FR2347677A1 - Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge - Google Patents
Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarougeInfo
- Publication number
- FR2347677A1 FR2347677A1 FR7710321A FR7710321A FR2347677A1 FR 2347677 A1 FR2347677 A1 FR 2347677A1 FR 7710321 A FR7710321 A FR 7710321A FR 7710321 A FR7710321 A FR 7710321A FR 2347677 A1 FR2347677 A1 FR 2347677A1
- Authority
- FR
- France
- Prior art keywords
- measuring
- film
- infrared radiation
- infrared
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/673,534 US4027161A (en) | 1976-04-05 | 1976-04-05 | Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2347677A1 true FR2347677A1 (fr) | 1977-11-04 |
| FR2347677B1 FR2347677B1 (OSRAM) | 1982-01-29 |
Family
ID=24703045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7710321A Granted FR2347677A1 (fr) | 1976-04-05 | 1977-04-05 | Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4027161A (OSRAM) |
| CA (1) | CA1080504A (OSRAM) |
| DE (1) | DE2714397A1 (OSRAM) |
| FR (1) | FR2347677A1 (OSRAM) |
| GB (1) | GB1573263A (OSRAM) |
| IT (1) | IT1076132B (OSRAM) |
| SE (2) | SE439376B (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2419507A1 (fr) * | 1978-03-10 | 1979-10-05 | Asahi Dow Ltd | Procede et installations pour mesurer les epaisseurs des couches d'une pellicule a plusieurs couches |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5535214A (en) * | 1978-09-04 | 1980-03-12 | Asahi Chem Ind Co Ltd | Method and device for film-thickness measurement making use of infrared-ray interference |
| GB2046432B (en) * | 1979-04-09 | 1983-05-11 | Infrared Eng Ltd | Apparatus for determining the thickness moisture content or other parameter of a film or coating |
| JPS57101709A (en) * | 1980-12-17 | 1982-06-24 | Fuji Electric Co Ltd | Film thickness gauge with infrared ray |
| GB2077426B (en) | 1980-05-30 | 1983-12-14 | Fuji Electric Co Ltd | Apparatus for measuring film thickness |
| US4422766A (en) * | 1981-07-27 | 1983-12-27 | Ppg Industries, Inc. | Method of and device for reducing apparatus response time during the testing for moisture content in moving spaced plastic sheets |
| FI69370C (fi) * | 1981-08-18 | 1986-01-10 | Topwave Instr Oy | Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning |
| US4631408A (en) * | 1984-09-24 | 1986-12-23 | Kollmorgen Technologies Corporation | Method of simultaneously determining gauge and orientation of polymer films |
| JPS62232506A (ja) * | 1986-04-01 | 1987-10-13 | Chugai Ro Kogyo Kaisha Ltd | 表面層厚測定装置 |
| US4733078A (en) * | 1986-08-25 | 1988-03-22 | Accuray Corporation | Measurement of moisture-stratified sheet material |
| US4823008A (en) * | 1987-11-05 | 1989-04-18 | Process Automation Business, Inc. | Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper |
| CA2038704C (en) * | 1990-04-26 | 1996-01-30 | Ryuji Chiba | Infrared ray moisture meter |
| US5506407A (en) * | 1993-12-21 | 1996-04-09 | Minnesota Mining & Manufacturing Company | High resolution high speed film measuring apparatus and method |
| US5733028A (en) * | 1996-01-23 | 1998-03-31 | Advanced Optical Technologies, Llc. | Apparatus for projecting electromagnetic radiation with a tailored intensity distribution |
| US5773819A (en) * | 1996-01-23 | 1998-06-30 | Advanced Optical Technologies, Llc. | Single element light detector |
| US6043873A (en) | 1997-01-10 | 2000-03-28 | Advanced Optical Technologies, Llc | Position tracking system |
| US5705804A (en) * | 1996-01-23 | 1998-01-06 | Science Applications International Corporation | Quadrant light detector |
| US6238077B1 (en) | 1996-01-23 | 2001-05-29 | Advanced Optical Technologies, L.L.C. | Apparatus for projecting electromagnetic radiation with a tailored intensity distribution |
