DE2430521A1 - Automatisches ellipsometer - Google Patents

Automatisches ellipsometer

Info

Publication number
DE2430521A1
DE2430521A1 DE2430521A DE2430521A DE2430521A1 DE 2430521 A1 DE2430521 A1 DE 2430521A1 DE 2430521 A DE2430521 A DE 2430521A DE 2430521 A DE2430521 A DE 2430521A DE 2430521 A1 DE2430521 A1 DE 2430521A1
Authority
DE
Germany
Prior art keywords
sample
polarizer
ellipsometer according
angle
incidence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE2430521A
Other languages
German (de)
English (en)
Inventor
Frederick Hayes Dill
Peter Swift Hauge
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2430521A1 publication Critical patent/DE2430521A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE2430521A 1973-06-25 1974-06-25 Automatisches ellipsometer Pending DE2430521A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US373540A US3880524A (en) 1973-06-25 1973-06-25 Automatic ellipsometer

Publications (1)

Publication Number Publication Date
DE2430521A1 true DE2430521A1 (de) 1975-01-23

Family

ID=23472818

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2430521A Pending DE2430521A1 (de) 1973-06-25 1974-06-25 Automatisches ellipsometer

Country Status (9)

Country Link
US (1) US3880524A (enExample)
JP (1) JPS5410473B2 (enExample)
CA (1) CA1010262A (enExample)
DE (1) DE2430521A1 (enExample)
FR (1) FR2234559B1 (enExample)
GB (1) GB1419738A (enExample)
IT (1) IT1007987B (enExample)
NL (1) NL7408560A (enExample)
SE (1) SE403658B (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0102470A1 (en) * 1982-08-09 1984-03-14 International Business Machines Corporation Ellipsometers
DE3305284A1 (de) * 1983-02-16 1984-08-23 Siemens AG, 1000 Berlin und 8000 München Beruehrungslose glanzmessung von oberflaechen und beschichtungen
US5991047A (en) * 1997-11-21 1999-11-23 Klockner Pentaplast Gmbh Method for continuously controlling the shrinkage of an amorphous film, and an arrangement herefor
DE19816974C1 (de) * 1998-04-17 2000-01-13 Nanophotonics Ag Verfahren und Vorrichtung zur automatischen relativen Justierung von Proben bezüglich eines Ellipsometers
US6091499A (en) * 1998-04-17 2000-07-18 Nanophotonics Ag Method and device for automatic relative adjustment of samples in relation to an ellipsometer
DE10023477A1 (de) * 2000-05-10 2001-11-29 Sentech Instr Gmbh Ellipsometer

Families Citing this family (64)

