DE19580361T1 - Balun-Apparat und Verfahren zu seinem Entwurf - Google Patents

Balun-Apparat und Verfahren zu seinem Entwurf

Info

Publication number
DE19580361T1
DE19580361T1 DE19580361T DE19580361T DE19580361T1 DE 19580361 T1 DE19580361 T1 DE 19580361T1 DE 19580361 T DE19580361 T DE 19580361T DE 19580361 T DE19580361 T DE 19580361T DE 19580361 T1 DE19580361 T1 DE 19580361T1
Authority
DE
Germany
Prior art keywords
design
balun apparatus
balun
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19580361T
Other languages
German (de)
English (en)
Inventor
James P Phillips
Louis J Vannatta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of DE19580361T1 publication Critical patent/DE19580361T1/de
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced lines or devices with unbalanced lines or devices
DE19580361T 1994-03-11 1995-01-30 Balun-Apparat und Verfahren zu seinem Entwurf Ceased DE19580361T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/209,811 US5565881A (en) 1994-03-11 1994-03-11 Balun apparatus including impedance transformer having transformation length
PCT/US1995/000689 WO1995024744A1 (en) 1994-03-11 1995-01-30 A balun apparatus and method of designing same

Publications (1)

Publication Number Publication Date
DE19580361T1 true DE19580361T1 (de) 1996-05-09

Family

ID=22780396

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19580361T Ceased DE19580361T1 (de) 1994-03-11 1995-01-30 Balun-Apparat und Verfahren zu seinem Entwurf

Country Status (19)

Country Link
US (1) US5565881A (https=)
JP (1) JPH08510623A (https=)
CN (1) CN1039860C (https=)
AU (1) AU680737B2 (https=)
BR (1) BR9505784A (https=)
CA (1) CA2160024A1 (https=)
DE (1) DE19580361T1 (https=)
FI (1) FI955362L (https=)
FR (1) FR2717325B1 (https=)
GB (1) GB2293280B (https=)
HU (1) HU9503148D0 (https=)
IT (1) IT1277860B1 (https=)
MX (1) MXPA95001295A (https=)
RU (1) RU2143160C1 (https=)
SE (1) SE9503987L (https=)
SG (1) SG69951A1 (https=)
TW (1) TW256965B (https=)
WO (1) WO1995024744A1 (https=)
ZA (1) ZA95983B (https=)

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US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US5861853A (en) * 1997-05-07 1999-01-19 Motorola, Inc. Current balanced balun network with selectable port impedances
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
USH1959H1 (en) 1998-09-03 2001-05-01 Anthony Kikel Single balanced to dual unbalanced transformer
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6380821B1 (en) 2000-08-24 2002-04-30 International Business Machines Corporation Substrate shielded multilayer balun transformer
AU2001282546A1 (en) * 2000-08-31 2002-03-13 Matsushita Electric Industrial Co., Ltd. Built-in antenna for radio communication terminal
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
JP2005527823A (ja) 2002-05-23 2005-09-15 カスケード マイクロテック インコーポレイテッド デバイスのテスト用プローブ
US6819200B2 (en) * 2002-07-26 2004-11-16 Freescale Semiconductor, Inc. Broadband balun and impedance transformer for push-pull amplifiers
KR100517946B1 (ko) * 2002-08-13 2005-09-30 엘지전자 주식회사 밸룬 구조
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
JP2008502167A (ja) 2004-06-07 2008-01-24 カスケード マイクロテック インコーポレイテッド 熱光学チャック
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
DE202007018733U1 (de) 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
CN101512836A (zh) * 2006-09-06 2009-08-19 皇家飞利浦电子股份有限公司 用于受屏蔽装置的天线
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US8462061B2 (en) * 2008-03-26 2013-06-11 Dockon Ag Printed compound loop antenna
JP5104953B2 (ja) * 2008-08-18 2012-12-19 パナソニック株式会社 ノイズキャンセル装置とこれを用いたノイズキャンセルモジュールおよび電子機器
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
JP6023787B2 (ja) * 2011-03-28 2016-11-09 東京エレクトロン株式会社 イオンエネルギーアナライザ、イオンエネルギーアナライザを有する診断用ウエハ
US8654023B2 (en) 2011-09-02 2014-02-18 Dockon Ag Multi-layered multi-band antenna with parasitic radiator
EP2774216B1 (en) 2011-11-04 2021-05-05 Dockon AG Capacitively coupled compound loop antenna
US10630241B2 (en) 2018-08-23 2020-04-21 Nxp Usa, Inc. Amplifier with integrated directional coupler
FR3144710B1 (fr) * 2022-12-29 2025-09-19 Thales Sa Balun Rat-Race et procédé de réduction d'encombrement de Balun Rat-Race associé

