DE112012005182B4 - Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung - Google Patents

Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung Download PDF

Info

Publication number
DE112012005182B4
DE112012005182B4 DE112012005182.3T DE112012005182T DE112012005182B4 DE 112012005182 B4 DE112012005182 B4 DE 112012005182B4 DE 112012005182 T DE112012005182 T DE 112012005182T DE 112012005182 B4 DE112012005182 B4 DE 112012005182B4
Authority
DE
Germany
Prior art keywords
plasma
skimmer
getter
downstream
cone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112012005182.3T
Other languages
German (de)
English (en)
Other versions
DE112012005182T5 (de
Inventor
Alexander A. Makarov
Lothar Rottmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Fisher Scientific Bremen GmbH
Original Assignee
Thermo Fisher Scientific Bremen GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Fisher Scientific Bremen GmbH filed Critical Thermo Fisher Scientific Bremen GmbH
Publication of DE112012005182T5 publication Critical patent/DE112012005182T5/de
Application granted granted Critical
Publication of DE112012005182B4 publication Critical patent/DE112012005182B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495Vacuum locks; Valves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/067Ion lenses, apertures, skimmers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE112012005182.3T 2011-12-12 2012-12-12 Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung Active DE112012005182B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1121291.7 2011-12-12
GB1121291.7A GB2498174B (en) 2011-12-12 2011-12-12 Mass spectrometer vacuum interface method and apparatus
PCT/EP2012/075302 WO2013087732A1 (en) 2011-12-12 2012-12-12 Mass spectrometer vacuum interface method and apparatus

Publications (2)

Publication Number Publication Date
DE112012005182T5 DE112012005182T5 (de) 2014-08-28
DE112012005182B4 true DE112012005182B4 (de) 2021-01-21

Family

ID=45560286

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112012005182.3T Active DE112012005182B4 (de) 2011-12-12 2012-12-12 Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung

Country Status (8)

Country Link
US (1) US9697999B2 (enExample)
JP (1) JP6030662B2 (enExample)
CN (1) CN103988279A (enExample)
AU (1) AU2012351701B2 (enExample)
CA (1) CA2858459C (enExample)
DE (1) DE112012005182B4 (enExample)
GB (1) GB2498174B (enExample)
WO (1) WO2013087732A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2498173C (en) * 2011-12-12 2018-06-27 Thermo Fisher Scient Bremen Gmbh Mass spectrometer vacuum interface method and apparatus
US10446378B2 (en) * 2013-09-20 2019-10-15 Micromass Uk Limited Ion inlet assembly
EP3138117B1 (en) 2014-05-01 2019-11-13 PerkinElmer Health Sciences, Inc. Methods for detection and quantification of selenium and silicon in samples
CN104637773B (zh) * 2015-02-16 2017-03-01 江苏天瑞仪器股份有限公司 质谱仪一级真空结构
US10692692B2 (en) * 2015-05-27 2020-06-23 Kla-Tencor Corporation System and method for providing a clean environment in an electron-optical system
JP6048552B1 (ja) * 2015-08-21 2016-12-21 株式会社 イアス オンライン移送した分析試料の分析システム
DE102015122155B4 (de) 2015-12-17 2018-03-08 Jan-Christoph Wolf Verwendung einer Ionisierungsvorrichtung
EP3639289A2 (de) 2017-06-16 2020-04-22 Plasmion Gmbh Vorrichtung und verfahren zur ionisation eines analyten sowie vorrichtung und verfahren zur analyse eines ionisierten analyten
EP3474311A1 (en) 2017-10-20 2019-04-24 Tofwerk AG Ion molecule reactor
KR102133334B1 (ko) * 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기
KR102728997B1 (ko) * 2021-12-02 2024-11-13 영인에이스 주식회사 질량 분석기
CN114536480B (zh) * 2022-03-02 2023-05-23 重庆天荣日盛家居科技有限公司 多工位木质家居板材切割设备

