DE69321816T2 - Methode und Instrument zur Messung eines Zellenabstandes eines doppelbrechenden Teiles - Google Patents

Methode und Instrument zur Messung eines Zellenabstandes eines doppelbrechenden Teiles

Info

Publication number
DE69321816T2
DE69321816T2 DE69321816T DE69321816T DE69321816T2 DE 69321816 T2 DE69321816 T2 DE 69321816T2 DE 69321816 T DE69321816 T DE 69321816T DE 69321816 T DE69321816 T DE 69321816T DE 69321816 T2 DE69321816 T2 DE 69321816T2
Authority
DE
Germany
Prior art keywords
instrument
measuring
cell spacing
birefringent part
birefringent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69321816T
Other languages
English (en)
Other versions
DE69321816D1 (de
Inventor
Ken Sumiyoshi
Yoriko Hatada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69321816D1 publication Critical patent/DE69321816D1/de
Publication of DE69321816T2 publication Critical patent/DE69321816T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
DE69321816T 1992-12-25 1993-12-22 Methode und Instrument zur Messung eines Zellenabstandes eines doppelbrechenden Teiles Expired - Lifetime DE69321816T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP34706292 1992-12-25
JP525293 1993-01-14

Publications (2)

Publication Number Publication Date
DE69321816D1 DE69321816D1 (de) 1998-12-03
DE69321816T2 true DE69321816T2 (de) 1999-06-02

Family

ID=26339167

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69321816T Expired - Lifetime DE69321816T2 (de) 1992-12-25 1993-12-22 Methode und Instrument zur Messung eines Zellenabstandes eines doppelbrechenden Teiles

Country Status (4)

Country Link
US (1) US5434671A (de)
EP (1) EP0603863B1 (de)
KR (1) KR100258172B1 (de)
DE (1) DE69321816T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532823A (en) * 1993-03-08 1996-07-02 Matsushita Electric Industrial Co., Ltd. Method of measuring optical characteristics of liquid crystal cells, measurement equipment therefor and method for manufacturing liquid crystal devices
US5903352A (en) * 1995-01-27 1999-05-11 Canon Kabushiki Kaisha Apparatus and method for measuring optical anisotropy
JP3379287B2 (ja) * 1995-06-26 2003-02-24 松下電器産業株式会社 複屈折層ギャップ厚測定方法
KR100612986B1 (ko) * 1998-06-05 2007-02-05 삼성전자주식회사 액정 표시 장치의 복굴절 위상차 및 셀 간격 측정 장치
TW418316B (en) * 2000-04-12 2001-01-11 Unipac Optoelectronics Corp Method of measuring thickness for the gap of the reflective type liquid crystal display cell
JP2002071319A (ja) * 2000-09-01 2002-03-08 Seiko Epson Corp セル厚検出方法、セル厚制御システム及び液晶装置の製造方法
JP2006171683A (ja) * 2004-11-18 2006-06-29 Olympus Corp センサーユニット及び画像表示装置
TWI273215B (en) * 2005-09-23 2007-02-11 Ind Tech Res Inst Object size measuring system and method thereof
RU2307999C1 (ru) * 2006-06-15 2007-10-10 Общество с ограниченной ответственностью "Радарные технологии-2Т" Способ и устройство для измерения зазоров (варианты)
JP5838466B2 (ja) 2011-03-11 2016-01-06 ナノフォトン株式会社 光学顕微鏡、及び分光測定方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4368645A (en) * 1980-09-26 1983-01-18 United Technologies Corporation Optical pressure sensor
JPH0197807A (ja) * 1987-10-09 1989-04-17 Matsushita Electric Ind Co Ltd 液晶表示パネルのギャップ長測定方法
US4973163A (en) * 1988-10-08 1990-11-27 Kanzaki Paper Manufacturing Co., Ltd. Method for measuring birefringence
JPH04307312A (ja) * 1991-04-03 1992-10-29 Otsuka Denshi Kk 液晶セルのギャップ厚測定方法

Also Published As

Publication number Publication date
DE69321816D1 (de) 1998-12-03
EP0603863B1 (de) 1998-10-28
KR940015610A (ko) 1994-07-21
EP0603863A1 (de) 1994-06-29
US5434671A (en) 1995-07-18
KR100258172B1 (ko) 2000-06-01

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