DE19723087C2 - Fehlerkorrekturverfahren für Transmissionsmessungen in Vektornetzwerkanalysatoren - Google Patents

Fehlerkorrekturverfahren für Transmissionsmessungen in Vektornetzwerkanalysatoren

Info

Publication number
DE19723087C2
DE19723087C2 DE19723087A DE19723087A DE19723087C2 DE 19723087 C2 DE19723087 C2 DE 19723087C2 DE 19723087 A DE19723087 A DE 19723087A DE 19723087 A DE19723087 A DE 19723087A DE 19723087 C2 DE19723087 C2 DE 19723087C2
Authority
DE
Germany
Prior art keywords
source
transmission
coefficient
gate
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19723087A
Other languages
German (de)
English (en)
Other versions
DE19723087A1 (de
Inventor
David Vernon Blackham
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE19723087A1 publication Critical patent/DE19723087A1/de
Application granted granted Critical
Publication of DE19723087C2 publication Critical patent/DE19723087C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Networks Using Active Elements (AREA)
DE19723087A 1996-08-01 1997-06-02 Fehlerkorrekturverfahren für Transmissionsmessungen in Vektornetzwerkanalysatoren Expired - Fee Related DE19723087C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/691,062 US5748000A (en) 1996-08-01 1996-08-01 Error correction method for transmission measurements in vector network analyzers

Publications (2)

Publication Number Publication Date
DE19723087A1 DE19723087A1 (de) 1998-02-05
DE19723087C2 true DE19723087C2 (de) 1999-07-01

Family

ID=24775013

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19723087A Expired - Fee Related DE19723087C2 (de) 1996-08-01 1997-06-02 Fehlerkorrekturverfahren für Transmissionsmessungen in Vektornetzwerkanalysatoren

Country Status (4)

Country Link
US (1) US5748000A (enExample)
JP (1) JP3980710B2 (enExample)
DE (1) DE19723087C2 (enExample)
GB (1) GB2315873B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6147501A (en) * 1997-08-26 2000-11-14 Hewlett-Packard Company Automatic calibration of a network analyzer
US6060888A (en) * 1998-04-24 2000-05-09 Hewlett-Packard Company Error correction method for reflection measurements of reciprocal devices in vector network analyzers
US6590399B1 (en) * 1999-04-27 2003-07-08 Anritsu Company Measuring parameters of DUT at specified frequency using vector network analyzer
US6396285B1 (en) * 2000-08-14 2002-05-28 Agilent Technologies, Inc. Method and apparatus for efficient measurement of reciprocal multiport devices in vector network analysis
WO2003087856A1 (fr) * 2002-04-17 2003-10-23 Advantest Corporation Analyseur de reseau, procede d'analyse de reseau, correcteur automatique, procede de correction, programme, et support d'enregistrement
US6836743B1 (en) * 2002-10-15 2004-12-28 Agilent Technologies, Inc. Compensating for unequal load and source match in vector network analyzer calibration
JP2006184264A (ja) * 2004-12-01 2006-07-13 Tohoku Univ アンテナ装置および磁界発生装置
US7019536B1 (en) * 2005-01-03 2006-03-28 Agilent Technologies, Inc. Multiport calibration simplification using the “unknown thru” method
US7586384B2 (en) * 2005-08-15 2009-09-08 Nokia Corporation Integrated load impedance sensing for tunable matching networks
JP4743208B2 (ja) * 2005-09-29 2011-08-10 株式会社村田製作所 電子部品の電気特性測定方法
CN101046492B (zh) * 2006-03-28 2010-05-12 华为技术有限公司 一种双端口网络参数测试方法
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
WO2008066137A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé et dispositif de correction d'erreur de caractéristique haute fréquence de composant électronique
WO2008065791A1 (en) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. High frequency characteristics error correction method of electronic component
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
US9927485B2 (en) 2011-09-23 2018-03-27 Tektronix, Inc. Enhanced AWG waveform calibration using S-parameters
US20130080105A1 (en) * 2011-09-23 2013-03-28 Tektronix, Inc Enhanced awg wavef0rm calibration using s-parameters
CN103217586B (zh) * 2013-03-21 2015-04-08 中国科学院电工研究所 一种基于核磁共振波谱仪的矢量网络分析装置
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
KR102592534B1 (ko) * 2021-06-30 2023-10-24 한국표준과학연구원 산란계수 측정오차 보정 방법
CN114236449B (zh) * 2021-11-30 2022-09-30 南京航空航天大学 一种调制域微波矢量网络分析仪校准方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
US5537046A (en) * 1993-05-24 1996-07-16 Atn Microwave, Inc. Electronic calibration method and apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4636717A (en) * 1984-01-09 1987-01-13 Hewlett-Packard Company Vector network analyzer with integral processor
US4845423A (en) * 1987-09-21 1989-07-04 Hewlett-Packard Company Electrically short air line for network analyzer calibration
DE4332273C2 (de) * 1992-12-12 1997-09-25 Rohde & Schwarz Verfahren zum Kalibrieren eines Netzwerkanalysators
US5587934A (en) * 1993-10-21 1996-12-24 Wiltron Company Automatic VNA calibration apparatus
US5548538A (en) * 1994-12-07 1996-08-20 Wiltron Company Internal automatic calibrator for vector network analyzers

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
US5537046A (en) * 1993-05-24 1996-07-16 Atn Microwave, Inc. Electronic calibration method and apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Firmenschrift: Hewlett-Packard: "S-Parameter- Design", Application Note 154, April 1972 *

Also Published As

Publication number Publication date
GB2315873B (en) 2001-01-03
JP3980710B2 (ja) 2007-09-26
GB2315873A (en) 1998-02-11
US5748000A (en) 1998-05-05
JPH1082808A (ja) 1998-03-31
DE19723087A1 (de) 1998-02-05
GB9715889D0 (en) 1997-10-01

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee