DE3010986A1 - Integrierte halbleiterschaltung - Google Patents
Integrierte halbleiterschaltungInfo
- Publication number
- DE3010986A1 DE3010986A1 DE19803010986 DE3010986A DE3010986A1 DE 3010986 A1 DE3010986 A1 DE 3010986A1 DE 19803010986 DE19803010986 DE 19803010986 DE 3010986 A DE3010986 A DE 3010986A DE 3010986 A1 DE3010986 A1 DE 3010986A1
- Authority
- DE
- Germany
- Prior art keywords
- diffusion layer
- layer
- diffusion
- substrate
- conductivity type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 239000004065 semiconductor Substances 0.000 title claims description 70
- 238000009792 diffusion process Methods 0.000 claims description 125
- 230000004888 barrier function Effects 0.000 claims description 60
- 239000000758 substrate Substances 0.000 claims description 60
- 239000012535 impurity Substances 0.000 claims description 57
- 230000015556 catabolic process Effects 0.000 claims description 34
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 230000001681 protective effect Effects 0.000 claims description 13
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims 1
- 239000010410 layer Substances 0.000 description 123
- 229910052782 aluminium Inorganic materials 0.000 description 23
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 23
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 19
- 229910052710 silicon Inorganic materials 0.000 description 19
- 239000010703 silicon Substances 0.000 description 19
- 239000000969 carrier Substances 0.000 description 16
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 7
- 238000003860 storage Methods 0.000 description 7
- 230000010354 integration Effects 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- 239000011241 protective layer Substances 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0744—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common without components of the field effect type
- H01L27/075—Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. lateral bipolar transistor, and vertical bipolar transistor and resistor
- H01L27/0755—Vertical bipolar transistor in combination with diodes, or capacitors, or resistors
- H01L27/0761—Vertical bipolar transistor in combination with diodes only
- H01L27/0766—Vertical bipolar transistor in combination with diodes only with Schottky diodes only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
- H01L27/0711—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors
- H01L27/0722—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors in combination with lateral bipolar transistors and diodes, or capacitors, or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0744—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common without components of the field effect type
- H01L27/075—Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. lateral bipolar transistor, and vertical bipolar transistor and resistor
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electrodes Of Semiconductors (AREA)
- Bipolar Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3228579A JPS55125663A (en) | 1979-03-22 | 1979-03-22 | Semiconductor integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3010986A1 true DE3010986A1 (de) | 1980-10-09 |
Family
ID=12354684
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19803010986 Ceased DE3010986A1 (de) | 1979-03-22 | 1980-03-21 | Integrierte halbleiterschaltung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4380021A (fr) |
| JP (1) | JPS55125663A (fr) |
| BE (1) | BE882373A (fr) |
| CA (1) | CA1130472A (fr) |
| DE (1) | DE3010986A1 (fr) |
| FR (1) | FR2452179A1 (fr) |
| GB (1) | GB2049275B (fr) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5821866A (ja) * | 1981-07-31 | 1983-02-08 | Toshiba Corp | 半導体装置 |
| US4489341A (en) * | 1982-09-27 | 1984-12-18 | Sprague Electric Company | Merged-transistor switch with extra P-type region |
| JPS60137453U (ja) * | 1984-02-23 | 1985-09-11 | 関西日本電気株式会社 | 半導体装置 |
| JPH01147149U (fr) * | 1988-03-23 | 1989-10-11 | ||
| US4871686A (en) * | 1988-03-28 | 1989-10-03 | Motorola, Inc. | Integrated Schottky diode and transistor |
| US5982012A (en) * | 1998-01-14 | 1999-11-09 | Foveon, Inc. | Pixel cells and pixel cell arrays having low leakage and improved performance characteristics |
| TW451423B (en) * | 2000-02-01 | 2001-08-21 | Ind Tech Res Inst | Latch-up structure for improving CMOS processing using latch-up ion implantation and the manufacturing method thereof |
| US6657273B2 (en) * | 2001-06-12 | 2003-12-02 | International Rectifirer Corporation | Termination for high voltage schottky diode |
| US7129558B2 (en) | 2002-11-06 | 2006-10-31 | International Rectifier Corporation | Chip-scale schottky device |
| JP2014225483A (ja) * | 2011-09-16 | 2014-12-04 | パナソニック株式会社 | 半導体集積回路装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3909837A (en) * | 1968-12-31 | 1975-09-30 | Texas Instruments Inc | High-speed transistor with rectifying contact connected between base and collector |
| US3571674A (en) * | 1969-01-10 | 1971-03-23 | Fairchild Camera Instr Co | Fast switching pnp transistor |
| US3623925A (en) * | 1969-01-10 | 1971-11-30 | Fairchild Camera Instr Co | Schottky-barrier diode process and devices |
| US3623029A (en) * | 1969-12-15 | 1971-11-23 | Ibm | Bistable multiemitter silicon-controlled rectifier storage cell |
| DE2049555A1 (de) * | 1970-10-09 | 1972-04-13 | Licentia Gmbh | Integrierte, in einem gemeinsamen Halbleiterkörper untergebrachte Schaltungsanordnung |
| US3737742A (en) * | 1971-09-30 | 1973-06-05 | Trw Inc | Monolithic bi-polar semiconductor device employing cermet for both schottky barrier and ohmic contact |
| JPS568501B2 (fr) * | 1973-05-12 | 1981-02-24 | ||
| US3943554A (en) * | 1973-07-30 | 1976-03-09 | Signetics Corporation | Threshold switching integrated circuit and method for forming the same |
| JPS51126761A (en) * | 1975-04-25 | 1976-11-05 | Sony Corp | Schottky barrier type semi-conductor unit |
| US4119446A (en) * | 1977-08-11 | 1978-10-10 | Motorola Inc. | Method for forming a guarded Schottky barrier diode by ion-implantation |
| US4199860A (en) * | 1977-11-11 | 1980-04-29 | Rca Corporation | Method of integrating semiconductor components |
-
1979
- 1979-03-22 JP JP3228579A patent/JPS55125663A/ja active Granted
-
1980
- 1980-03-20 FR FR8006244A patent/FR2452179A1/fr active Granted
- 1980-03-21 CA CA348,140A patent/CA1130472A/fr not_active Expired
- 1980-03-21 US US06/131,931 patent/US4380021A/en not_active Expired - Lifetime
- 1980-03-21 DE DE19803010986 patent/DE3010986A1/de not_active Ceased
- 1980-03-21 BE BE0/199898A patent/BE882373A/fr not_active IP Right Cessation
- 1980-03-21 GB GB8009596A patent/GB2049275B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| FR2452179A1 (fr) | 1980-10-17 |
| BE882373A (fr) | 1980-07-16 |
| GB2049275A (en) | 1980-12-17 |
| CA1130472A (fr) | 1982-08-24 |
| JPS622461B2 (fr) | 1987-01-20 |
| FR2452179B1 (fr) | 1985-03-08 |
| JPS55125663A (en) | 1980-09-27 |
| GB2049275B (en) | 1983-07-20 |
| US4380021A (en) | 1983-04-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OAP | Request for examination filed | ||
| OD | Request for examination | ||
| 8131 | Rejection |