| US6960769B2 (en) * | 2002-10-03 | 2005-11-01 | Abb Inc. | Infrared measuring apparatus and method for on-line application in manufacturing processes |
| DE102006057727A1 (de) * | 2006-12-07 | 2008-06-12 | Brückner Maschinenbau GmbH | Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung |
| DE102015102997A1 (de) * | 2015-03-02 | 2016-09-08 | BST ProControl GmbH | Verfahren und Vorrichtung zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut |
| HU231454B1 (hu) * | 2020-01-13 | 2023-12-28 | Lyme Diagnostics Kft. | Mikroszkóp biológiai anyagok nagyfelbontású és specifikus vizsgálatára, és vizsgálati eljárás |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2821103A (en) * | 1952-10-30 | 1958-01-28 | Centre Nat Rech Scient | Micro-photometry |
| US3455637A (en) * | 1964-08-07 | 1969-07-15 | Giannini Controls Corp | Method and apparatus for measuring the opacity of sheet material |
| US3476482A (en) * | 1967-09-27 | 1969-11-04 | Conrac Corp | Opacimeter for comparing light from different areas of sample sheet |
| US3631526A (en) * | 1969-11-05 | 1971-12-28 | Brun Sensor Systems Inc | Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements |
| US3793524A (en) * | 1972-09-05 | 1974-02-19 | Measurex Corp | Apparatus for measuring a characteristic of sheet materials |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1382081A (en) * | 1972-03-14 | 1975-01-29 | Ici Ltd | Transmission spectra |
| US3863071A (en) * | 1972-06-08 | 1975-01-28 | Infra Systems Inc | Infrared measuring system with channel spectra negation |
| US3870884A (en) * | 1973-08-24 | 1975-03-11 | Infra Systems Inc | Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements |
-
1976
- 1976-04-05 US US05/673,534 patent/US4027161A/en not_active Expired - Lifetime
-
1977
- 1977-03-31 SE SE7703750A patent/SE439376B/xx not_active IP Right Cessation
- 1977-03-31 DE DE19772714397 patent/DE2714397A1/de not_active Withdrawn
- 1977-04-01 CA CA275,307A patent/CA1080504A/en not_active Expired
- 1977-04-05 IT IT22129/77A patent/IT1076132B/it active
- 1977-04-05 GB GB14433/77A patent/GB1573263A/en not_active Expired
- 1977-04-05 FR FR7710321A patent/FR2347677A1/fr active Granted
-
1981
- 1981-07-24 SE SE8104527A patent/SE447164B/sv not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2821103A (en) * | 1952-10-30 | 1958-01-28 | Centre Nat Rech Scient | Micro-photometry |
| US3455637A (en) * | 1964-08-07 | 1969-07-15 | Giannini Controls Corp | Method and apparatus for measuring the opacity of sheet material |
| US3476482A (en) * | 1967-09-27 | 1969-11-04 | Conrac Corp | Opacimeter for comparing light from different areas of sample sheet |
| US3631526A (en) * | 1969-11-05 | 1971-12-28 | Brun Sensor Systems Inc | Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements |
| US3793524A (en) * | 1972-09-05 | 1974-02-19 | Measurex Corp | Apparatus for measuring a characteristic of sheet materials |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2419507A1 (fr) * | 1978-03-10 | 1979-10-05 | Asahi Dow Ltd | Procede et installations pour mesurer les epaisseurs des couches d'une pellicule a plusieurs couches |
Also Published As
| Publication number | Publication date |
|---|---|
| IT1076132B (it) | 1985-04-24 |
| DE2714397A1 (de) | 1977-10-13 |
| GB1573263A (en) | 1980-08-20 |
| FR2347677B1 (OSRAM) | 1982-01-29 |
| SE8104527L (sv) | 1981-07-24 |
| CA1080504A (en) | 1980-07-01 |
| SE7703750L (sv) | 1977-10-06 |
| SE439376B (sv) | 1985-06-10 |
| US4027161A (en) | 1977-05-31 |
| SE447164B (sv) | 1986-10-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |