JP6175706B2 - 質量分析計用イオンデフレクター - Google Patents

質量分析計用イオンデフレクター Download PDF

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Publication number
JP6175706B2
JP6175706B2 JP2015500715A JP2015500715A JP6175706B2 JP 6175706 B2 JP6175706 B2 JP 6175706B2 JP 2015500715 A JP2015500715 A JP 2015500715A JP 2015500715 A JP2015500715 A JP 2015500715A JP 6175706 B2 JP6175706 B2 JP 6175706B2
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Japan
Prior art keywords
chargeable
ion
ions
electric field
ion deflector
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JP2015500715A
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English (en)
Japanese (ja)
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JP2015512510A (ja
JP2015512510A5 (https=
Inventor
カリニチェンコ，イオウリ
Original Assignee
ブルカー ケミカル アナリシス ベーフェー
ブルカー ケミカル アナリシス ベーフェー
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Priority claimed from AU2012901118A external-priority patent/AU2012901118A0/en
Application filed by ブルカー ケミカル アナリシス ベーフェー, ブルカー ケミカル アナリシス ベーフェー filed Critical ブルカー ケミカル アナリシス ベーフェー
Publication of JP2015512510A publication Critical patent/JP2015512510A/ja
Publication of JP2015512510A5 publication Critical patent/JP2015512510A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2015500715A 2012-03-20 2013-03-20 質量分析計用イオンデフレクター Active JP6175706B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2012901118 2012-03-20
AU2012901118A AU2012901118A0 (en) 2012-03-20 An ion deflector for a mass spectrometer
PCT/AU2013/000276 WO2013138852A1 (en) 2012-03-20 2013-03-20 An ion deflector for a mass spectrometer

Publications (3)

Publication Number Publication Date
JP2015512510A JP2015512510A (ja) 2015-04-27
JP2015512510A5 JP2015512510A5 (https=) 2017-03-02
JP6175706B2 true JP6175706B2 (ja) 2017-08-09

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ID=49221697

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015500715A Active JP6175706B2 (ja) 2012-03-20 2013-03-20 質量分析計用イオンデフレクター

Country Status (6)

Country Link
US (1) US9159543B2 (https=)
EP (1) EP2828881B1 (https=)
JP (1) JP6175706B2 (https=)
CN (1) CN104412356B (https=)
DE (1) DE202013012580U1 (https=)
WO (1) WO2013138852A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160336160A1 (en) * 2013-12-31 2016-11-17 Dh Technologies Development Pte. Ltd. Ion Guide for Mass Spectrometry
DE102015117635B4 (de) * 2015-10-16 2018-01-11 Bruker Daltonik Gmbh Strukturaufklärung von intakten schweren Molekülen und Molekülkomplexen in Massenspektrometern
US12542266B2 (en) 2021-02-25 2026-02-03 Dh Technologies Development Pte. Ltd. Bent PCB ion guide for reduction of contamination and noise
EP4437580A4 (en) * 2021-11-22 2026-01-28 Perkinelmer U S Llc DEFLECTORS FOR IONIC BEAMS AND MASS SPECTROMETRY SYSTEMS INCLUDING THEM

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JPH10302709A (ja) * 1997-04-28 1998-11-13 Jeol Ltd イオン導入装置
JP4577991B2 (ja) * 1998-09-23 2010-11-10 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． マススペクトロメータのためのイオン光学系
AUPR465101A0 (en) * 2001-04-27 2001-05-24 Varian Australia Pty Ltd "Mass spectrometer"
US6867414B2 (en) * 2002-09-24 2005-03-15 Ciphergen Biosystems, Inc. Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
JP4940977B2 (ja) * 2007-02-07 2012-05-30 株式会社島津製作所 イオン偏向装置及び質量分析装置
US8124946B2 (en) * 2008-06-25 2012-02-28 Axcelis Technologies Inc. Post-decel magnetic energy filter for ion implantation systems
JP2010123561A (ja) * 2008-11-24 2010-06-03 Varian Inc 曲線状イオンガイドおよび関連方法
US8084750B2 (en) * 2009-05-28 2011-12-27 Agilent Technologies, Inc. Curved ion guide with varying ion deflecting field and related methods
CN102226981B (zh) * 2011-05-10 2013-03-06 中国科学院地质与地球物理研究所 二次离子质谱仪的样品保护装置和保护方法

Also Published As

Publication number Publication date
JP2015512510A (ja) 2015-04-27
CN104412356A (zh) 2015-03-11
US20150060687A1 (en) 2015-03-05
US9159543B2 (en) 2015-10-13
DE202013012580U1 (de) 2017-09-05
EP2828881A1 (en) 2015-01-28
CN104412356B (zh) 2016-11-16
EP2828881A4 (en) 2015-10-07
EP2828881B1 (en) 2018-05-02
WO2013138852A1 (en) 2013-09-26

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