DE2332100A1 - Verfahren und anordnung zur analyse von photographisch gespeicherten roentgen-beugungsspektren - Google Patents
Verfahren und anordnung zur analyse von photographisch gespeicherten roentgen-beugungsspektrenInfo
- Publication number
- DE2332100A1 DE2332100A1 DE19732332100 DE2332100A DE2332100A1 DE 2332100 A1 DE2332100 A1 DE 2332100A1 DE 19732332100 DE19732332100 DE 19732332100 DE 2332100 A DE2332100 A DE 2332100A DE 2332100 A1 DE2332100 A1 DE 2332100A1
- Authority
- DE
- Germany
- Prior art keywords
- line
- block
- diffraction
- values
- determined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 58
- 238000001228 spectrum Methods 0.000 title claims description 37
- 238000004458 analytical method Methods 0.000 title claims description 14
- 238000012937 correction Methods 0.000 claims description 27
- 150000001875 compounds Chemical class 0.000 claims description 14
- 230000007423 decrease Effects 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 6
- 238000002441 X-ray diffraction Methods 0.000 claims description 5
- 230000000630 rising effect Effects 0.000 claims description 3
- 230000000052 comparative effect Effects 0.000 claims description 2
- 238000005070 sampling Methods 0.000 claims 1
- 230000003595 spectral effect Effects 0.000 description 15
- 239000000843 powder Substances 0.000 description 8
- 230000003247 decreasing effect Effects 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 7
- 238000012360 testing method Methods 0.000 description 6
- 239000013078 crystal Substances 0.000 description 4
- 239000003550 marker Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000004807 localization Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- WCUXLLCKKVVCTQ-UHFFFAOYSA-M Potassium chloride Chemical compound [Cl-].[K+] WCUXLLCKKVVCTQ-UHFFFAOYSA-M 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 239000002178 crystalline material Substances 0.000 description 2
- 238000007405 data analysis Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009499 grossing Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 101100476210 Caenorhabditis elegans rnt-1 gene Proteins 0.000 description 1
- 206010040007 Sense of oppression Diseases 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000009940 knitting Methods 0.000 description 1
- 238000002372 labelling Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 235000011164 potassium chloride Nutrition 0.000 description 1
- 239000001103 potassium chloride Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 239000010421 standard material Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 229910021489 α-quartz Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US26611972A | 1972-06-26 | 1972-06-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2332100A1 true DE2332100A1 (de) | 1974-01-10 |
Family
ID=23013245
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19732332100 Pending DE2332100A1 (de) | 1972-06-26 | 1973-06-23 | Verfahren und anordnung zur analyse von photographisch gespeicherten roentgen-beugungsspektren |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS4953094A (cg-RX-API-DMAC10.html) |
| CA (1) | CA974651A (cg-RX-API-DMAC10.html) |
| DE (1) | DE2332100A1 (cg-RX-API-DMAC10.html) |
| FR (1) | FR2191737A5 (cg-RX-API-DMAC10.html) |
| GB (1) | GB1431207A (cg-RX-API-DMAC10.html) |
| IT (1) | IT1006058B (cg-RX-API-DMAC10.html) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6193936A (ja) * | 1984-10-13 | 1986-05-12 | Furukawa Electric Co Ltd:The | 放射線による被測定物の組成分析方法 |
| GB8826816D0 (en) * | 1988-11-16 | 1988-12-21 | Atomic Energy Authority Uk | Method for spectrum matching |
| CN105354419B (zh) * | 2015-11-02 | 2018-01-30 | 中国电子科技集团公司第四十一研究所 | 一种应用于频谱分析仪中的轨迹处理方法 |
| CN115112605B (zh) * | 2022-07-21 | 2023-08-08 | 湖南五凌电力科技有限公司 | 变压器油光谱的波长矫正方法、计算机设备及存储介质 |
| CN116609370B (zh) * | 2023-04-13 | 2024-07-05 | 深圳市埃芯半导体科技有限公司 | 晶圆量测方法和电子设备 |
| CN118468815B (zh) * | 2024-07-12 | 2024-11-12 | 山东远联信息科技有限公司 | 一种基于谱图的数据处理方法、装置及电子设备 |
-
1973
- 1973-05-14 JP JP48052693A patent/JPS4953094A/ja active Pending
- 1973-05-28 CA CA172,495A patent/CA974651A/en not_active Expired
- 1973-06-13 FR FR7322348A patent/FR2191737A5/fr not_active Expired
- 1973-06-19 GB GB2892573A patent/GB1431207A/en not_active Expired
- 1973-06-20 IT IT2561073A patent/IT1006058B/it active
- 1973-06-23 DE DE19732332100 patent/DE2332100A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CA974651A (en) | 1975-09-16 |
| JPS4953094A (cg-RX-API-DMAC10.html) | 1974-05-23 |
| FR2191737A5 (cg-RX-API-DMAC10.html) | 1974-02-01 |
| GB1431207A (en) | 1976-04-07 |
| IT1006058B (it) | 1976-09-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHJ | Non-payment of the annual fee |