 Deutsch Zentr Luft & Raumfahrt Infrarot-Eichstrahler und Verfahren zu dessen Herstellung sowie dessen Verwendung
DE19549310C2 (de) * 1995-12-29 1999-12-23 Deutsch Zentr Luft & Raumfahrt Infrarot-Eichstrahler mit großer Apertur und dessen Verwendung als Empfänger

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4900162A (en) * 1989-03-20 1990-02-13 Ivac Corporation Infrared thermometry system and method
GB2266771B (en) * 1992-04-22 1995-11-01 Robert Lendrum Fyfe Heatflow balancing thermometer
US5312186A (en) * 1992-11-04 1994-05-17 The United States Of America As Represented By The United States Department Of Energy High temperature probe
KR0133476B1 (ko) * 1994-03-18 1998-04-23 구자홍 마이크로 웨이브 오븐
US6408651B1 (en) 1999-12-30 2002-06-25 Corning Incorporated Method of manufacturing optical fibers using thermopiles to measure fiber energy
US9482583B1 (en) * 2011-10-06 2016-11-01 Esolar, Inc. Automated heliostat reflectivity measurement system
DE202015103789U1 (de) * 2015-07-17 2015-07-31 Abb Technology Ag Oberflächentemperaturfühler

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2837917A (en) * 1950-02-07 1958-06-10 Leeds & Northrup Co Radiation systems for measuring temperature

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3401263A (en) * 1965-04-15 1968-09-10 Richard C. Birkebak Apparatus and method of measuring emissivity of an object
FR2125130B1 (cg-RX-API-DMAC7.html) * 1971-02-12 1974-04-26 Schlumberger Compteurs
CH557529A (de) * 1973-04-30 1974-12-31 Bbc Brown Boveri & Cie Pyrometrisches verfahren zur beruehrungslosen temperaturmessung.
JPS547467B2 (cg-RX-API-DMAC7.html) * 1973-07-19 1979-04-06
US4019381A (en) * 1976-01-12 1977-04-26 The United States Of America As Represented By The Secretary Of The Army Transparent optical power meter
JPS5922501Y2 (ja) * 1976-01-16 1984-07-05 三菱重工業株式会社 放射温度計
JPS5359479A (en) * 1976-11-09 1978-05-29 Toshiba Corp Temperature detector
JPS6015145Y2 (ja) * 1976-12-20 1985-05-14 島田理化工業株式会社 レ−ザ出力計
US4435092A (en) * 1980-07-25 1984-03-06 Nippon Steel Corporation Surface temperature measuring apparatus for object within furnace
JPS57113332A (en) * 1980-12-30 1982-07-14 Horiba Ltd Compensating thermopile detector
JPS57137826A (en) * 1981-04-15 1982-08-25 Nippon Koshuha Kk Measuring device for radiation energy
NZ198264A (en) * 1981-09-03 1985-03-20 Nz Government Hand-held multispectral radiometer for remote sensing
AU3161884A (en) * 1983-08-04 1985-02-07 Unisearch Limited Pyrheliometer
DE3423494C2 (de) * 1984-06-26 1986-09-04 Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln Einrichtung zur Messung der aus dem Halbraum kommenden elektromagnetischen Strahlung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2837917A (en) * 1950-02-07 1958-06-10 Leeds & Northrup Co Radiation systems for measuring temperature

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0270299A3 (en) * 1986-11-29 1990-01-10 THORN EMI plc A temperature sensing arrangement
DE19549311C2 (de) * 1995-12-29 1999-12-23 Deutsch Zentr Luft & Raumfahrt Infrarot-Eichstrahler und Verfahren zu dessen Herstellung sowie dessen Verwendung
DE19549310C2 (de) * 1995-12-29 1999-12-23 Deutsch Zentr Luft & Raumfahrt Infrarot-Eichstrahler mit großer Apertur und dessen Verwendung als Empfänger

Also Published As

Publication number Publication date
NL192634B (nl) 1997-07-01
GB2170315B (en) 1988-09-07
GB2170315A (en) 1986-07-30
JPS61144519A (ja) 1986-07-02
JPH0625698B2 (ja) 1994-04-06
GB8527183D0 (en) 1985-12-11
AU579682B2 (en) 1988-12-01
DE3445677C2 (cg-RX-API-DMAC7.html) 1989-11-23
AU5001285A (en) 1986-06-19
NL192634C (nl) 1997-11-04
US4679948A (en) 1987-07-14
NL8502666A (nl) 1986-07-01
CA1258191A (en) 1989-08-08

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee