DE202013012580U1 - Ionenumlenkungsvorrichtung für ein Massenspektrometer - Google Patents
Ionenumlenkungsvorrichtung für ein Massenspektrometer Download PDFInfo
- Publication number
- DE202013012580U1 DE202013012580U1 DE202013012580.2U DE202013012580U DE202013012580U1 DE 202013012580 U1 DE202013012580 U1 DE 202013012580U1 DE 202013012580 U DE202013012580 U DE 202013012580U DE 202013012580 U1 DE202013012580 U1 DE 202013012580U1
- Authority
- DE
- Germany
- Prior art keywords
- ion
- chargeable
- electric field
- deflection device
- ion beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims abstract description 197
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 74
- 230000005684 electric field Effects 0.000 claims abstract description 62
- 238000005513 bias potential Methods 0.000 claims abstract description 30
- 230000005686 electrostatic field Effects 0.000 claims abstract description 11
- 230000002093 peripheral effect Effects 0.000 claims abstract description 5
- 230000004907 flux Effects 0.000 claims description 26
- 230000005404 monopole Effects 0.000 claims description 11
- 239000000470 constituent Substances 0.000 claims description 4
- 238000004949 mass spectrometry Methods 0.000 description 38
- 238000000034 method Methods 0.000 description 13
- 238000013461 design Methods 0.000 description 10
- 239000007789 gas Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 238000005070 sampling Methods 0.000 description 8
- 230000035939 shock Effects 0.000 description 8
- 238000004458 analytical method Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000003795 desorption Methods 0.000 description 6
- 238000000605 extraction Methods 0.000 description 6
- 239000002245 particle Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000000918 plasma mass spectrometry Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 238000001036 glow-discharge mass spectrometry Methods 0.000 description 4
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 238000009616 inductively coupled plasma Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000011144 upstream manufacturing Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000000375 direct analysis in real time Methods 0.000 description 2
- 238000012063 dual-affinity re-targeting Methods 0.000 description 2
- 238000002290 gas chromatography-mass spectrometry Methods 0.000 description 2
- 230000037427 ion transport Effects 0.000 description 2
- 238000004895 liquid chromatography mass spectrometry Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000010223 real-time analysis Methods 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000002996 emotional effect Effects 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 230000005405 multipole Effects 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000011045 prefiltration Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/061—Ion deflecting means, e.g. ion gates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2012901118 | 2012-03-20 | ||
| AU2012901118A AU2012901118A0 (en) | 2012-03-20 | An ion deflector for a mass spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE202013012580U1 true DE202013012580U1 (de) | 2017-09-05 |
Family
ID=49221697
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE202013012580.2U Expired - Lifetime DE202013012580U1 (de) | 2012-03-20 | 2013-03-20 | Ionenumlenkungsvorrichtung für ein Massenspektrometer |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9159543B2 (https=) |
| EP (1) | EP2828881B1 (https=) |
| JP (1) | JP6175706B2 (https=) |
| CN (1) | CN104412356B (https=) |
| DE (1) | DE202013012580U1 (https=) |
| WO (1) | WO2013138852A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160336160A1 (en) * | 2013-12-31 | 2016-11-17 | Dh Technologies Development Pte. Ltd. | Ion Guide for Mass Spectrometry |
| DE102015117635B4 (de) * | 2015-10-16 | 2018-01-11 | Bruker Daltonik Gmbh | Strukturaufklärung von intakten schweren Molekülen und Molekülkomplexen in Massenspektrometern |
| US12542266B2 (en) | 2021-02-25 | 2026-02-03 | Dh Technologies Development Pte. Ltd. | Bent PCB ion guide for reduction of contamination and noise |
| EP4437580A4 (en) * | 2021-11-22 | 2026-01-28 | Perkinelmer U S Llc | DEFLECTORS FOR IONIC BEAMS AND MASS SPECTROMETRY SYSTEMS INCLUDING THEM |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6614021B1 (en) | 1998-09-23 | 2003-09-02 | Varian Australian Pty Ltd | Ion optical system for a mass spectrometer |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8915972D0 (en) * | 1989-07-12 | 1989-08-31 | Kratos Analytical Ltd | An ion mirror for a time-of-flight mass spectrometer |
| JP3189652B2 (ja) * | 1995-12-01 | 2001-07-16 | 株式会社日立製作所 | 質量分析装置 |
