DE2125105A1 - - Google Patents
Info
- Publication number
- DE2125105A1 DE2125105A1 DE19712125105 DE2125105A DE2125105A1 DE 2125105 A1 DE2125105 A1 DE 2125105A1 DE 19712125105 DE19712125105 DE 19712125105 DE 2125105 A DE2125105 A DE 2125105A DE 2125105 A1 DE2125105 A1 DE 2125105A1
- Authority
- DE
- Germany
- Prior art keywords
- component
- drive
- axis
- support body
- object table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 238000007519 figuring Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 210000004072 lung Anatomy 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB2491670 | 1970-05-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2125105A1 true DE2125105A1 (OSRAM) | 1971-12-02 |
Family
ID=10219287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19712125105 Pending DE2125105A1 (OSRAM) | 1970-05-22 | 1971-05-21 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3714423A (OSRAM) |
| DE (1) | DE2125105A1 (OSRAM) |
| FR (1) | FR2093572A5 (OSRAM) |
| GB (1) | GB1320346A (OSRAM) |
| NL (1) | NL7106972A (OSRAM) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4170737A (en) | 1978-07-06 | 1979-10-09 | Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR | Top-entry transmission electron microscope |
| WO1981003580A1 (fr) * | 1980-06-09 | 1981-12-10 | Burevestnik | Chambre d'echantillons pour instrument de sondage electronique |
| US6891170B1 (en) | 2002-06-17 | 2005-05-10 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| US6967335B1 (en) | 2002-06-17 | 2005-11-22 | Zyvex Corporation | Manipulation system for manipulating a sample under study with a microscope |
| JP2007506981A (ja) * | 2003-09-23 | 2007-03-22 | ザイベックス コーポレーション | Fibで調製した試料を把持する素子を使用した顕微鏡検査のための方法、システム、および装置 |
| TW200531420A (en) | 2004-02-20 | 2005-09-16 | Zyvex Corp | Positioning device for microscopic motion |
| US7319336B2 (en) * | 2004-02-23 | 2008-01-15 | Zyvex Instruments, Llc | Charged particle beam device probe operation |
| US7326293B2 (en) * | 2004-03-26 | 2008-02-05 | Zyvex Labs, Llc | Patterned atomic layer epitaxy |
| US7786442B2 (en) * | 2004-06-18 | 2010-08-31 | General Electric Company | Method and apparatus for ion source positioning and adjustment |
| KR102083193B1 (ko) * | 2013-11-25 | 2020-03-02 | 삼성전자주식회사 | 로봇 청소기 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1226228B (de) * | 1959-07-24 | 1966-10-06 | Max Planck Gesellschaft | Bewegbarer Praeparattisch fuer einen Korpus-kularstrahlapparat, insbesondere Elektronen-mikroskop oder Elektronenbeugungsgeraet |
| GB1188026A (en) * | 1966-04-06 | 1970-04-15 | Jeol Ltd | X-Ray Diffraction Apparatus. |
| GB1219647A (en) * | 1967-06-19 | 1971-01-20 | Siemens Ag | Arrangement for use in a fully focussing x-ray spectro meter |
-
1970
- 1970-05-22 GB GB2491670A patent/GB1320346A/en not_active Expired
-
1971
- 1971-05-21 DE DE19712125105 patent/DE2125105A1/de active Pending
- 1971-05-21 US US00145694A patent/US3714423A/en not_active Expired - Lifetime
- 1971-05-21 NL NL7106972A patent/NL7106972A/xx unknown
- 1971-05-21 FR FR7118409A patent/FR2093572A5/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| NL7106972A (OSRAM) | 1971-11-24 |
| US3714423A (en) | 1973-01-30 |
| GB1320346A (en) | 1973-06-13 |
| FR2093572A5 (OSRAM) | 1972-01-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHJ | Non-payment of the annual fee |