DE112004001619D2 - Verfahren zum Herstellen von Halbleiterchips - Google Patents

Verfahren zum Herstellen von Halbleiterchips

Info

Publication number
DE112004001619D2
DE112004001619D2 DE112004001619T DE112004001619T DE112004001619D2 DE 112004001619 D2 DE112004001619 D2 DE 112004001619D2 DE 112004001619 T DE112004001619 T DE 112004001619T DE 112004001619 T DE112004001619 T DE 112004001619T DE 112004001619 D2 DE112004001619 D2 DE 112004001619D2
Authority
DE
Germany
Prior art keywords
semiconductor chips
producing semiconductor
producing
chips
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE112004001619T
Other languages
English (en)
Inventor
Georg Bruederl
Berthold Hahn
Volker Haerle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams Osram International GmbH
Original Assignee
Osram Opto Semiconductors GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors GmbH filed Critical Osram Opto Semiconductors GmbH
Publication of DE112004001619D2 publication Critical patent/DE112004001619D2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/40Removing material taking account of the properties of the material involved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/50Working by transmitting the laser beam through or within the workpiece
    • B23K26/53Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/50Working by transmitting the laser beam through or within the workpiece
    • B23K26/57Working by transmitting the laser beam through or within the workpiece the laser beam entering a face of the workpiece from which it is transmitted through the workpiece material to work on a different workpiece face, e.g. for effecting removal, fusion splicing, modifying or reforming
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76251Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
    • H01L21/76254Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques with separation/delamination along an ion implanted layer, e.g. Smart-cut, Unibond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0093Wafer bonding; Removal of the growth substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/028Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/16Composite materials, e.g. fibre reinforced
    • B23K2103/166Multilayered materials
    • B23K2103/172Multilayered materials wherein at least one of the layers is non-metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
DE112004001619T 2003-06-24 2004-06-24 Verfahren zum Herstellen von Halbleiterchips Expired - Fee Related DE112004001619D2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10328543 2003-06-24
PCT/DE2004/001329 WO2005004231A1 (de) 2003-06-24 2004-06-24 Verfahren zum herstellen von halbleiterchips

Publications (1)

Publication Number Publication Date
DE112004001619D2 true DE112004001619D2 (de) 2006-08-10

Family

ID=33559742

Family Applications (2)

Application Number Title Priority Date Filing Date
DE112004001619T Expired - Fee Related DE112004001619D2 (de) 2003-06-24 2004-06-24 Verfahren zum Herstellen von Halbleiterchips
DE102004030603A Ceased DE102004030603A1 (de) 2003-06-24 2004-06-24 Verfahren zum Herstellen von Halbleiterchips

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE102004030603A Ceased DE102004030603A1 (de) 2003-06-24 2004-06-24 Verfahren zum Herstellen von Halbleiterchips

Country Status (8)

Country Link
US (1) US7329587B2 (de)
EP (1) EP1636836A1 (de)
JP (1) JP5021302B2 (de)
KR (1) KR101178361B1 (de)
CN (1) CN100492610C (de)
DE (2) DE112004001619D2 (de)
TW (1) TWI240434B (de)
WO (1) WO2005004231A1 (de)

