DE2924569C2 - Halbleiterdetektor aus hochreinem Grundmaterial, insbesondere Germanium - Google Patents
Halbleiterdetektor aus hochreinem Grundmaterial, insbesondere GermaniumInfo
- Publication number
- DE2924569C2 DE2924569C2 DE2924569A DE2924569A DE2924569C2 DE 2924569 C2 DE2924569 C2 DE 2924569C2 DE 2924569 A DE2924569 A DE 2924569A DE 2924569 A DE2924569 A DE 2924569A DE 2924569 C2 DE2924569 C2 DE 2924569C2
- Authority
- DE
- Germany
- Prior art keywords
- implantation
- phosphorus
- base material
- detectors
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
- H10F30/292—Bulk-effect radiation detectors, e.g. Ge-Li compensated PIN gamma-ray detectors
Landscapes
- Light Receiving Elements (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2924569A DE2924569C2 (de) | 1979-06-19 | 1979-06-19 | Halbleiterdetektor aus hochreinem Grundmaterial, insbesondere Germanium |
| GB8018484A GB2057758B (en) | 1979-06-19 | 1980-06-05 | N+contact for high purity semi-conductor detector |
| IL60322A IL60322A (en) | 1979-06-19 | 1980-06-16 | Semiconductor detector and its production |
| US06/160,232 US4415916A (en) | 1979-06-19 | 1980-06-17 | Germanium semiconducting radiation detector with phosphorus implanted n+ contact |
| FR8013520A FR2459554A1 (fr) | 1979-06-19 | 1980-06-18 | Detecteurs a semi-conducteurs au ge comportant un contact de type n+ realise par implantation de phosphore |
| CA000354273A CA1144663A (en) | 1979-06-19 | 1980-06-18 | Germanium semiconducting radiation detector with phosphorus implanted n.sup. contacts |
| JP8154380A JPS568886A (en) | 1979-06-19 | 1980-06-18 | Geesemiconductor detector having n****contact implanted with phosphorus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2924569A DE2924569C2 (de) | 1979-06-19 | 1979-06-19 | Halbleiterdetektor aus hochreinem Grundmaterial, insbesondere Germanium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2924569A1 DE2924569A1 (de) | 1981-01-08 |
| DE2924569C2 true DE2924569C2 (de) | 1983-12-08 |
Family
ID=6073511
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2924569A Expired DE2924569C2 (de) | 1979-06-19 | 1979-06-19 | Halbleiterdetektor aus hochreinem Grundmaterial, insbesondere Germanium |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4415916A (Direct) |
| JP (1) | JPS568886A (Direct) |
| CA (1) | CA1144663A (Direct) |
| DE (1) | DE2924569C2 (Direct) |
| FR (1) | FR2459554A1 (Direct) |
| GB (1) | GB2057758B (Direct) |
| IL (1) | IL60322A (Direct) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4514748A (en) * | 1983-11-21 | 1985-04-30 | At&T Bell Laboratories | Germanium p-i-n photodetector on silicon substrate |
| DE3815615A1 (de) * | 1988-05-07 | 1989-11-16 | Bosch Gmbh Robert | Verfahren zur herstellung einer hochsperrenden leistungsdiode |
| US5621238A (en) * | 1994-02-25 | 1997-04-15 | The United States Of America As Represented By The Secretary Of The Air Force | Narrow band semiconductor detector |
| US7238597B2 (en) * | 2002-09-27 | 2007-07-03 | Brontek Delta Corporation | Boron ion delivery system |
| US8178430B2 (en) | 2009-04-08 | 2012-05-15 | International Business Machines Corporation | N-type carrier enhancement in semiconductors |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2155773A1 (en) * | 1971-10-04 | 1973-05-25 | Radiotechnique Compelec | Semiconductor radioactivity detector - with medical application as intravenous probe |
-
1979
- 1979-06-19 DE DE2924569A patent/DE2924569C2/de not_active Expired
-
1980
- 1980-06-05 GB GB8018484A patent/GB2057758B/en not_active Expired
- 1980-06-16 IL IL60322A patent/IL60322A/xx unknown
- 1980-06-17 US US06/160,232 patent/US4415916A/en not_active Expired - Lifetime
- 1980-06-18 JP JP8154380A patent/JPS568886A/ja active Pending
- 1980-06-18 FR FR8013520A patent/FR2459554A1/fr active Granted
- 1980-06-18 CA CA000354273A patent/CA1144663A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| IL60322A0 (en) | 1980-09-16 |
| FR2459554B1 (Direct) | 1984-10-26 |
| IL60322A (en) | 1983-06-15 |
| CA1144663A (en) | 1983-04-12 |
| GB2057758B (en) | 1983-12-14 |
| US4415916A (en) | 1983-11-15 |
| FR2459554A1 (fr) | 1981-01-09 |
| GB2057758A (en) | 1981-04-01 |
| JPS568886A (en) | 1981-01-29 |
| DE2924569A1 (de) | 1981-01-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OAP | Request for examination filed | ||
| OD | Request for examination | ||
| 8125 | Change of the main classification |
Ipc: H01L 31/10 |
|
| 8126 | Change of the secondary classification |
Free format text: H01L 31/18 G01T 1/24 |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: FORSCHUNGSZENTRUM JUELICH GMBH, 5170 JUELICH, DE |