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2293482A (en) * 1994-09-22 1996-03-27 Finnigan Mat Gmbh Ion-optical components, eg for mass spectrometers
US5756994A (en) * 1995-12-14 1998-05-26 Micromass Limited Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
JPH1125903A (ja) * 1997-07-04 1999-01-29 Agency Of Ind Science & Technol 金属−セラミック複合サンプラー及びスキマー
US20050194530A1 (en) * 2004-03-08 2005-09-08 Rohan Thakur Titanium ion transfer components for use in mass spectrometry
US7119330B2 (en) * 2002-03-08 2006-10-10 Varian Australia Pty Ltd Plasma mass spectrometer
US7230232B2 (en) * 1998-09-16 2007-06-12 Thermo Fisher Scientific (Bremen) Gmbh Means for removing unwanted ions from an ion transport system and mass spectrometer
US7872227B2 (en) * 2007-08-09 2011-01-18 Agilent Technologies, Inc. Mass spectrometer
US7915580B2 (en) * 2008-10-15 2011-03-29 Thermo Finnigan Llc Electro-dynamic or electro-static lens coupled to a stacked ring ion guide

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4341662A (en) 1980-04-11 1982-07-27 Pfefferle William C Method of catalytically coating low porosity ceramic surfaces
JPS6420669A (en) 1987-07-16 1989-01-24 Fujitsu Ltd Field-effect semiconductor device
JPH0542611Y2 (enExample) * 1987-07-29 1993-10-27
JPS6445049A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Mass spectrograph for secondary ion
US6703610B2 (en) * 2002-02-01 2004-03-09 Agilent Technologies, Inc. Skimmer for mass spectrometry
US7741600B2 (en) 2006-11-17 2010-06-22 Thermo Finnigan Llc Apparatus and method for providing ions to a mass analyzer
GB0908252D0 (en) * 2009-05-13 2009-06-24 Micromass Ltd Surface coating on sampling cone of mass spectrometer

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2293482A (en) * 1994-09-22 1996-03-27 Finnigan Mat Gmbh Ion-optical components, eg for mass spectrometers
US5756994A (en) * 1995-12-14 1998-05-26 Micromass Limited Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
JPH1125903A (ja) * 1997-07-04 1999-01-29 Agency Of Ind Science & Technol 金属−セラミック複合サンプラー及びスキマー
US7230232B2 (en) * 1998-09-16 2007-06-12 Thermo Fisher Scientific (Bremen) Gmbh Means for removing unwanted ions from an ion transport system and mass spectrometer
US7119330B2 (en) * 2002-03-08 2006-10-10 Varian Australia Pty Ltd Plasma mass spectrometer
US20050194530A1 (en) * 2004-03-08 2005-09-08 Rohan Thakur Titanium ion transfer components for use in mass spectrometry
US7872227B2 (en) * 2007-08-09 2011-01-18 Agilent Technologies, Inc. Mass spectrometer
US7915580B2 (en) * 2008-10-15 2011-03-29 Thermo Finnigan Llc Electro-dynamic or electro-static lens coupled to a stacked ring ion guide

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP H11-25903 A (Maschinenübersetzung), AIPN [online] JPO [abgerufen am 27.04.2016] *

Also Published As

Publication number Publication date
AU2012351701A1 (en) 2014-07-03
US20140331861A1 (en) 2014-11-13
AU2012351701B2 (en) 2015-10-29
DE112012005182T5 (de) 2014-08-28
GB2498174A (en) 2013-07-10
GB2498174B (en) 2016-06-29
CN103988279A (zh) 2014-08-13
CA2858459C (en) 2020-03-31
GB201121291D0 (en) 2012-01-25
JP2015502023A (ja) 2015-01-19
JP6030662B2 (ja) 2016-11-24
US9697999B2 (en) 2017-07-04
CA2858459A1 (en) 2013-06-20
WO2013087732A1 (en) 2013-06-20

Similar Documents

Publication Publication Date Title
DE112012005173B4 (de) Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung
DE112012005182B4 (de) Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung
DE19652021B4 (de) Ionen-Quelle und Ionisationsverfahren
DE112012005395T5 (de) Kollisionszellenmultipol
WO2020064201A1 (de) Massenspektrometer und verfahren zur massenspektrometrischen analyse eines gases
DE69522826T2 (de) Radiofrequenz-ionenquelle
DE102019133526B4 (de) Kühlplatte für icp-ms
DE102013009177B4 (de) Skimmertyp-Verbindungsstruktur
DE19655304B4 (de) Massenspektrometer und Verfahren zur Massenspektrometrie

Legal Events

Date Code Title Description
R012 Request for examination validly filed
R012 Request for examination validly filed

Effective date: 20141030

R016 Response to examination communication
R016 Response to examination communication
R082 Change of representative

Representative=s name: STELLBRINK & PARTNER PATENTANWAELTE MBB, DE

R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final