Families Citing this family (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7098589B2 (en) 2003-04-15 2006-08-29 Luminus Devices, Inc. Light emitting devices with high light collimation
US7211831B2 (en) 2003-04-15 2007-05-01 Luminus Devices, Inc. Light emitting device with patterned surfaces
US7667238B2 (en) 2003-04-15 2010-02-23 Luminus Devices, Inc. Light emitting devices for liquid crystal displays
US7083993B2 (en) 2003-04-15 2006-08-01 Luminus Devices, Inc. Methods of making multi-layer light emitting devices
US7166871B2 (en) 2003-04-15 2007-01-23 Luminus Devices, Inc. Light emitting systems
US7417266B1 (en) 2004-06-10 2008-08-26 Qspeed Semiconductor Inc. MOSFET having a JFET embedded as a body diode
DE102004062290A1 (de) 2004-12-23 2006-07-06 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines Halbleiterchips
EP1681712A1 (de) 2005-01-13 2006-07-19 S.O.I. Tec Silicon on Insulator Technologies S.A. Verfahren zur Herstellung von Substraten für Optoelektronischen Anwendungen
US20070045640A1 (en) 2005-08-23 2007-03-01 Erchak Alexei A Light emitting devices for liquid crystal displays
KR101166922B1 (ko) * 2005-05-27 2012-07-19 엘지이노텍 주식회사 발광 다이오드의 제조 방법
US7608471B2 (en) * 2005-08-09 2009-10-27 Avago Technologies General Ip (Singapore) Pte. Ltd. Method and apparatus for integrating III-V semiconductor devices into silicon processes
DE102005061346A1 (de) 2005-09-30 2007-04-05 Osram Opto Semiconductors Gmbh Optoelektronischer Halbleiterchip
US7772604B2 (en) 2006-01-05 2010-08-10 Illumitex Separate optical device for directing light from an LED
DE102006007293B4 (de) * 2006-01-31 2023-04-06 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zum Herstellen eines Quasi-Substratwafers und ein unter Verwendung eines solchen Quasi-Substratwafers hergestellter Halbleiterkörper
KR101259991B1 (ko) 2006-03-24 2013-05-06 서울옵토디바이스주식회사 화합물 반도체 소자 제조 방법
DE102006061167A1 (de) 2006-04-25 2007-12-20 Osram Opto Semiconductors Gmbh Optoelektronisches Halbleiterbauelement
US7885306B2 (en) 2006-06-30 2011-02-08 Osram Opto Semiconductors Gmbh Edge-emitting semiconductor laser chip
DE102006060410A1 (de) * 2006-06-30 2008-01-03 Osram Opto Semiconductors Gmbh Kantenemittierender Halbleiterlaserchip
JP5003033B2 (ja) 2006-06-30 2012-08-15 住友電気工業株式会社 GaN薄膜貼り合わせ基板およびその製造方法、ならびにGaN系半導体デバイスおよびその製造方法
DE102006032488B4 (de) * 2006-07-13 2008-09-25 Infineon Technologies Ag Verfahren zur Bearbeitung von Wafern
US20090275266A1 (en) * 2006-10-02 2009-11-05 Illumitex, Inc. Optical device polishing
JP2010506402A (ja) 2006-10-02 2010-02-25 イルミテックス, インコーポレイテッド Ledのシステムおよび方法
DE102007030129A1 (de) * 2007-06-29 2009-01-02 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung einer Mehrzahl optoelektronischer Bauelemente und optoelektronisches Bauelement
US7829358B2 (en) * 2008-02-08 2010-11-09 Illumitex, Inc. System and method for emitter layer shaping
DE102008009108A1 (de) * 2008-02-14 2009-08-20 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines Halbleiterlasers sowie Halbleiterlaser
CN102106001B (zh) * 2008-04-02 2014-02-12 宋俊午 发光器件及其制造方法
KR101458901B1 (ko) 2008-04-29 2014-11-10 삼성디스플레이 주식회사 가요성 표시 장치의 제조 방법
US8182633B2 (en) 2008-04-29 2012-05-22 Samsung Electronics Co., Ltd. Method of fabricating a flexible display device
KR100969159B1 (ko) * 2008-07-09 2010-07-08 주식회사 실트론 질화물 반도체 기판의 제조 방법
TW201034256A (en) * 2008-12-11 2010-09-16 Illumitex Inc Systems and methods for packaging light-emitting diode devices
JP2010165927A (ja) * 2009-01-16 2010-07-29 Sumitomo Electric Ind Ltd 発光素子用基板
TWI396307B (zh) * 2009-02-05 2013-05-11 Huga Optotech Inc 發光二極體
US8198172B2 (en) * 2009-02-25 2012-06-12 Micron Technology, Inc. Methods of forming integrated circuits using donor and acceptor substrates
US8449128B2 (en) * 2009-08-20 2013-05-28 Illumitex, Inc. System and method for a lens and phosphor layer
US8585253B2 (en) 2009-08-20 2013-11-19 Illumitex, Inc. System and method for color mixing lens array
WO2011069242A1 (en) * 2009-12-09 2011-06-16 Cooledge Lighting Inc. Semiconductor dice transfer-enabling apparatus and method for manufacturing transfer-enabling apparatus
US20110151588A1 (en) * 2009-12-17 2011-06-23 Cooledge Lighting, Inc. Method and magnetic transfer stamp for transferring semiconductor dice using magnetic transfer printing techniques
US8334152B2 (en) * 2009-12-18 2012-12-18 Cooledge Lighting, Inc. Method of manufacturing transferable elements incorporating radiation enabled lift off for allowing transfer from host substrate
FR2967813B1 (fr) 2010-11-18 2013-10-04 Soitec Silicon On Insulator Procédé de réalisation d'une structure a couche métallique enterrée
US8993372B2 (en) * 2011-03-01 2015-03-31 Infineon Technologies Austria Ag Method for producing a semiconductor component
DE102011015725B4 (de) * 2011-03-31 2022-10-06 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zum Vereinzeln eines Bauelementverbunds
JP2012230969A (ja) * 2011-04-25 2012-11-22 Sumitomo Electric Ind Ltd GaN系半導体デバイスの製造方法
DE102011113775B9 (de) 2011-09-19 2021-10-21 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung eines optoelektronischen Bauelements
US8633094B2 (en) 2011-12-01 2014-01-21 Power Integrations, Inc. GaN high voltage HFET with passivation plus gate dielectric multilayer structure
US8940620B2 (en) * 2011-12-15 2015-01-27 Power Integrations, Inc. Composite wafer for fabrication of semiconductor devices
KR101847941B1 (ko) 2012-02-08 2018-04-11 삼성전자주식회사 반도체 발광소자 및 그 제조방법
JP6024239B2 (ja) * 2012-06-29 2016-11-09 株式会社豊田自動織機 半導体装置の製造方法
DE102012111358A1 (de) * 2012-11-23 2014-05-28 Osram Opto Semiconductors Gmbh Verfahren zum Vereinzeln eines Verbundes in Halbleiterchips und Halbleiterchip
DE102013100711B4 (de) * 2013-01-24 2021-07-01 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung einer Vielzahl optoelektronischer Bauelemente
US8928037B2 (en) 2013-02-28 2015-01-06 Power Integrations, Inc. Heterostructure power transistor with AlSiN passivation layer
DE102014116276A1 (de) * 2014-11-07 2016-05-12 Osram Opto Semiconductors Gmbh Epitaxie-Wafer, Bauelement und Verfahren zur Herstellung eines Epitaxie-Wafers und eines Bauelements
DE102015100686A1 (de) * 2015-01-19 2016-07-21 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung einer Mehrzahl von Halbleiterchips und Halbleiterchip
DE102015107590A1 (de) * 2015-05-13 2016-11-17 Osram Opto Semiconductors Gmbh Verfahren zur Verspiegelung von Mantelflächen von optischen Bauelementen für die Verwendung in optoelektronischen Halbleiterkörpern und oberflächenmontierbarer optoelektronischer Halbleiterkörper
US10014271B2 (en) * 2015-11-20 2018-07-03 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor structure and method of manufacturing the same
DE102015121056A1 (de) 2015-12-03 2017-06-08 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung einer Mehrzahl von Bauelementen und Bauelement
DE102017205635A1 (de) 2017-04-03 2018-10-04 3D-Micromac Ag Verfahren und Fertigungssystem zur Herstellung mikroelektronischer Komponenten mit Schichtaufbau
DE102018104785A1 (de) 2018-03-02 2019-09-05 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung einer Mehrzahl von transferierbaren Bauteilen und Bauteilverbund aus Bauteilen
US11145786B2 (en) 2018-09-11 2021-10-12 Facebook Technologies, Llc Methods for wafer-to-wafer bonding
US11056611B2 (en) 2018-09-11 2021-07-06 Facebook Technologies, Llc Mesa formation for wafer-to-wafer bonding
US11342479B2 (en) 2018-09-11 2022-05-24 Facebook Technologies, Llc Reducing bowing of materials before wafer-to-wafer bonding for LED manufacturing
KR102601702B1 (ko) * 2022-10-31 2023-11-13 웨이브로드 주식회사 반도체 성장용 템플릿을 이용한 반도체 발광 소자 제조 방법
KR102649711B1 (ko) * 2022-12-02 2024-03-20 웨이브로드 주식회사 초박형 반도체 다이의 제조 방법

