SE8104527L - Metforfarande och -anordning - Google Patents

Metforfarande och -anordning

Info

Publication number
SE8104527L
SE8104527L SE8104527A SE8104527A SE8104527L SE 8104527 L SE8104527 L SE 8104527L SE 8104527 A SE8104527 A SE 8104527A SE 8104527 A SE8104527 A SE 8104527A SE 8104527 L SE8104527 L SE 8104527L
Authority
SE
Sweden
Prior art keywords
radiation
radiations
strip
film
sheet
Prior art date
Application number
SE8104527A
Other languages
English (en)
Other versions
SE447164B (sv
Inventor
P Williams
J F Pugh
Original Assignee
Accuray Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Accuray Corp filed Critical Accuray Corp
Publication of SE8104527L publication Critical patent/SE8104527L/sv
Publication of SE447164B publication Critical patent/SE447164B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Claims (1)

Patentkrav organ for detektering av en andel ay stralningarna, som bar lamnat det ark- eller bandformiga materialet och dels organ fOr Astadkommande av ett gensvar, som Or kannetecknande for ark- eller bandegenskapen sAsom en funktion av den detekterade strAlningen. (21)Ans nr 8104527-0 Rotel (51)Klass G 01 N 21/ G 01 N 21/86 (74)0mbud Carminger L
1. Anordning for matning av en egenskap hoe ett ark- eller bandformigt material, kannetecknad av dels en stralnings- - kglla for alstrande ay infrarlid straining, som har en vaglangd som Or utsatt for absoroption inuti det ark- eller bandformiga materialet, dels organ Rix-, att rikta stralar av stralningen fran ett flertal punk-ter mot en yte hoe det ark- eller bandformiga materialet med infallsvinklar fordelade learn ett brett spektrum av infallsvinklar, dels organ, som ligger i vagen for den straining som lamnar det ark- eller bandformiga materialet och tjanar till att reflektera eller Aterrikta stralningen mot en yta hos det ark- eller bandformiga materialet, dels att de riktande och Aterriktande organen innefattar reflekterande ytelement, som bildar en omslutande konfiguration, som vasentligen avgransar ett ytomrade ay det ark- eller bandformiga materialet, dels en primgr reflektor, som Or belagen mutt den omslutande konfigurationen, dels organ fOr att rikta en primar strale eller ett primart stralknippe av stralningen fran kgllan mot den primgra reflektorn, sA att de reflekterande ytelementen i de stralriktande punkterna belysas av infrariid straining Illirkterad frOmprimgra reflektorn, dels ett
SE8104527A 1976-04-05 1981-07-24 Anordning for metning av en egenskap hos en tunn film SE447164B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/673,534 US4027161A (en) 1976-04-05 1976-04-05 Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation

Publications (2)

Publication Number Publication Date
SE8104527L true SE8104527L (sv) 1981-07-24
SE447164B SE447164B (sv) 1986-10-27

Family

ID=24703045

Family Applications (2)

Application Number Title Priority Date Filing Date
SE7703750A SE439376B (sv) 1976-04-05 1977-03-31 Forfarande och anordning for metning av en egenskap hos en tunn film
SE8104527A SE447164B (sv) 1976-04-05 1981-07-24 Anordning for metning av en egenskap hos en tunn film

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SE7703750A SE439376B (sv) 1976-04-05 1977-03-31 Forfarande och anordning for metning av en egenskap hos en tunn film

Country Status (7)

Country Link
US (1) US4027161A (sv)
CA (1) CA1080504A (sv)
DE (1) DE2714397A1 (sv)
FR (1) FR2347677A1 (sv)
GB (1) GB1573263A (sv)
IT (1) IT1076132B (sv)
SE (2) SE439376B (sv)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2016678B (en) * 1978-03-10 1982-09-15 Asahi Dow Ltd Infrared multilayer film thickness measuring method and apparatus
JPS5535214A (en) * 1978-09-04 1980-03-12 Asahi Chem Ind Co Ltd Method and device for film-thickness measurement making use of infrared-ray interference
GB2046432B (en) * 1979-04-09 1983-05-11 Infrared Eng Ltd Apparatus for determining the thickness moisture content or other parameter of a film or coating
JPS57101709A (en) * 1980-12-17 1982-06-24 Fuji Electric Co Ltd Film thickness gauge with infrared ray
US4422766A (en) * 1981-07-27 1983-12-27 Ppg Industries, Inc. Method of and device for reducing apparatus response time during the testing for moisture content in moving spaced plastic sheets
FI69370C (fi) * 1981-08-18 1986-01-10 Topwave Instr Oy Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
JPS62232506A (ja) * 1986-04-01 1987-10-13 Chugai Ro Kogyo Kaisha Ltd 表面層厚測定装置
US4733078A (en) * 1986-08-25 1988-03-22 Accuray Corporation Measurement of moisture-stratified sheet material
US4823008A (en) * 1987-11-05 1989-04-18 Process Automation Business, Inc. Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper
CA2038704C (en) * 1990-04-26 1996-01-30 Ryuji Chiba Infrared ray moisture meter
US5506407A (en) * 1993-12-21 1996-04-09 Minnesota Mining & Manufacturing Company High resolution high speed film measuring apparatus and method
US5773819A (en) * 1996-01-23 1998-06-30 Advanced Optical Technologies, Llc. Single element light detector
US6043873A (en) * 1997-01-10 2000-03-28 Advanced Optical Technologies, Llc Position tracking system
US5733028A (en) * 1996-01-23 1998-03-31 Advanced Optical Technologies, Llc. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US5705804A (en) * 1996-01-23 1998-01-06 Science Applications International Corporation Quadrant light detector
US6238077B1 (en) 1996-01-23 2001-05-29 Advanced Optical Technologies, L.L.C. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102006057727A1 (de) * 2006-12-07 2008-06-12 Brückner Maschinenbau GmbH Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung
DE102015102997A1 (de) * 2015-03-02 2016-09-08 BST ProControl GmbH Verfahren und Vorrichtung zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2821103A (en) * 1952-10-30 1958-01-28 Centre Nat Rech Scient Micro-photometry
US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3476482A (en) * 1967-09-27 1969-11-04 Conrac Corp Opacimeter for comparing light from different areas of sample sheet
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
GB1382081A (en) * 1972-03-14 1975-01-29 Ici Ltd Transmission spectra
US3863071A (en) * 1972-06-08 1975-01-28 Infra Systems Inc Infrared measuring system with channel spectra negation
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US3870884A (en) * 1973-08-24 1975-03-11 Infra Systems Inc Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements

Also Published As

Publication number Publication date
SE439376B (sv) 1985-06-10
FR2347677A1 (fr) 1977-11-04
GB1573263A (en) 1980-08-20
DE2714397A1 (de) 1977-10-13
US4027161A (en) 1977-05-31
SE447164B (sv) 1986-10-27
FR2347677B1 (sv) 1982-01-29
CA1080504A (en) 1980-07-01
SE7703750L (sv) 1977-10-06
IT1076132B (it) 1985-04-24

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