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US4053232A (en) * 1973-06-25 1977-10-11 International Business Machines Corporation Rotating-compensator ellipsometer
US3975238A (en) * 1975-06-26 1976-08-17 General Electric Company Method and apparatus for detecting molecules in solutions
US4065211A (en) * 1976-03-01 1977-12-27 The United States Of America As Represented By The Secretary Of The Army Precision X-ray diffraction system incorporating a laser aligner
US4201472A (en) * 1977-04-04 1980-05-06 Hitachi, Ltd. Apparatus for converting light signals into digital electrical signals
FR2491234B1 (fr) * 1980-09-29 1986-06-20 Labo Electronique Physique Dispositif electronique, pour l'analyse et le calcul des coefficients de fourier d'une fonction periodique, et ellipsometre comportant un tel dispositif
JPS58113706A (ja) * 1981-12-26 1983-07-06 Nippon Kogaku Kk <Nikon> 水平位置検出装置
JPS58182518A (ja) * 1982-04-12 1983-10-25 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション エリプソメ−タ
JPS60120235A (ja) * 1983-12-02 1985-06-27 Hitachi Ltd 斜入射反射分光装置
NO850157L (no) * 1984-01-16 1985-10-23 Barringer Research Ltd Fremgangsmaate og apparat til paavisning av hydrokarboner paa en vannflate.
US4672196A (en) * 1984-02-02 1987-06-09 Canino Lawrence S Method and apparatus for measuring properties of thin materials using polarized light
US4695162A (en) * 1984-05-24 1987-09-22 Victor Company Of Japan, Ltd. Film thickness measuring apparatus
US4653924A (en) * 1984-06-12 1987-03-31 Victor Company Of Japan, Ltd. Rotating analyzer type ellipsometer
JPS6125030A (ja) * 1984-07-13 1986-02-03 Hitachi Ltd 螢光偏光測定装置
US4668860A (en) * 1985-10-09 1987-05-26 Optical Coating Laboratory, Inc. Scattermeter using polarized light to distinguish between bulk and surface scatter
GB8701521D0 (en) * 1987-01-23 1993-12-01 British Aerospace Multi-parameter imaging polarimeter
US4967152A (en) * 1988-03-11 1990-10-30 Ultra-Probe Apparatus including a focused UV light source for non-contact measurement and alteration of electrical properties of conductors
US4906844A (en) * 1988-08-12 1990-03-06 Rockwell International Corporation Phase sensitive optical monitor for thin film deposition
US4957368A (en) * 1989-03-16 1990-09-18 Photoacoustic Technology, Inc. Apparatus and process for performing ellipsometric measurements of surfaces
US5494829A (en) * 1992-07-31 1996-02-27 Biostar, Inc. Devices and methods for detection of an analyte based upon light interference
US5305081A (en) * 1992-08-27 1994-04-19 Constar Plastics Inc. Bottle stress analysis system
US5314072A (en) * 1992-09-02 1994-05-24 Rutgers, The State University Sorting plastic bottles for recycling
US5521706A (en) * 1992-09-18 1996-05-28 J. A. Woollam Co. Inc. System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
US5757494A (en) * 1994-10-21 1998-05-26 J.A. Woollam Co. Inc. System and method for improving data acquisition capability in spectroscopic ellipsometers
US5504582A (en) * 1992-09-18 1996-04-02 J. A. Woollam Co. Inc. System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
US5956145A (en) * 1992-09-18 1999-09-21 J. A. Woollam Co. Inc. System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems
US5706212A (en) * 1996-03-20 1998-01-06 Board Of Regents Of University Of Nebraska Infrared ellipsometer/polarimeter system, method of calibration, and use thereof
US5657126A (en) * 1992-12-21 1997-08-12 The Board Of Regents Of The University Of Nebraska Ellipsometer
US5408322A (en) * 1993-04-26 1995-04-18 Materials Research Corporation Self aligning in-situ ellipsometer and method of using for process monitoring
EP0632256B1 (en) * 1993-06-28 1998-08-26 International Business Machines Corporation Micropolarimeter, microsensor system and method of characterizing thin films
US5883710A (en) * 1994-12-08 1999-03-16 Kla-Tencor Corporation Scanning system for inspecting anomalies on surfaces
US20040057044A1 (en) * 1994-12-08 2004-03-25 Mehrdad Nikoonahad Scanning system for inspecting anamolies on surfaces
EP0737856B1 (en) * 1995-04-14 2010-04-28 J.A. Woollam Co. Inc. A method of investigating samples by changing polarisation
US5625455A (en) * 1995-06-06 1997-04-29 Board Of Regents, The University Of Texas System Rotating analyzer ellipsometer and ellipsometry technique
US5706087A (en) * 1996-10-04 1998-01-06 The Board Of Regents Of The University Of Nebraska Electromagnetic beam directing means-sample analysis system stage, and method of use
US6414302B1 (en) 1998-08-11 2002-07-02 Interface Studies Inc High photon energy range reflected light characterization of solids
US6221790B1 (en) * 1998-11-19 2001-04-24 Taiwan Semiconductor Manufacturing Company Stable thin film oxide standard
US6184985B1 (en) 1998-12-11 2001-02-06 Filmetrics, Inc. Spectrometer configured to provide simultaneous multiple intensity spectra from independent light sources
US6204922B1 (en) 1998-12-11 2001-03-20 Filmetrics, Inc. Rapid and accurate thin film measurement of individual layers in a multi-layered or patterned sample
US6172756B1 (en) 1998-12-11 2001-01-09 Filmetrics, Inc. Rapid and accurate end point detection in a noisy environment
US6804003B1 (en) * 1999-02-09 2004-10-12 Kla-Tencor Corporation System for analyzing surface characteristics with self-calibrating capability
US6184984B1 (en) 1999-02-09 2001-02-06 Kla-Tencor Corporation System for measuring polarimetric spectrum and other properties of a sample
US6222199B1 (en) 1999-05-25 2001-04-24 Interface Studies Inc. Ultrathin layer measurement having a controlled ambient of light path
HK1043827A1 (zh) * 1999-08-06 2002-09-27 Thermo Biostar, Inc. 根据薄膜光衰减分析限定试样的装置
US6181421B1 (en) 1999-11-05 2001-01-30 Therma-Wave, Inc. Ellipsometer and polarimeter with zero-order plate compensator
US6621578B1 (en) 1999-11-26 2003-09-16 Olympus Optical Co, Ltd. Elliposometer, sample positioning mechanism, and polarization angular adjusting mechanism, used in the elliposometer
US6323947B1 (en) 1999-12-14 2001-11-27 Interface Studies Corporation Angle of incidence accuracy in ultrathin dielectric layer ellipsometry measurement
DE19963345A1 (de) * 1999-12-27 2001-07-05 Leica Microsystems Optische Messanordnung und Verfahren zur Neigungsmessung
DE10001810B4 (de) * 2000-01-18 2010-05-06 A. Krüss Optronic GmbH Polarimeter
US7872751B2 (en) * 2000-03-21 2011-01-18 J.A. Woollam Co., Inc. Fast sample height, AOI and POI alignment in mapping ellipsometer or the like
KR100397381B1 (ko) * 2001-12-27 2003-09-13 오혜근 고정입사면 타원해석기
US7136172B1 (en) * 2002-01-15 2006-11-14 J.A. Woollam Co., Inc. System and method for setting and compensating errors in AOI and POI of a beam of EM radiation
US20030184769A1 (en) * 2002-03-27 2003-10-02 Houge Erik Cho Patterned implant metrology
US7830512B2 (en) * 2008-03-14 2010-11-09 J.A. Woollam Co., Inc. System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters
WO2008051211A1 (en) 2006-10-23 2008-05-02 J.A. Woollam Co., Inc. System and method for setting and compensating errors in aoi and poi of a beam of em radiation
US8064055B2 (en) * 2008-02-14 2011-11-22 J.A. Woollam Co., Inc. System and method of aligning a sample
US8638437B2 (en) 2008-02-14 2014-01-28 J.A. Woollam Co., Inc. System and method of aligning a sample
US8983787B1 (en) 2008-12-12 2015-03-17 Martin M. Liphardt Method of evaluating data quality
KR101991217B1 (ko) * 2011-07-07 2019-06-19 케이엘에이-텐코 코포레이션 다중-분광기 각도 스펙트로스코픽 엘립소메트리
WO2013006637A1 (en) * 2011-07-07 2013-01-10 Kla-Tencor Corporation Multi-analyzer angle spectroscopic ellipsometry
US8994943B2 (en) * 2012-11-30 2015-03-31 Infineon Technologies Ag Selectivity by polarization
CN103134592B (zh) * 2013-01-31 2015-11-04 华中科技大学 一种透射式全穆勒矩阵光谱椭偏仪及其测量方法
EP3602065A4 (en) * 2017-03-20 2020-12-23 Spectral Platforms, Inc. SPECTROSCOPIC METHODS OF DETECTION AND CHARACTERIZATION OF MICROORGANISMS
CN112066896B (zh) * 2020-07-22 2021-12-10 北京量拓科技有限公司 曲面样品顶点定位方法、装置和椭偏仪
CN112066895A (zh) * 2020-07-22 2020-12-11 北京量拓科技有限公司 样品台及具有该样品台的椭偏仪

