DE10348327B4 - Systeme und Verfahren zum Einbringen von Test-Jitter in Daten-Bit-Ströme - Google Patents
Systeme und Verfahren zum Einbringen von Test-Jitter in Daten-Bit-Ströme Download PDFInfo
- Publication number
- DE10348327B4 DE10348327B4 DE10348327A DE10348327A DE10348327B4 DE 10348327 B4 DE10348327 B4 DE 10348327B4 DE 10348327 A DE10348327 A DE 10348327A DE 10348327 A DE10348327 A DE 10348327A DE 10348327 B4 DE10348327 B4 DE 10348327B4
- Authority
- DE
- Germany
- Prior art keywords
- jitter
- voltage
- test
- output signal
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 35
- 238000000034 method Methods 0.000 title claims abstract description 32
- 230000004044 response Effects 0.000 claims abstract description 9
- 239000003990 capacitor Substances 0.000 claims description 27
- 239000000872 buffer Substances 0.000 claims description 11
- 230000001419 dependent effect Effects 0.000 claims description 10
- 238000007599 discharging Methods 0.000 claims description 5
- 238000004891 communication Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000012085 test solution Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/24—Testing correct operation
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
- H04L25/0264—Arrangements for coupling to transmission lines
- H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Dc Digital Transmission (AREA)
- Electronic Switches (AREA)
- Manipulation Of Pulses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/360159 | 2003-02-06 | ||
| US10/360,159 US7184469B2 (en) | 2003-02-06 | 2003-02-06 | Systems and methods for injection of test jitter in data bit-streams |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE10348327A1 DE10348327A1 (de) | 2004-08-26 |
| DE10348327B4 true DE10348327B4 (de) | 2009-06-25 |
Family
ID=32771369
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10348327A Expired - Fee Related DE10348327B4 (de) | 2003-02-06 | 2003-10-17 | Systeme und Verfahren zum Einbringen von Test-Jitter in Daten-Bit-Ströme |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7184469B2 (https=) |
| JP (1) | JP4410574B2 (https=) |
| DE (1) | DE10348327B4 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7315574B2 (en) * | 2004-05-03 | 2008-01-01 | Dft Microsystems, Inc. | System and method for generating a jittered test signal |
| US7480329B2 (en) * | 2004-10-29 | 2009-01-20 | Agilent Technologies, Inc. | Method of finding data dependent timing and voltage jitter for different bits in an arbitrary digital signal in accordance with selected surrounding bits |
| US7369605B2 (en) * | 2004-12-15 | 2008-05-06 | Spirent Communications | Method and device for injecting a differential current noise signal into a paired wire communication link |
| JP4806679B2 (ja) * | 2005-06-01 | 2011-11-02 | 株式会社アドバンテスト | ジッタ発生回路 |
| JP4384207B2 (ja) * | 2007-06-29 | 2009-12-16 | 株式会社東芝 | 半導体集積回路 |
| US8194721B2 (en) * | 2008-05-23 | 2012-06-05 | Integrated Device Technology, Inc | Signal amplitude distortion within an integrated circuit |
| US8179952B2 (en) * | 2008-05-23 | 2012-05-15 | Integrated Device Technology Inc. | Programmable duty cycle distortion generation circuit |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3325730A (en) * | 1963-12-23 | 1967-06-13 | Hughes Aircraft Co | Pulse time jitter measuring system |
| US3937945A (en) * | 1974-06-25 | 1976-02-10 | The United States Of America As Represented By The United States National Aeronautics And Space Administration Office Of General Counsel-Code Gp | Apparatus for simulating optical transmission links |
| EP1162739A1 (en) * | 2001-04-03 | 2001-12-12 | Agilent Technologies, Inc. (a Delaware corporation) | Filter injecting data dependent jitter and level noise |
| US6466072B1 (en) * | 1998-03-30 | 2002-10-15 | Cypress Semiconductor Corp. | Integrated circuitry for display generation |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6847232B2 (en) * | 2001-11-08 | 2005-01-25 | Texas Instruments Incorporated | Interchangeable CML/LVDS data transmission circuit |
| US6958640B2 (en) * | 2003-12-31 | 2005-10-25 | Intel Corporation | Interpolation delay cell for 2ps resolution jitter injector in optical link transceiver |
-
2003
- 2003-02-06 US US10/360,159 patent/US7184469B2/en not_active Expired - Lifetime
- 2003-10-17 DE DE10348327A patent/DE10348327B4/de not_active Expired - Fee Related
-
2004
- 2004-02-02 JP JP2004025173A patent/JP4410574B2/ja not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3325730A (en) * | 1963-12-23 | 1967-06-13 | Hughes Aircraft Co | Pulse time jitter measuring system |
| US3937945A (en) * | 1974-06-25 | 1976-02-10 | The United States Of America As Represented By The United States National Aeronautics And Space Administration Office Of General Counsel-Code Gp | Apparatus for simulating optical transmission links |
| US6466072B1 (en) * | 1998-03-30 | 2002-10-15 | Cypress Semiconductor Corp. | Integrated circuitry for display generation |
| EP1162739A1 (en) * | 2001-04-03 | 2001-12-12 | Agilent Technologies, Inc. (a Delaware corporation) | Filter injecting data dependent jitter and level noise |
Also Published As
| Publication number | Publication date |
|---|---|
| DE10348327A1 (de) | 2004-08-26 |
| US20040156429A1 (en) | 2004-08-12 |
| JP4410574B2 (ja) | 2010-02-03 |
| US7184469B2 (en) | 2007-02-27 |
| JP2004242304A (ja) | 2004-08-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8127 | New person/name/address of the applicant |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |
|
| 8364 | No opposition during term of opposition | ||
| R082 | Change of representative |
Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PAR, DE Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PARTNER |
|
| R081 | Change of applicant/patentee |
Owner name: ADVANTEST (SINGAPORE) PTE. LTD., SG Free format text: FORMER OWNER: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG Effective date: 20120515 |
|
| R082 | Change of representative |
Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER, SCHE, DE Effective date: 20120515 Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PAR, DE Effective date: 20120515 |
|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |