DE1623141B2 - Verfahren und Anordnung zur Messung der Dicke von Aufdampfschichten - Google Patents

Verfahren und Anordnung zur Messung der Dicke von Aufdampfschichten

Info

Publication number
DE1623141B2
DE1623141B2 DE19671623141 DE1623141A DE1623141B2 DE 1623141 B2 DE1623141 B2 DE 1623141B2 DE 19671623141 DE19671623141 DE 19671623141 DE 1623141 A DE1623141 A DE 1623141A DE 1623141 B2 DE1623141 B2 DE 1623141B2
Authority
DE
Germany
Prior art keywords
vapor deposition
quartz
layer
thickness
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19671623141
Other languages
German (de)
English (en)
Other versions
DE1623141C (enrdf_load_stackoverflow
DE1623141A1 (de
Inventor
Hans Dr. Balzers Pulker (Liechtenstein). GOIc 5-00
Original Assignee
Balzers Hochvakuum Gmbh, 6000 Frankfurt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Balzers Hochvakuum Gmbh, 6000 Frankfurt filed Critical Balzers Hochvakuum Gmbh, 6000 Frankfurt
Publication of DE1623141A1 publication Critical patent/DE1623141A1/de
Publication of DE1623141B2 publication Critical patent/DE1623141B2/de
Application granted granted Critical
Publication of DE1623141C publication Critical patent/DE1623141C/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/063Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators
    • G01B7/066Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators for measuring thickness of coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/545Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/546Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G01B17/025Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
DE19671623141 1966-11-24 1967-10-18 Verfahren und Anordnung zur Messung der Dicke von Aufdampfschichten Granted DE1623141B2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH1701366 1966-11-24
CH1701366A CH440731A (de) 1966-11-24 1966-11-24 Verfahren und Anordnung zur Messung der Dicke von Aufdampfschichten
DEB0095004 1967-10-18

Publications (3)

Publication Number Publication Date
DE1623141A1 DE1623141A1 (de) 1971-02-04
DE1623141B2 true DE1623141B2 (de) 1972-10-12
DE1623141C DE1623141C (enrdf_load_stackoverflow) 1973-05-03

Family

ID=4422093

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19671623141 Granted DE1623141B2 (de) 1966-11-24 1967-10-18 Verfahren und Anordnung zur Messung der Dicke von Aufdampfschichten

Country Status (5)

Country Link
CH (1) CH440731A (enrdf_load_stackoverflow)
DE (1) DE1623141B2 (enrdf_load_stackoverflow)
FR (1) FR1558966A (enrdf_load_stackoverflow)
GB (1) GB1141435A (enrdf_load_stackoverflow)
NL (1) NL6702076A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH662421A5 (de) * 1983-07-13 1987-09-30 Suisse Horlogerie Rech Lab Piezoelektrischer kontaminationsdetektor.
CN113106411A (zh) * 2021-04-13 2021-07-13 京东方科技集团股份有限公司 一种镀膜检测装置、镀膜设备

Also Published As

Publication number Publication date
CH440731A (de) 1967-07-31
GB1141435A (en) 1969-01-29
DE1623141A1 (de) 1971-02-04
FR1558966A (enrdf_load_stackoverflow) 1969-03-07
NL6702076A (enrdf_load_stackoverflow) 1968-05-27

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
E77 Valid patent as to the heymanns-index 1977
8339 Ceased/non-payment of the annual fee