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3185024A (en) * 1962-03-08 1965-05-25 Donart Electronics Inc Method and apparatus for optically measuring the thickness of thin transparent films
US3703682A (en) * 1968-10-30 1972-11-21 Us Navy Long axis gradiometer
US3737235A (en) * 1972-02-10 1973-06-05 Cary Instruments Polarization interferometer with beam polarizing compensator

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0102470A1 (en) * 1982-08-09 1984-03-14 International Business Machines Corporation Ellipsometers
DE3305284A1 (de) * 1983-02-16 1984-08-23 Siemens AG, 1000 Berlin und 8000 München Beruehrungslose glanzmessung von oberflaechen und beschichtungen
US5991047A (en) * 1997-11-21 1999-11-23 Klockner Pentaplast Gmbh Method for continuously controlling the shrinkage of an amorphous film, and an arrangement herefor
DE19816974C1 (de) * 1998-04-17 2000-01-13 Nanophotonics Ag Verfahren und Vorrichtung zur automatischen relativen Justierung von Proben bezüglich eines Ellipsometers
US6091499A (en) * 1998-04-17 2000-07-18 Nanophotonics Ag Method and device for automatic relative adjustment of samples in relation to an ellipsometer
EP0950881A3 (de) * 1998-04-17 2000-08-16 NanoPhotonics AG Verfahren und Vorrichtung zur automatischen relativen Justierung von Proben bezüglich eines Ellipsometers
DE10023477A1 (de) * 2000-05-10 2001-11-29 Sentech Instr Gmbh Ellipsometer
DE10023477C2 (de) * 2000-05-10 2002-09-19 Sentech Instr Gmbh Ellipsometer
US6897955B2 (en) 2000-05-10 2005-05-24 Sentech Instruments Gmbh Ellipsometer

Also Published As

Publication number Publication date
NL7408560A (enExample) 1974-12-30
GB1419738A (en) 1975-12-31
FR2234559B1 (enExample) 1976-06-25
CA1010262A (en) 1977-05-17
IT1007987B (it) 1976-10-30
US3880524A (en) 1975-04-29
SE7407781L (enExample) 1974-12-27
JPS5023691A (enExample) 1975-03-13
FR2234559A1 (enExample) 1975-01-17
SE403658B (sv) 1978-08-28
JPS5410473B2 (enExample) 1979-05-07

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