DE2714397A1 - Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung - Google Patents

Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung

Info

Publication number
DE2714397A1
DE2714397A1 DE19772714397 DE2714397A DE2714397A1 DE 2714397 A1 DE2714397 A1 DE 2714397A1 DE 19772714397 DE19772714397 DE 19772714397 DE 2714397 A DE2714397 A DE 2714397A DE 2714397 A1 DE2714397 A1 DE 2714397A1
Authority
DE
Germany
Prior art keywords
radiation
film
rays
infrared radiation
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19772714397
Other languages
German (de)
English (en)
Inventor
Jon Francis Pugh
Paul Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Industrial Nucleonics Corp
Original Assignee
Industrial Nucleonics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Nucleonics Corp filed Critical Industrial Nucleonics Corp
Publication of DE2714397A1 publication Critical patent/DE2714397A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE19772714397 1976-04-05 1977-03-31 Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung Withdrawn DE2714397A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/673,534 US4027161A (en) 1976-04-05 1976-04-05 Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation

Publications (1)

Publication Number Publication Date
DE2714397A1 true DE2714397A1 (de) 1977-10-13

Family

ID=24703045

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19772714397 Withdrawn DE2714397A1 (de) 1976-04-05 1977-03-31 Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung

Country Status (7)

Country Link
US (1) US4027161A (OSRAM)
CA (1) CA1080504A (OSRAM)
DE (1) DE2714397A1 (OSRAM)
FR (1) FR2347677A1 (OSRAM)
GB (1) GB1573263A (OSRAM)
IT (1) IT1076132B (OSRAM)
SE (2) SE439376B (OSRAM)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3149709A1 (de) * 1980-12-17 1982-06-24 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Infrarot-dickenmessvorrichtung
FR2510259A1 (fr) * 1981-07-27 1983-01-28 Ppg Industries Inc Procede et dispositif pour reduire le temps de reponse des appareils au cours du controle de teneur en humidite dans des feuilles de matiere plastique espacees en mouvement
DE3230442A1 (de) * 1981-08-18 1983-03-10 Topwave Instruments OY, 00380 Helsinki Verfahren zur messung der eigenschaften einer kunststoff-folie mittels infrarotstrahlung
WO2016139179A3 (de) * 2015-03-02 2016-10-27 BST ProControl GmbH Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2016678B (en) * 1978-03-10 1982-09-15 Asahi Dow Ltd Infrared multilayer film thickness measuring method and apparatus
JPS5535214A (en) * 1978-09-04 1980-03-12 Asahi Chem Ind Co Ltd Method and device for film-thickness measurement making use of infrared-ray interference
GB2046432B (en) * 1979-04-09 1983-05-11 Infrared Eng Ltd Apparatus for determining the thickness moisture content or other parameter of a film or coating
GB2077426B (en) 1980-05-30 1983-12-14 Fuji Electric Co Ltd Apparatus for measuring film thickness
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
JPS62232506A (ja) * 1986-04-01 1987-10-13 Chugai Ro Kogyo Kaisha Ltd 表面層厚測定装置
US4733078A (en) * 1986-08-25 1988-03-22 Accuray Corporation Measurement of moisture-stratified sheet material
US4823008A (en) * 1987-11-05 1989-04-18 Process Automation Business, Inc. Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper
CA2038704C (en) * 1990-04-26 1996-01-30 Ryuji Chiba Infrared ray moisture meter
US5506407A (en) * 1993-12-21 1996-04-09 Minnesota Mining & Manufacturing Company High resolution high speed film measuring apparatus and method
US5733028A (en) * 1996-01-23 1998-03-31 Advanced Optical Technologies, Llc. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US5773819A (en) * 1996-01-23 1998-06-30 Advanced Optical Technologies, Llc. Single element light detector
US6043873A (en) 1997-01-10 2000-03-28 Advanced Optical Technologies, Llc Position tracking system
US5705804A (en) * 1996-01-23 1998-01-06 Science Applications International Corporation Quadrant light detector
US6238077B1 (en) 1996-01-23 2001-05-29 Advanced Optical Technologies, L.L.C. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102006057727A1 (de) * 2006-12-07 2008-06-12 Brückner Maschinenbau GmbH Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung
HU231454B1 (hu) * 2020-01-13 2023-12-28 Lyme Diagnostics Kft. Mikroszkóp biológiai anyagok nagyfelbontású és specifikus vizsgálatára, és vizsgálati eljárás

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2054084B2 (de) * 1969-11-05 1973-03-08 Brun Sensor Systems Ine , Columbus, Ohio (V St A ) Zweistrahl-infrarotmessung im reflexions- oder durchstrahlungsverfahren
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2821103A (en) * 1952-10-30 1958-01-28 Centre Nat Rech Scient Micro-photometry
US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3476482A (en) * 1967-09-27 1969-11-04 Conrac Corp Opacimeter for comparing light from different areas of sample sheet
GB1382081A (en) * 1972-03-14 1975-01-29 Ici Ltd Transmission spectra
US3863071A (en) * 1972-06-08 1975-01-28 Infra Systems Inc Infrared measuring system with channel spectra negation
US3870884A (en) * 1973-08-24 1975-03-11 Infra Systems Inc Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2054084B2 (de) * 1969-11-05 1973-03-08 Brun Sensor Systems Ine , Columbus, Ohio (V St A ) Zweistrahl-infrarotmessung im reflexions- oder durchstrahlungsverfahren
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3149709A1 (de) * 1980-12-17 1982-06-24 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Infrarot-dickenmessvorrichtung
FR2510259A1 (fr) * 1981-07-27 1983-01-28 Ppg Industries Inc Procede et dispositif pour reduire le temps de reponse des appareils au cours du controle de teneur en humidite dans des feuilles de matiere plastique espacees en mouvement
DE3230442A1 (de) * 1981-08-18 1983-03-10 Topwave Instruments OY, 00380 Helsinki Verfahren zur messung der eigenschaften einer kunststoff-folie mittels infrarotstrahlung
WO2016139179A3 (de) * 2015-03-02 2016-10-27 BST ProControl GmbH Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut

Also Published As

Publication number Publication date
IT1076132B (it) 1985-04-24
GB1573263A (en) 1980-08-20
FR2347677B1 (OSRAM) 1982-01-29
SE8104527L (sv) 1981-07-24
CA1080504A (en) 1980-07-01
SE7703750L (sv) 1977-10-06
SE439376B (sv) 1985-06-10
US4027161A (en) 1977-05-31
FR2347677A1 (fr) 1977-11-04
SE447164B (sv) 1986-10-27

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8128 New person/name/address of the agent

Representative=s name: HANSMANN, A., DIPL.-WIRTSCH.-ING., PAT.-ANW., 8000

8125 Change of the main classification

Ipc: G01B 11/06

8130 Withdrawal