JP3980710B2 - 伝送測定誤差補正方法 - Google Patents

伝送測定誤差補正方法 Download PDF

Info

Publication number
JP3980710B2
JP3980710B2 JP19805797A JP19805797A JP3980710B2 JP 3980710 B2 JP3980710 B2 JP 3980710B2 JP 19805797 A JP19805797 A JP 19805797A JP 19805797 A JP19805797 A JP 19805797A JP 3980710 B2 JP3980710 B2 JP 3980710B2
Authority
JP
Japan
Prior art keywords
transmission
measured
coefficient
dut
port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP19805797A
Other languages
English (en)
Japanese (ja)
Other versions
JPH1082808A5 (enExample
JPH1082808A (ja
Inventor
デビッド・バーノン・ブラハム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JPH1082808A publication Critical patent/JPH1082808A/ja
Publication of JPH1082808A5 publication Critical patent/JPH1082808A5/ja
Application granted granted Critical
Publication of JP3980710B2 publication Critical patent/JP3980710B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Networks Using Active Elements (AREA)
JP19805797A 1996-08-01 1997-07-24 伝送測定誤差補正方法 Expired - Lifetime JP3980710B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/691,062 US5748000A (en) 1996-08-01 1996-08-01 Error correction method for transmission measurements in vector network analyzers
US691,062 1996-08-01

Publications (3)

Publication Number Publication Date
JPH1082808A JPH1082808A (ja) 1998-03-31
JPH1082808A5 JPH1082808A5 (enExample) 2005-05-19
JP3980710B2 true JP3980710B2 (ja) 2007-09-26

Family

ID=24775013

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19805797A Expired - Lifetime JP3980710B2 (ja) 1996-08-01 1997-07-24 伝送測定誤差補正方法

Country Status (4)

Country Link
US (1) US5748000A (enExample)
JP (1) JP3980710B2 (enExample)
DE (1) DE19723087C2 (enExample)
GB (1) GB2315873B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6147501A (en) * 1997-08-26 2000-11-14 Hewlett-Packard Company Automatic calibration of a network analyzer
US6060888A (en) * 1998-04-24 2000-05-09 Hewlett-Packard Company Error correction method for reflection measurements of reciprocal devices in vector network analyzers
US6590399B1 (en) * 1999-04-27 2003-07-08 Anritsu Company Measuring parameters of DUT at specified frequency using vector network analyzer
US6396285B1 (en) * 2000-08-14 2002-05-28 Agilent Technologies, Inc. Method and apparatus for efficient measurement of reciprocal multiport devices in vector network analysis
WO2003087856A1 (fr) * 2002-04-17 2003-10-23 Advantest Corporation Analyseur de reseau, procede d'analyse de reseau, correcteur automatique, procede de correction, programme, et support d'enregistrement
US6836743B1 (en) * 2002-10-15 2004-12-28 Agilent Technologies, Inc. Compensating for unequal load and source match in vector network analyzer calibration
JP2006184264A (ja) * 2004-12-01 2006-07-13 Tohoku Univ アンテナ装置および磁界発生装置
US7019536B1 (en) * 2005-01-03 2006-03-28 Agilent Technologies, Inc. Multiport calibration simplification using the “unknown thru” method
US7586384B2 (en) * 2005-08-15 2009-09-08 Nokia Corporation Integrated load impedance sensing for tunable matching networks
JP4743208B2 (ja) * 2005-09-29 2011-08-10 株式会社村田製作所 電子部品の電気特性測定方法
CN101046492B (zh) * 2006-03-28 2010-05-12 华为技术有限公司 一种双端口网络参数测试方法
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
WO2008066137A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé et dispositif de correction d'erreur de caractéristique haute fréquence de composant électronique
WO2008065791A1 (en) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. High frequency characteristics error correction method of electronic component
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
US9927485B2 (en) 2011-09-23 2018-03-27 Tektronix, Inc. Enhanced AWG waveform calibration using S-parameters
US20130080105A1 (en) * 2011-09-23 2013-03-28 Tektronix, Inc Enhanced awg wavef0rm calibration using s-parameters
CN103217586B (zh) * 2013-03-21 2015-04-08 中国科学院电工研究所 一种基于核磁共振波谱仪的矢量网络分析装置
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
KR102592534B1 (ko) * 2021-06-30 2023-10-24 한국표준과학연구원 산란계수 측정오차 보정 방법
CN114236449B (zh) * 2021-11-30 2022-09-30 南京航空航天大学 一种调制域微波矢量网络分析仪校准方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4636717A (en) * 1984-01-09 1987-01-13 Hewlett-Packard Company Vector network analyzer with integral processor
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
US4845423A (en) * 1987-09-21 1989-07-04 Hewlett-Packard Company Electrically short air line for network analyzer calibration
DE4332273C2 (de) * 1992-12-12 1997-09-25 Rohde & Schwarz Verfahren zum Kalibrieren eines Netzwerkanalysators
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US5587934A (en) * 1993-10-21 1996-12-24 Wiltron Company Automatic VNA calibration apparatus
US5548538A (en) * 1994-12-07 1996-08-20 Wiltron Company Internal automatic calibrator for vector network analyzers

Also Published As

Publication number Publication date
GB2315873B (en) 2001-01-03
GB2315873A (en) 1998-02-11
US5748000A (en) 1998-05-05
JPH1082808A (ja) 1998-03-31
DE19723087C2 (de) 1999-07-01
DE19723087A1 (de) 1998-02-05
GB9715889D0 (en) 1997-10-01

Similar Documents

Publication Publication Date Title
JP3980710B2 (ja) 伝送測定誤差補正方法
US6060888A (en) Error correction method for reflection measurements of reciprocal devices in vector network analyzers
US5047725A (en) Verification and correction method for an error model for a measurement network
US20220260662A1 (en) Integrated vector network analyzer
US5784299A (en) Method for measuring electronic devices under test with a network analyzer
US7130756B2 (en) Calibration method for carrying out multiport measurements on semiconductor wafers
JP4300253B2 (ja) ベクトル・ネットワーク・アナライザの校正方法
US4853613A (en) Calibration method for apparatus evaluating microwave/millimeter wave circuits
US5442296A (en) Method for calibrating a network analyzer
US8504315B2 (en) Method for the secondary error correction of a multi-port network analyzer
KR100538405B1 (ko) 개선된 정확도를 갖춘 자동화된 마이크로웨이브 테스트시스템
US8798953B2 (en) Calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof
TW201300799A (zh) 量測待測物散射參數的方法
CN108226643A (zh) 在线测量负载牵引系统的源反射系数的方法
US20170269134A1 (en) Crosstalk calibration for multi-channel systems
US20060226856A1 (en) VNA and method for addressing transmission line effects in VNA measurement data
US20120197577A1 (en) Calibration Method for Radio Frequency Scattering Parameter Measurements
US7315170B2 (en) Calibration apparatus and method using pulse for frequency, phase, and delay characteristic
US7124049B2 (en) Method for implementing TRL calibration in VNA
TWI463147B (zh) Calibration method of radio frequency scattering parameters with two correctors
Safwat et al. Sensitivity analysis of calibration standards for fixed probe spacing on-wafer calibration techniques [vector network analyzers]
TWI463146B (zh) Radiofrequency Scattering Parameter Measurement and Correction Method
US20040113632A1 (en) Distortion measurements with a vector network analyzer
CN114137389A (zh) 微波探针s参数相位的确定方法、装置、终端及存储介质
US20060055394A1 (en) Network analyzer including automatic port extension calibration and method of operation

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040707

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040707

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20070525

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070531

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070628

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100706

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100706

Year of fee payment: 3