NL7106972A - - Google Patents
Info
- Publication number
- NL7106972A NL7106972A NL7106972A NL7106972A NL7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A NL 7106972 A NL7106972 A NL 7106972A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB2491670 | 1970-05-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7106972A true NL7106972A (xx) | 1971-11-24 |
Family
ID=10219287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7106972A NL7106972A (xx) | 1970-05-22 | 1971-05-21 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3714423A (xx) |
| DE (1) | DE2125105A1 (xx) |
| FR (1) | FR2093572A5 (xx) |
| GB (1) | GB1320346A (xx) |
| NL (1) | NL7106972A (xx) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4170737A (en) * | 1978-07-06 | 1979-10-09 | Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR | Top-entry transmission electron microscope |
| DE3050424A1 (de) * | 1980-06-09 | 1982-07-29 | Burevestnik | Sample chamber for electron-sounding instrument |
| US6891170B1 (en) * | 2002-06-17 | 2005-05-10 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| US6967335B1 (en) | 2002-06-17 | 2005-11-22 | Zyvex Corporation | Manipulation system for manipulating a sample under study with a microscope |
| CN1871684B (zh) * | 2003-09-23 | 2011-08-24 | 塞威仪器公司 | 采用fib准备的样本的抓取元件的显微镜检查的方法、系统和设备 |
| TW200531420A (en) | 2004-02-20 | 2005-09-16 | Zyvex Corp | Positioning device for microscopic motion |
| US7319336B2 (en) | 2004-02-23 | 2008-01-15 | Zyvex Instruments, Llc | Charged particle beam device probe operation |
| US7326293B2 (en) * | 2004-03-26 | 2008-02-05 | Zyvex Labs, Llc | Patterned atomic layer epitaxy |
| US7786442B2 (en) * | 2004-06-18 | 2010-08-31 | General Electric Company | Method and apparatus for ion source positioning and adjustment |
| KR102083193B1 (ko) * | 2013-11-25 | 2020-03-02 | 삼성전자주식회사 | 로봇 청소기 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1226228B (de) * | 1959-07-24 | 1966-10-06 | Max Planck Gesellschaft | Bewegbarer Praeparattisch fuer einen Korpus-kularstrahlapparat, insbesondere Elektronen-mikroskop oder Elektronenbeugungsgeraet |
| GB1188026A (en) * | 1966-04-06 | 1970-04-15 | Jeol Ltd | X-Ray Diffraction Apparatus. |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
-
1970
- 1970-05-22 GB GB2491670A patent/GB1320346A/en not_active Expired
-
1971
- 1971-05-21 US US00145694A patent/US3714423A/en not_active Expired - Lifetime
- 1971-05-21 FR FR7118409A patent/FR2093572A5/fr not_active Expired
- 1971-05-21 NL NL7106972A patent/NL7106972A/xx unknown
- 1971-05-21 DE DE19712125105 patent/DE2125105A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US3714423A (en) | 1973-01-30 |
| FR2093572A5 (xx) | 1972-01-28 |
| DE2125105A1 (xx) | 1971-12-02 |
| GB1320346A (en) | 1973-06-13 |