| JPH10302709A (ja) * | 1997-04-28 | 1998-11-13 | Jeol Ltd | イオン導入装置 |
| AUPR465101A0 (en) * | 2001-04-27 | 2001-05-24 | Varian Australia Pty Ltd | "Mass spectrometer" |
| US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
| JP4940977B2 (ja) * | 2007-02-07 | 2012-05-30 | 株式会社島津製作所 | イオン偏向装置及び質量分析装置 |
| US8124946B2 (en) * | 2008-06-25 | 2012-02-28 | Axcelis Technologies Inc. | Post-decel magnetic energy filter for ion implantation systems |
| JP2010123561A (ja) * | 2008-11-24 | 2010-06-03 | Varian Inc | 曲線状イオンガイドおよび関連方法 |
| US8084750B2 (en) * | 2009-05-28 | 2011-12-27 | Agilent Technologies, Inc. | Curved ion guide with varying ion deflecting field and related methods |
| CN102226981B (zh) * | 2011-05-10 | 2013-03-06 | 中国科学院地质与地球物理研究所 | 二次离子质谱仪的样品保护装置和保护方法 |
-
2013
- 2013-03-20 US US14/383,265 patent/US9159543B2/en active Active
- 2013-03-20 EP EP13764123.9A patent/EP2828881B1/en active Active
- 2013-03-20 JP JP2015500715A patent/JP6175706B2/ja active Active
- 2013-03-20 CN CN201380015489.3A patent/CN104412356B/zh active Active
- 2013-03-20 DE DE202013012580.2U patent/DE202013012580U1/de not_active Expired - Lifetime
- 2013-03-20 WO PCT/AU2013/000276 patent/WO2013138852A1/en not_active Ceased
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6614021B1 (en) | 1998-09-23 | 2003-09-02 | Varian Australian Pty Ltd | Ion optical system for a mass spectrometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015512510A (ja) | 2015-04-27 |
| JP6175706B2 (ja) | 2017-08-09 |
| CN104412356A (zh) | 2015-03-11 |
| US20150060687A1 (en) | 2015-03-05 |
| US9159543B2 (en) | 2015-10-13 |
| EP2828881A1 (en) | 2015-01-28 |
| CN104412356B (zh) | 2016-11-16 |
| EP2828881A4 (en) | 2015-10-07 |
| EP2828881B1 (en) | 2018-05-02 |
| WO2013138852A1 (en) | 2013-09-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69714356T2 (de) | Plasma-Massenspektrometer | |
| DE112007000146B4 (de) | Konzentrierender Ionenleiter eines Massenspektrometers, Spektrometer und Verfahren | |
| CH615532A5 (https=) | ||
| DE69418063T2 (de) | Zykloidisches massenspektrometer | |
| DE102012207403A1 (de) | Verfahren und vorrichtung zur überprüfung von ionen in einem massenspektrometer, das in einem sub-atmosphärischen druckregime gehalten wird | |
| DE102020119770A1 (de) | Spektroskopie- und bildgebungssystem | |
| DE112016003713B4 (de) | Ein axiales Feld aufweisende Kollisionszelle | |
| DE19635645C2 (de) | Verfahren für die hochauflösende Spektrenaufnahme von Analytionen in einem linearen Flugzeitmassenspektrometer | |
| DE202013012580U1 (de) | Ionenumlenkungsvorrichtung für ein Massenspektrometer | |
| DE102007013693B4 (de) | Ionennachweissystem mit Unterdrückung neutralen Rauschens | |
| DE102016103292B4 (de) | Massenspektrometer | |
| DE102016009789B4 (de) | Spiegellinse zum Richten eines Ionenstrahls | |
| EP0000865B1 (de) | Ionenquelle mit einer Ionisationskammer zur chemischen Ionisierung | |
| EP0633602B1 (de) | Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle, mit hoher Empfindlichkeit und grossem dynamischem Bereich | |
| DE3783476T2 (de) | Massenspektrometer mit getrennter ionenquelle. | |
| US9048078B2 (en) | Mass spectrometry | |
| DE19631161A1 (de) | Flugzeit-Flugzeit-Massenspektrometer mit differentiell gepumpter Kollisionszelle | |
| DE202020106423U1 (de) | Massenspektrometriegerät | |
| DE102005023590A1 (de) | ICP-Massenspektrometer | |
| TW201306087A (zh) | 於其中帶電粒子源及帶電粒子分析器二者均對偏向器鏡片之軸線偏移而致使減少之基線信號偏移之用於氣體分析的質譜測定法 | |
| GB2545670A (en) | Mass spectrometers | |
| DE19628093B4 (de) | Verfahren und Vorrichtung zum Nachweis von Probenmolekülen | |
| CN211743093U (zh) | 一种质谱仪 | |
| DE102008058144B4 (de) | Elektrostatischer Energieanalysator für geladene Teilchen, Spektrometer und Monochromator mit einem solchen Analysator | |
| DE19631162A1 (de) | Kollisionszelle mit integriertem Ionenselektor für Flugzeit-Flugzeit-Massenspektrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R081 | Change of applicant/patentee |
Owner name: BRUKER DALTONICS GMBH & CO. KG, DE Free format text: FORMER OWNER: BRUKER CHEMICAL ANALYSIS BV, WORMER, NL |
|
| R082 | Change of representative |
Representative=s name: KOHLER SCHMID MOEBUS PATENTANWAELTE PARTNERSCH, DE |
|
| R150 | Utility model maintained after payment of first maintenance fee after three years | ||
| R207 | Utility model specification | ||
| R151 | Utility model maintained after payment of second maintenance fee after six years | ||
| R152 | Utility model maintained after payment of third maintenance fee after eight years | ||
| R081 | Change of applicant/patentee |
Owner name: BRUKER DALTONICS GMBH & CO. KG, DE Free format text: FORMER OWNER: BRUKER DALTONIK GMBH, 28359 BREMEN, DE |
|
| R071 | Expiry of right |