DE2450930A1 - Thermische wanderung metallreicher fluessiger draehte durch halbleitermaterialien - Google Patents

Thermische wanderung metallreicher fluessiger draehte durch halbleitermaterialien

Info

Publication number
DE2450930A1
DE2450930A1 DE19742450930 DE2450930A DE2450930A1 DE 2450930 A1 DE2450930 A1 DE 2450930A1 DE 19742450930 DE19742450930 DE 19742450930 DE 2450930 A DE2450930 A DE 2450930A DE 2450930 A1 DE2450930 A1 DE 2450930A1
Authority
DE
Germany
Prior art keywords
metal wire
wire
axis
thermal migration
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19742450930
Other languages
German (de)
English (en)
Inventor
Thomas Richard Anthony
Harvey Ellis Cline
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE2450930A1 publication Critical patent/DE2450930A1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/24Alloying of impurity materials, e.g. doping materials, electrode materials, with a semiconductor body
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
DE19742450930 1973-10-30 1974-10-25 Thermische wanderung metallreicher fluessiger draehte durch halbleitermaterialien Pending DE2450930A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US411018A US3899362A (en) 1973-10-30 1973-10-30 Thermomigration of metal-rich liquid wires through semiconductor materials

Publications (1)

Publication Number Publication Date
DE2450930A1 true DE2450930A1 (de) 1975-05-07

Family

ID=23627223

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19742450930 Pending DE2450930A1 (de) 1973-10-30 1974-10-25 Thermische wanderung metallreicher fluessiger draehte durch halbleitermaterialien

Country Status (7)

Country Link
US (1) US3899362A (enrdf_load_stackoverflow)
JP (1) JPS50100973A (enrdf_load_stackoverflow)
BR (1) BR7409058D0 (enrdf_load_stackoverflow)
DE (1) DE2450930A1 (enrdf_load_stackoverflow)
FR (1) FR2249439A1 (enrdf_load_stackoverflow)
GB (1) GB1492795A (enrdf_load_stackoverflow)
SE (1) SE392181B (enrdf_load_stackoverflow)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1524854A (en) * 1974-11-01 1978-09-13 Gen Electric Semiconductors
US4021269A (en) * 1975-11-26 1977-05-03 General Electric Company Post diffusion after temperature gradient zone melting
US4012236A (en) * 1975-12-31 1977-03-15 General Electric Company Uniform thermal migration utilizing noncentro-symmetric and secondary sample rotation
US3998662A (en) * 1975-12-31 1976-12-21 General Electric Company Migration of fine lines for bodies of semiconductor materials having a (100) planar orientation of a major surface
US4006040A (en) * 1975-12-31 1977-02-01 General Electric Company Semiconductor device manufacture
US3998661A (en) * 1975-12-31 1976-12-21 General Electric Company Uniform migration of an annular shaped molten zone through a solid body
US4040868A (en) * 1976-03-09 1977-08-09 General Electric Company Semiconductor device manufacture
US4076559A (en) * 1977-03-18 1978-02-28 General Electric Company Temperature gradient zone melting through an oxide layer
JPS5469071A (en) * 1977-11-14 1979-06-02 Hitachi Ltd Vapor deposition pre-processing method
JPS5494869A (en) * 1978-01-11 1979-07-26 Hitachi Ltd Production of semiconductor device
US4159213A (en) * 1978-09-13 1979-06-26 General Electric Company Straight, uniform thermalmigration of fine lines
US4159916A (en) * 1978-09-13 1979-07-03 General Electric Company Thermal migration of fine lined cross-hatched patterns
US4178192A (en) * 1978-09-13 1979-12-11 General Electric Company Promotion of surface film stability during initiation of thermal migration
US4180416A (en) * 1978-09-27 1979-12-25 International Business Machines Corporation Thermal migration-porous silicon technique for forming deep dielectric isolation
US4170491A (en) * 1978-12-07 1979-10-09 General Electric Company Near-surface thermal gradient enhancement with opaque coatings
US4190467A (en) * 1978-12-15 1980-02-26 Western Electric Co., Inc. Semiconductor device production
US4168991A (en) * 1978-12-22 1979-09-25 General Electric Company Method for making a deep diode magnetoresistor
US4466173A (en) * 1981-11-23 1984-08-21 General Electric Company Methods for fabricating vertical channel buried grid field controlled devices including field effect transistors and field controlled thyristors utilizing etch and refill techniques
US5049978A (en) * 1990-09-10 1991-09-17 General Electric Company Conductively enclosed hybrid integrated circuit assembly using a silicon substrate
US10327333B2 (en) 2012-03-01 2019-06-18 Koninklijke Philips N.V. Electronic circuit arrangement and method of manufacturing the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2813048A (en) * 1954-06-24 1957-11-12 Bell Telephone Labor Inc Temperature gradient zone-melting

Also Published As

Publication number Publication date
GB1492795A (en) 1977-11-23
US3899362A (en) 1975-08-12
SE392181B (sv) 1977-03-14
SE7413678L (enrdf_load_stackoverflow) 1975-05-02
BR7409058D0 (pt) 1975-08-26
JPS50100973A (enrdf_load_stackoverflow) 1975-08-11
FR2249439A1 (enrdf_load_stackoverflow) 1975-05-23

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