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2681472B1 (fr) 1991-09-18 1993-10-29 Commissariat Energie Atomique Procede de fabrication de films minces de materiau semiconducteur.
JP3409958B2 (ja) 1995-12-15 2003-05-26 株式会社東芝 半導体発光素子
FR2747506B1 (fr) 1996-04-11 1998-05-15 Commissariat Energie Atomique Procede d'obtention d'un film mince de materiau semiconducteur comprenant notamment des composants electroniques
DE19640594B4 (de) 1996-10-01 2016-08-04 Osram Gmbh Bauelement
US6033974A (en) 1997-05-12 2000-03-07 Silicon Genesis Corporation Method for controlled cleaving process
DE19959182A1 (de) 1999-12-08 2001-06-28 Max Planck Gesellschaft Verfahren zum Herstellen eines optoelektronischen Bauelements
DE10051465A1 (de) * 2000-10-17 2002-05-02 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines Halbleiterbauelements auf GaN-Basis
JP3910010B2 (ja) 2000-09-12 2007-04-25 エス ケー シー 株式會社 有機電界発光素子
FR2816445B1 (fr) * 2000-11-06 2003-07-25 Commissariat Energie Atomique Procede de fabrication d'une structure empilee comprenant une couche mince adherant a un substrat cible
FR2817394B1 (fr) 2000-11-27 2003-10-31 Soitec Silicon On Insulator Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede
EP1244139A2 (de) * 2001-03-23 2002-09-25 Matsushita Electric Industrial Co., Ltd. Verfahren zur Herstellung eines Halbleiterfilms
US7932111B2 (en) * 2005-02-23 2011-04-26 Cree, Inc. Substrate removal process for high light extraction LEDs
US7341878B2 (en) * 2005-03-14 2008-03-11 Philips Lumileds Lighting Company, Llc Wavelength-converted semiconductor light emitting device

