DE112022004779T5 - Halbleitervorrichtung - Google Patents

Halbleitervorrichtung Download PDF

Info

Publication number
DE112022004779T5
DE112022004779T5 DE112022004779.8T DE112022004779T DE112022004779T5 DE 112022004779 T5 DE112022004779 T5 DE 112022004779T5 DE 112022004779 T DE112022004779 T DE 112022004779T DE 112022004779 T5 DE112022004779 T5 DE 112022004779T5
Authority
DE
Germany
Prior art keywords
main surface
electrode
semiconductor device
insulating film
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112022004779.8T
Other languages
German (de)
English (en)
Inventor
Yuki Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Publication of DE112022004779T5 publication Critical patent/DE112022004779T5/de
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/69Insulating materials thereof
    • H10W70/695Organic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/128Anode regions of diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/129Cathode regions of diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/832Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
    • H10D62/8325Silicon carbide
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/60Schottky-barrier diodes 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers

Landscapes

  • Electrodes Of Semiconductors (AREA)
DE112022004779.8T 2021-11-05 2022-10-28 Halbleitervorrichtung Pending DE112022004779T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-181323 2021-11-05
JP2021181323 2021-11-05
PCT/JP2022/040504 WO2023080092A1 (ja) 2021-11-05 2022-10-28 半導体装置

Publications (1)

Publication Number Publication Date
DE112022004779T5 true DE112022004779T5 (de) 2024-09-05

Family

ID=86241149

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112022004779.8T Pending DE112022004779T5 (de) 2021-11-05 2022-10-28 Halbleitervorrichtung

Country Status (5)

Country Link
US (1) US20240274481A1 (https=)
JP (1) JPWO2023080092A1 (https=)
CN (1) CN118176576A (https=)
DE (1) DE112022004779T5 (https=)
WO (1) WO2023080092A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026004740A1 (ja) * 2024-06-27 2026-01-02 ローム株式会社 半導体装置および半導体モジュール
CN119486211B (zh) * 2025-01-13 2025-05-13 长飞先进半导体(武汉)有限公司 半导体器件及制备方法、功率模块、功率转换电路和车辆

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021181323A (ja) 2020-05-19 2021-11-25 株式会社古川製作所 粉体充填ホッパ及びその粉体充填ホッパの制御方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4386239B2 (ja) * 2003-03-12 2009-12-16 株式会社ルネサステクノロジ 半導体装置及びその製造方法
JP7038518B2 (ja) * 2017-10-11 2022-03-18 ローム株式会社 半導体装置
JP7530202B2 (ja) * 2019-05-23 2024-08-07 ローム株式会社 半導体装置
JP2020202313A (ja) * 2019-06-11 2020-12-17 ローム株式会社 半導体装置および半導体装置の製造方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021181323A (ja) 2020-05-19 2021-11-25 株式会社古川製作所 粉体充填ホッパ及びその粉体充填ホッパの制御方法

Also Published As

Publication number Publication date
WO2023080092A1 (ja) 2023-05-11
US20240274481A1 (en) 2024-08-15
CN118176576A (zh) 2024-06-11
JPWO2023080092A1 (https=) 2023-05-11

Similar Documents

Publication Publication Date Title
DE112018000517B4 (de) Halbleitervorrichtung
DE212019000118U1 (de) SiC-Halbleitervorrichtung
DE112021001606B4 (de) Elektronische komponente
DE112020001334T5 (de) SiC-HALBLEITERBAUTEIL
DE102007007142B4 (de) Nutzen, Halbleiterbauteil sowie Verfahren zu deren Herstellung
DE112022000168T5 (de) Halbleiterbauteil mit breiter bandlücke
DE112021002151B4 (de) Sic-halbleiterbauelement
DE112021002150B4 (de) Sic-halbleiterbauelement
DE112020003413T5 (de) Halbleiterbauteil
DE212019000150U1 (de) SiC-Halbleiterbauteil
DE112022004779T5 (de) Halbleitervorrichtung
DE212021000182U1 (de) Halbleiterbauelement
DE112020000717T5 (de) Halbleiterbauelement
DE102015111479B4 (de) Halbleitervorrichtung mit einer klemmstruktur
DE112022004626T5 (de) Halbleitervorrichtung
DE112021002247B4 (de) Halbleiterbauelement
DE112022004870T5 (de) Halbleitervorrichtung
DE112021001932T5 (de) SIC-Halbleiterbauelement
DE112022004775T5 (de) Verfahren zur Herstellung einer Halbleitervorrichtung
DE112022006632T5 (de) Halbleitervorrichtung
DE112021003938T9 (de) Halbleiterbauteil
DE112022004839T5 (de) Halbleitervorrichtung
DE112022004819T5 (de) Halbleitervorrichtung
DE112023004900T5 (de) Sic-halbleiterbauelement
DE112022004867T5 (de) Halbleiterbauelement

Legal Events

Date Code Title Description
R012 Request for examination validly filed
R079 Amendment of ipc main class

Free format text: PREVIOUS MAIN CLASS: H01L0023485000

Ipc: H10W0070600000