SE7703750L - Forfarande och apparat for metning av en egenskap hos en film - Google Patents

Forfarande och apparat for metning av en egenskap hos en film

Info

Publication number
SE7703750L
SE7703750L SE7703750A SE7703750A SE7703750L SE 7703750 L SE7703750 L SE 7703750L SE 7703750 A SE7703750 A SE 7703750A SE 7703750 A SE7703750 A SE 7703750A SE 7703750 L SE7703750 L SE 7703750L
Authority
SE
Sweden
Prior art keywords
radiations
film
multiplicity
broad spectrum
detected
Prior art date
Application number
SE7703750A
Other languages
Unknown language ( )
English (en)
Other versions
SE439376B (sv
Inventor
P Williams
J F Pugh
Original Assignee
Industrial Nucleonics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Nucleonics Corp filed Critical Industrial Nucleonics Corp
Publication of SE7703750L publication Critical patent/SE7703750L/sv
Publication of SE439376B publication Critical patent/SE439376B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7703750A 1976-04-05 1977-03-31 Forfarande och anordning for metning av en egenskap hos en tunn film SE439376B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/673,534 US4027161A (en) 1976-04-05 1976-04-05 Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation

Publications (2)

Publication Number Publication Date
SE7703750L true SE7703750L (sv) 1977-10-06
SE439376B SE439376B (sv) 1985-06-10

Family

ID=24703045

Family Applications (2)

Application Number Title Priority Date Filing Date
SE7703750A SE439376B (sv) 1976-04-05 1977-03-31 Forfarande och anordning for metning av en egenskap hos en tunn film
SE8104527A SE447164B (sv) 1976-04-05 1981-07-24 Anordning for metning av en egenskap hos en tunn film

Family Applications After (1)

Application Number Title Priority Date Filing Date
SE8104527A SE447164B (sv) 1976-04-05 1981-07-24 Anordning for metning av en egenskap hos en tunn film

Country Status (7)

Country Link
US (1) US4027161A (sv)
CA (1) CA1080504A (sv)
DE (1) DE2714397A1 (sv)
FR (1) FR2347677A1 (sv)
GB (1) GB1573263A (sv)
IT (1) IT1076132B (sv)
SE (2) SE439376B (sv)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2016678B (en) * 1978-03-10 1982-09-15 Asahi Dow Ltd Infrared multilayer film thickness measuring method and apparatus
JPS5535214A (en) * 1978-09-04 1980-03-12 Asahi Chem Ind Co Ltd Method and device for film-thickness measurement making use of infrared-ray interference
GB2046432B (en) * 1979-04-09 1983-05-11 Infrared Eng Ltd Apparatus for determining the thickness moisture content or other parameter of a film or coating
JPS57101709A (en) * 1980-12-17 1982-06-24 Fuji Electric Co Ltd Film thickness gauge with infrared ray
US4422766A (en) * 1981-07-27 1983-12-27 Ppg Industries, Inc. Method of and device for reducing apparatus response time during the testing for moisture content in moving spaced plastic sheets
FI69370C (fi) * 1981-08-18 1986-01-10 Topwave Instr Oy Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
JPS62232506A (ja) * 1986-04-01 1987-10-13 Chugai Ro Kogyo Kaisha Ltd 表面層厚測定装置
US4733078A (en) * 1986-08-25 1988-03-22 Accuray Corporation Measurement of moisture-stratified sheet material
US4823008A (en) * 1987-11-05 1989-04-18 Process Automation Business, Inc. Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper
CA2038704C (en) * 1990-04-26 1996-01-30 Ryuji Chiba Infrared ray moisture meter
US5506407A (en) * 1993-12-21 1996-04-09 Minnesota Mining & Manufacturing Company High resolution high speed film measuring apparatus and method
US5773819A (en) * 1996-01-23 1998-06-30 Advanced Optical Technologies, Llc. Single element light detector
US6043873A (en) * 1997-01-10 2000-03-28 Advanced Optical Technologies, Llc Position tracking system
US5733028A (en) * 1996-01-23 1998-03-31 Advanced Optical Technologies, Llc. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US5705804A (en) * 1996-01-23 1998-01-06 Science Applications International Corporation Quadrant light detector
US6238077B1 (en) 1996-01-23 2001-05-29 Advanced Optical Technologies, L.L.C. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102006057727A1 (de) * 2006-12-07 2008-06-12 Brückner Maschinenbau GmbH Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung
DE102015102997A1 (de) * 2015-03-02 2016-09-08 BST ProControl GmbH Verfahren und Vorrichtung zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2821103A (en) * 1952-10-30 1958-01-28 Centre Nat Rech Scient Micro-photometry
US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3476482A (en) * 1967-09-27 1969-11-04 Conrac Corp Opacimeter for comparing light from different areas of sample sheet
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
GB1382081A (en) * 1972-03-14 1975-01-29 Ici Ltd Transmission spectra
US3863071A (en) * 1972-06-08 1975-01-28 Infra Systems Inc Infrared measuring system with channel spectra negation
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US3870884A (en) * 1973-08-24 1975-03-11 Infra Systems Inc Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements

Also Published As

Publication number Publication date
SE439376B (sv) 1985-06-10
FR2347677A1 (fr) 1977-11-04
GB1573263A (en) 1980-08-20
DE2714397A1 (de) 1977-10-13
US4027161A (en) 1977-05-31
SE447164B (sv) 1986-10-27
FR2347677B1 (sv) 1982-01-29
CA1080504A (en) 1980-07-01
SE8104527L (sv) 1981-07-24
IT1076132B (it) 1985-04-24

Similar Documents

Publication Publication Date Title
SE7703750L (sv) Forfarande och apparat for metning av en egenskap hos en film
JPS51122483A (en) Scanner type inspection device
GB1348978A (en) Infrared technique for measuring a parameter eg thickness of a thin film
US3854044A (en) A method and apparatus for measuring a transmission spectrum of a film
SE7709627L (sv) Forfarande for genomforande av diagnostiska analyser jemte en sjelvberande patron avsedd for genomforande av detta forfarande
GB1316075A (en) Methods and apparatus for testing for the presence or absence of a plurality of substances in a sample
JPS6120805B2 (sv)
SE7604502L (sv) Optisk branddetektor
US4487477A (en) Optical beam splitter
US2605671A (en) Spectrophotometer
US3594087A (en) Optical densitometer with retroreflective means
US3560098A (en) Double-beam photometer including structure to eliminate re-radiation from the output signals
Birkebak et al. Directional spectra and total reflectance of lunar material
JPS55154402A (en) Shape measuring apparatus
IT1085017B (it) Analizzatore di gas a raggi infrarossi,non dispersivo,operante secondo il metodo a due raggi,con camere di ricezionea doppio strato nel percorso dei raggi di misurazione e di confronto
JPS53107865A (en) Detector of minute undulations
GB1387424A (en) Measuring instruments
JPS53125086A (en) Optical inspection method by dichromatic light
JPH0915148A (ja) 非破壊糖度測定装置
SU911143A1 (ru) Интерферометр дл контрол формы плоских шлифованных поверхностей изделий
JPS5337455A (en) Distance measuring device
SU549680A1 (ru) Интерферометр дл инфракрасной области спекра
JPS5558439A (en) Optical system for atomic light absorption analyzer
JPS52126219A (en) Film pinhole detector
JPH02152250A (ja) エピタキシャル成長層の評価方法

Legal Events

Date Code Title Description
NUG Patent has lapsed

Ref document number: 7703750-5

Effective date: 19880822

Format of ref document f/p: F