Also Published As

Publication number Publication date
CN1813347A (zh) 2006-08-02
DE102004030603A1 (de) 2005-02-10
EP1636836A1 (de) 2006-03-22
US7329587B2 (en) 2008-02-12
KR101178361B1 (ko) 2012-08-29
JP5021302B2 (ja) 2012-09-05
TWI240434B (en) 2005-09-21
WO2005004231A1 (de) 2005-01-13
US20060211159A1 (en) 2006-09-21
TW200501462A (en) 2005-01-01
KR20060061305A (ko) 2006-06-07
CN100492610C (zh) 2009-05-27
JP2007524224A (ja) 2007-08-23

Similar Documents

Publication Publication Date Title
DE112004001619D2 (de) Verfahren zum Herstellen von Halbleiterchips
DE602004020428D1 (de) Verfahren zum Herstellen von Kondensatoren
DE50307242D1 (de) Verfahren zum herstellen von einkristallinen strukturen
DE502005010452D1 (de) Verfahren zum montieren von halbleiterchips und entsprechende halbleiterchipanordnung
DE112004002809A5 (de) Verfahren zum Herstellen eines strahlungsemittierenden Halbleiterchips
DE502004006867D1 (de) Integrierter halbleiterspeicher und verfahren zum herstellen eines integrierten halbleiterspeichers
DE502006006827D1 (de) Verfahren zum Verkleben von Werkstücken
DE50211265D1 (de) Verfahren zum Herstellen von Zigarettenpackungen
ATA3482002A (de) Verfahren zum nassbehandeln von scheibenförmigen gegenständen
DE502004003972D1 (de) Verfahren zum fräsen von freiformflächen
DE102004028331A8 (de) Verfahren zum Kristallisieren von Silicium
DE602004029913D1 (de) Verfahren zum waschen von festen körnern
DE60207938T2 (de) Verfahren zum Herstellen von wiederverschliessbaren Kunststoffbeuteln
DE502004008042D1 (de) Verfahren zum umformen von blechen
DE112004000431T8 (de) Verfahren zum Herstellen von Ventileinstellungsanordnungen
DE602004022156D1 (de) Verfahren zum verbinden von strickwaren
DE502004011660D1 (de) Verfahren zum fräsen von freiformflächen
DE50310109D1 (de) Verfahren zum einfärben von düngemitteln
DE602004015519D1 (de) Verfahren zum Herstellen von Foliemehrfachpackungen
DE59914127D1 (de) Verfahren zum herstellen von halbleiterbauelementen
DE60305856D1 (de) Verfahren zum Schneiden von Halbleiterwafern
DE50313537D1 (de) Verfahren zum Herstellen von konischen Filterelementen
ATE292557T1 (de) Verfahren zum herstellen von kunststoffbeuteln
DE60306069D1 (de) Verfahren zum Herstellen von Polarisationsfolien
DE50115563D1 (de) Verfahren zum Verschleifen von Maschen

Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee