DE2042586C3 - Halbleitereinrichtung mit mindestens einem Feldeffekttransistor - Google Patents
Halbleitereinrichtung mit mindestens einem FeldeffekttransistorInfo
- Publication number
- DE2042586C3 DE2042586C3 DE2042586A DE2042586A DE2042586C3 DE 2042586 C3 DE2042586 C3 DE 2042586C3 DE 2042586 A DE2042586 A DE 2042586A DE 2042586 A DE2042586 A DE 2042586A DE 2042586 C3 DE2042586 C3 DE 2042586C3
- Authority
- DE
- Germany
- Prior art keywords
- carrier body
- semiconductor device
- electrode
- zone
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Insulated Gate Type Field-Effect Transistor (AREA)
- Element Separation (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP44067192A JPS4819113B1 (enExample) | 1969-08-27 | 1969-08-27 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2042586A1 DE2042586A1 (de) | 1971-03-11 |
| DE2042586B2 DE2042586B2 (de) | 1978-11-16 |
| DE2042586C3 true DE2042586C3 (de) | 1984-01-26 |
Family
ID=13337780
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2042586A Expired DE2042586C3 (de) | 1969-08-27 | 1970-08-27 | Halbleitereinrichtung mit mindestens einem Feldeffekttransistor |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3688165A (enExample) |
| JP (1) | JPS4819113B1 (enExample) |
| DE (1) | DE2042586C3 (enExample) |
| GB (1) | GB1318444A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4076558A (en) * | 1977-01-31 | 1978-02-28 | International Business Machines Corporation | Method of high current ion implantation and charge reduction by simultaneous kerf implant |
| JPS58157151A (ja) * | 1982-03-15 | 1983-09-19 | Mitsubishi Electric Corp | 半導体集積回路装置 |
| US5936454A (en) * | 1993-06-01 | 1999-08-10 | Motorola, Inc. | Lateral bipolar transistor operating with independent base and gate biasing |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1043472B (de) * | 1956-02-06 | 1958-11-13 | Siemens Ag | Halbleiterbauelement zur Stromstabilisierung |
| NL267390A (enExample) * | 1960-09-28 | |||
| US3197681A (en) * | 1961-09-29 | 1965-07-27 | Texas Instruments Inc | Semiconductor devices with heavily doped region to prevent surface inversion |
| US3284723A (en) * | 1962-07-02 | 1966-11-08 | Westinghouse Electric Corp | Oscillatory circuit and monolithic semiconductor device therefor |
| BE637064A (enExample) * | 1962-09-07 | Rca Corp | ||
| GB993388A (en) * | 1964-02-05 | 1965-05-26 | Standard Telephones Cables Ltd | Improvements in or relating to semiconductor devices |
| US3305708A (en) * | 1964-11-25 | 1967-02-21 | Rca Corp | Insulated-gate field-effect semiconductor device |
| DE1514495C3 (de) * | 1965-07-01 | 1974-10-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Halbleiteranordnung |
| GB1217880A (en) * | 1967-10-13 | 1970-12-31 | Rca Corp | Lateral transistor with auxiliary control electrode |
| NL6715013A (enExample) * | 1967-11-04 | 1969-05-06 | ||
| US3570112A (en) * | 1967-12-01 | 1971-03-16 | Nat Defence Canada | Radiation hardening of insulated gate field effect transistors |
| US3573509A (en) * | 1968-09-09 | 1971-04-06 | Texas Instruments Inc | Device for reducing bipolar effects in mos integrated circuits |
-
1969
- 1969-08-27 JP JP44067192A patent/JPS4819113B1/ja active Pending
-
1970
- 1970-08-26 US US67141A patent/US3688165A/en not_active Expired - Lifetime
- 1970-08-26 GB GB4114370A patent/GB1318444A/en not_active Expired
- 1970-08-27 DE DE2042586A patent/DE2042586C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1318444A (en) | 1973-05-31 |
| JPS4819113B1 (enExample) | 1973-06-11 |
| DE2042586A1 (de) | 1971-03-11 |
| US3688165A (en) | 1972-08-29 |
| DE2042586B2 (de) | 1978-11-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8228 | New agent |
Free format text: STREHL, P., DIPL.-ING. DIPL.-WIRTSCH.-ING., PAT.-ANW., 8000 MUENCHEN |
|
| 8281 | Inventor (new situation) |
Free format text: TOMINAGA, YOSHIO KAWAGOE, HIROTO TERANISHI, YUICHI, KODAIRA, TOKYO, JP |
|
| C3 | Grant after two publication steps (3rd publication) | ||
| 8339 | Ceased/non-payment of the annual fee |