DE2754974C2 - - Google Patents

Info

Publication number
DE2754974C2
DE2754974C2 DE19772754974 DE2754974A DE2754974C2 DE 2754974 C2 DE2754974 C2 DE 2754974C2 DE 19772754974 DE19772754974 DE 19772754974 DE 2754974 A DE2754974 A DE 2754974A DE 2754974 C2 DE2754974 C2 DE 2754974C2
Authority
DE
Germany
Prior art keywords
lines
microprocessor
cooking
output
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE19772754974
Other languages
German (de)
English (en)
Other versions
DE2754974A1 (de
Inventor
Michael G. Van Sugarland Tex. Us Bavel
Alan J. Plano Tex. Us Shannon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/749,488 external-priority patent/US4158432A/en
Priority claimed from US05/749,487 external-priority patent/US4158431A/en
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE2754974A1 publication Critical patent/DE2754974A1/de
Application granted granted Critical
Publication of DE2754974C2 publication Critical patent/DE2754974C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/647—Aspects related to microwave heating combined with other heating techniques
    • H05B6/6482—Aspects related to microwave heating combined with other heating techniques combined with radiant heating, e.g. infrared heating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0428—Safety, monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/10—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using selector switches
    • G05B19/102—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using selector switches for input of programme steps, i.e. setting up sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/6432—Aspects relating to testing or detecting leakage in a microwave heating apparatus
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/6447—Method of operation or details of the microwave heating apparatus related to the use of detectors or sensors
    • H05B6/645—Method of operation or details of the microwave heating apparatus related to the use of detectors or sensors using temperature sensors
    • H05B6/6452—Method of operation or details of the microwave heating apparatus related to the use of detectors or sensors using temperature sensors the sensors being in contact with the heated product
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/23—Pc programming
    • G05B2219/23383—Lightpen
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24069—Diagnostic

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Electric Ovens (AREA)
  • Control Or Security For Electrophotography (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE19772754974 1976-12-10 1977-12-09 Mikroprozessorgesteuertes elektrisches geraet Granted DE2754974A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US05/749,488 US4158432A (en) 1976-12-10 1976-12-10 Control of self-test feature for appliances or electronic equipment operated by microprocessor
US05/749,487 US4158431A (en) 1976-12-10 1976-12-10 Self-test feature for appliances or electronic systems operated by microprocessor

Publications (2)

Publication Number Publication Date
DE2754974A1 DE2754974A1 (de) 1978-06-15
DE2754974C2 true DE2754974C2 (enrdf_load_stackoverflow) 1990-07-05

Family

ID=27115132

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19772754974 Granted DE2754974A1 (de) 1976-12-10 1977-12-09 Mikroprozessorgesteuertes elektrisches geraet

Country Status (2)

Country Link
JP (1) JPS5372544A (enrdf_load_stackoverflow)
DE (1) DE2754974A1 (enrdf_load_stackoverflow)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5164770A (en) * 1978-12-08 1992-11-17 Canon Kabushiki Kaisha Image forming apparatus having feeding error detection and feeding error display
JPS5590963A (en) * 1978-12-29 1980-07-10 Canon Inc Image former
NL7812150A (nl) * 1978-12-14 1980-06-17 Philips Nv Bestralingsinrichting met beveiligde programmeer- inrichting.
FR2444742A1 (fr) * 1978-12-18 1980-07-18 Amiens Const Elect Mec Perfectionnement aux machines a laver automatiques
JPS5645696A (en) * 1979-09-20 1981-04-25 Sanyo Electric Co Washing machine
JPS56116147A (en) * 1980-02-20 1981-09-11 Hitachi Ltd Digital semiconductor integrated circuit and digital control system using it
US4441804A (en) * 1980-05-12 1984-04-10 Minolta Camera Kabushiki Kaisha Electrostatic copying apparatus including a switch checking system
US4633067A (en) * 1984-08-22 1986-12-30 General Electric Company Touch control arrangement for an electrical appliance
JPS61164554U (enrdf_load_stackoverflow) * 1985-03-31 1986-10-13
JPS61251870A (ja) * 1985-12-28 1986-11-08 Canon Inc 像形成装置
JPS6258236A (ja) * 1986-05-10 1987-03-13 Canon Inc 像形成装置
JPS63153555A (ja) * 1987-09-18 1988-06-25 Konica Corp 電子写真装置
JP2601861B2 (ja) * 1988-03-15 1997-04-16 株式会社テック 電気掃除機
DE4042588C2 (de) * 1989-12-21 1995-11-16 Samsung Electronics Co Ltd Anzeige- und Diagnoseverfahren für einen Fernseher
JPH04155507A (ja) * 1990-10-19 1992-05-28 Nippon Kentetsu Co Ltd 洗濯機等の家電機器の制御装置の検査方法
JP2550793B2 (ja) * 1991-01-07 1996-11-06 ダイキン工業株式会社 空気清浄機
EP2604932B1 (de) * 2011-12-12 2017-09-13 BSH Hausgeräte GmbH Kochfeld und Verfahren zum Betreiben des Kochfeldes

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3901273A (en) * 1973-04-09 1975-08-26 Leesona Corp Fluid control system with on-line diagnosis means isolating malfunctions
US3940744A (en) * 1973-12-17 1976-02-24 Xerox Corporation Self contained program loading apparatus
DE2635463A1 (de) * 1976-08-05 1978-02-09 Heliowatt Werke Verfahren zum pruefen elektronischer anzeigen

Also Published As

Publication number Publication date
JPS6127779B2 (enrdf_load_stackoverflow) 1986-06-27
JPS5372544A (en) 1978-06-28
DE2754974A1 (de) 1978-06-15

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8128 New person/name/address of the agent

Representative=s name: PRINZ, E., DIPL.-ING. LEISER, G., DIPL.-ING., PAT.

D2 Grant after examination
8363 Opposition against the patent