JPH1082808A5 - - Google Patents

Info

Publication number
JPH1082808A5
JPH1082808A5 JP1997198057A JP19805797A JPH1082808A5 JP H1082808 A5 JPH1082808 A5 JP H1082808A5 JP 1997198057 A JP1997198057 A JP 1997198057A JP 19805797 A JP19805797 A JP 19805797A JP H1082808 A5 JPH1082808 A5 JP H1082808A5
Authority
JP
Japan
Prior art keywords
measured
transmission
source
port
coefficients
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1997198057A
Other languages
English (en)
Japanese (ja)
Other versions
JP3980710B2 (ja
JPH1082808A (ja
Filing date
Publication date
Priority claimed from US08/691,062 external-priority patent/US5748000A/en
Application filed filed Critical
Publication of JPH1082808A publication Critical patent/JPH1082808A/ja
Publication of JPH1082808A5 publication Critical patent/JPH1082808A5/ja
Application granted granted Critical
Publication of JP3980710B2 publication Critical patent/JP3980710B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP19805797A 1996-08-01 1997-07-24 伝送測定誤差補正方法 Expired - Lifetime JP3980710B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/691,062 US5748000A (en) 1996-08-01 1996-08-01 Error correction method for transmission measurements in vector network analyzers
US691,062 1996-08-01

Publications (3)

Publication Number Publication Date
JPH1082808A JPH1082808A (ja) 1998-03-31
JPH1082808A5 true JPH1082808A5 (enExample) 2005-05-19
JP3980710B2 JP3980710B2 (ja) 2007-09-26

Family

ID=24775013

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19805797A Expired - Lifetime JP3980710B2 (ja) 1996-08-01 1997-07-24 伝送測定誤差補正方法

Country Status (4)

Country Link
US (1) US5748000A (enExample)
JP (1) JP3980710B2 (enExample)
DE (1) DE19723087C2 (enExample)
GB (1) GB2315873B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6147501A (en) * 1997-08-26 2000-11-14 Hewlett-Packard Company Automatic calibration of a network analyzer
US6060888A (en) * 1998-04-24 2000-05-09 Hewlett-Packard Company Error correction method for reflection measurements of reciprocal devices in vector network analyzers
US6590399B1 (en) * 1999-04-27 2003-07-08 Anritsu Company Measuring parameters of DUT at specified frequency using vector network analyzer
US6396285B1 (en) * 2000-08-14 2002-05-28 Agilent Technologies, Inc. Method and apparatus for efficient measurement of reciprocal multiport devices in vector network analysis
WO2003087856A1 (fr) * 2002-04-17 2003-10-23 Advantest Corporation Analyseur de reseau, procede d'analyse de reseau, correcteur automatique, procede de correction, programme, et support d'enregistrement
US6836743B1 (en) * 2002-10-15 2004-12-28 Agilent Technologies, Inc. Compensating for unequal load and source match in vector network analyzer calibration
JP2006184264A (ja) * 2004-12-01 2006-07-13 Tohoku Univ アンテナ装置および磁界発生装置
US7019536B1 (en) * 2005-01-03 2006-03-28 Agilent Technologies, Inc. Multiport calibration simplification using the “unknown thru” method
US7586384B2 (en) * 2005-08-15 2009-09-08 Nokia Corporation Integrated load impedance sensing for tunable matching networks
JP4743208B2 (ja) * 2005-09-29 2011-08-10 株式会社村田製作所 電子部品の電気特性測定方法
CN101046492B (zh) * 2006-03-28 2010-05-12 华为技术有限公司 一种双端口网络参数测试方法
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
WO2008066137A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé et dispositif de correction d'erreur de caractéristique haute fréquence de composant électronique
WO2008065791A1 (en) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. High frequency characteristics error correction method of electronic component
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
US9927485B2 (en) 2011-09-23 2018-03-27 Tektronix, Inc. Enhanced AWG waveform calibration using S-parameters
US20130080105A1 (en) * 2011-09-23 2013-03-28 Tektronix, Inc Enhanced awg wavef0rm calibration using s-parameters
CN103217586B (zh) * 2013-03-21 2015-04-08 中国科学院电工研究所 一种基于核磁共振波谱仪的矢量网络分析装置
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
KR102592534B1 (ko) * 2021-06-30 2023-10-24 한국표준과학연구원 산란계수 측정오차 보정 방법
CN114236449B (zh) * 2021-11-30 2022-09-30 南京航空航天大学 一种调制域微波矢量网络分析仪校准方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4636717A (en) * 1984-01-09 1987-01-13 Hewlett-Packard Company Vector network analyzer with integral processor
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
US4845423A (en) * 1987-09-21 1989-07-04 Hewlett-Packard Company Electrically short air line for network analyzer calibration
DE4332273C2 (de) * 1992-12-12 1997-09-25 Rohde & Schwarz Verfahren zum Kalibrieren eines Netzwerkanalysators
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US5587934A (en) * 1993-10-21 1996-12-24 Wiltron Company Automatic VNA calibration apparatus
US5548538A (en) * 1994-12-07 1996-08-20 Wiltron Company Internal automatic calibrator for vector network analyzers

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