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE846874C (de) * 1944-02-25 1952-08-18 Patelhold Patentverwertung Transformatorsystem mit Leitungscharakter
DE3238806C2 (de) * 1982-10-20 1985-06-20 Richard Hirschmann Radiotechnisches Werk, 7300 Esslingen Symmetriereinrichtung
GB2179801A (en) * 1985-08-31 1987-03-11 Plessey Co Plc Balun circuit

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
US3614676A (en) * 1969-08-15 1971-10-19 Sylvania Electric Prod Broadband impedance-matching transformer
US3678418A (en) * 1971-07-28 1972-07-18 Rca Corp Printed circuit balun
US3835421A (en) * 1972-12-14 1974-09-10 Rca Corp Microwave transmission line and devices using multiple coplanar conductors
US3846721A (en) * 1973-08-08 1974-11-05 Amp Inc Transmission line balun
US4260963A (en) * 1979-10-18 1981-04-07 Rockwell International Corporation 4:1 Balun
JPS59148405A (ja) * 1983-02-14 1984-08-25 Matsushita Electric Ind Co Ltd 平衡不平衡変換器
US4495505A (en) * 1983-05-10 1985-01-22 The United States Of America As Represented By The Secretary Of The Air Force Printed circuit balun with a dipole antenna
PL141094B1 (en) * 1983-12-09 1987-06-30 Polska Akad Nauk Centrum Microwave balun transformer,especially for mixers and modulators
FR2556508B1 (fr) * 1983-12-13 1987-12-18 Thomson Csf Symetriseur pour coupler une ligne dissymetrique a un element symetrique
US4737797A (en) * 1986-06-26 1988-04-12 Motorola, Inc. Microstrip balun-antenna apparatus
JP2737942B2 (ja) * 1988-08-22 1998-04-08 ソニー株式会社 受信機
US4980654A (en) * 1990-04-06 1990-12-25 Tektronix, Inc. Transmission line transformer
RU2020663C1 (ru) * 1991-05-20 1994-09-30 Гомельское конструкторское бюро "Луч" Симметрирующее устройство
US5304959A (en) * 1992-10-16 1994-04-19 Spectrian, Inc. Planar microstrip balun

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE846874C (de) * 1944-02-25 1952-08-18 Patelhold Patentverwertung Transformatorsystem mit Leitungscharakter
DE3238806C2 (de) * 1982-10-20 1985-06-20 Richard Hirschmann Radiotechnisches Werk, 7300 Esslingen Symmetriereinrichtung
GB2179801A (en) * 1985-08-31 1987-03-11 Plessey Co Plc Balun circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DE-B: Wolff, Ingo: "Einführung in die Microchip- Leitungstechnik, S. 130-136 *

Also Published As

Publication number Publication date
TW256965B (https=) 1995-09-11
ZA95983B (en) 1995-10-09
WO1995024744A1 (en) 1995-09-14
JPH08510623A (ja) 1996-11-05
CN1127571A (zh) 1996-07-24
FI955362A7 (fi) 1995-11-08
IT1277860B1 (it) 1997-11-12
ITRM950140A1 (it) 1996-09-08
HU9503148D0 (en) 1996-01-29
GB2293280B (en) 1998-10-21
ITRM950140A0 (it) 1995-03-08
BR9505784A (pt) 1996-03-05
GB2293280A (en) 1996-03-20
SE9503987L (sv) 1995-12-27
CN1039860C (zh) 1998-09-16
FR2717325B1 (fr) 1996-06-28
FR2717325A1 (fr) 1995-09-15
RU2143160C1 (ru) 1999-12-20
GB9522907D0 (en) 1996-01-10
MXPA95001295A (es) 2004-10-21
AU680737B2 (en) 1997-08-07
FI955362A0 (fi) 1995-11-08
CA2160024A1 (en) 1995-09-14
US5565881A (en) 1996-10-15
SE9503987D0 (sv) 1995-11-10
AU1832595A (en) 1995-09-25
SG69951A1 (en) 2000-01-25
FI955362L (fi) 1995-11-08

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8131 Rejection