DE10297170T5 - Einheitlicher Rahmen für ein Handhabungssystem für Halbleitermaterial - Google Patents
Einheitlicher Rahmen für ein Handhabungssystem für Halbleitermaterial Download PDFInfo
- Publication number
- DE10297170T5 DE10297170T5 DE10297170T DE10297170T DE10297170T5 DE 10297170 T5 DE10297170 T5 DE 10297170T5 DE 10297170 T DE10297170 T DE 10297170T DE 10297170 T DE10297170 T DE 10297170T DE 10297170 T5 DE10297170 T5 DE 10297170T5
- Authority
- DE
- Germany
- Prior art keywords
- wafer
- components
- vertical strut
- machine
- attached
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 17
- 239000000463 material Substances 0.000 title description 18
- 238000003860 storage Methods 0.000 claims description 14
- 235000012431 wafers Nutrition 0.000 description 336
- 239000012636 effector Substances 0.000 description 77
- 238000012545 processing Methods 0.000 description 58
- 238000003754 machining Methods 0.000 description 26
- 230000007246 mechanism Effects 0.000 description 25
- 239000002245 particle Substances 0.000 description 24
- 238000004519 manufacturing process Methods 0.000 description 22
- 238000012546 transfer Methods 0.000 description 22
- 230000008878 coupling Effects 0.000 description 19
- 238000010168 coupling process Methods 0.000 description 19
- 238000005859 coupling reaction Methods 0.000 description 19
- 230000008901 benefit Effects 0.000 description 16
- 229910052751 metal Inorganic materials 0.000 description 14
- 239000002184 metal Substances 0.000 description 14
- 238000012423 maintenance Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 11
- 230000006870 function Effects 0.000 description 10
- 238000002955 isolation Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 8
- 238000010276 construction Methods 0.000 description 7
- 238000009413 insulation Methods 0.000 description 7
- 101000873785 Homo sapiens mRNA-decapping enzyme 1A Proteins 0.000 description 6
- 102100035856 mRNA-decapping enzyme 1A Human genes 0.000 description 6
- 238000001914 filtration Methods 0.000 description 5
- 230000032258 transport Effects 0.000 description 5
- 239000000969 carrier Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 238000009423 ventilation Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 238000007514 turning Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- -1 but not limited to Substances 0.000 description 2
- 230000003749 cleanliness Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 238000003032 molecular docking Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910000746 Structural steel Inorganic materials 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000002537 cosmetic Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 238000013024 troubleshooting Methods 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Packaging Frangible Articles (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US31672201P | 2001-08-31 | 2001-08-31 | |
| US60/316722 | 2001-08-31 | ||
| US10/087,638 US7100340B2 (en) | 2001-08-31 | 2002-03-01 | Unified frame for semiconductor material handling system |
| US10/087638 | 2002-03-01 | ||
| PCT/US2002/030297 WO2003019630A2 (en) | 2001-08-31 | 2002-08-30 | Unified frame for semiconductor material handling system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10297170T5 true DE10297170T5 (de) | 2004-07-29 |
Family
ID=26777219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10297170T Withdrawn DE10297170T5 (de) | 2001-08-31 | 2002-08-30 | Einheitlicher Rahmen für ein Handhabungssystem für Halbleitermaterial |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7100340B2 (enExample) |
| JP (1) | JP4309263B2 (enExample) |
| KR (1) | KR100809107B1 (enExample) |
| CN (1) | CN100359634C (enExample) |
| DE (1) | DE10297170T5 (enExample) |
| WO (1) | WO2003019630A2 (enExample) |
Families Citing this family (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6206913B1 (en) * | 1998-08-12 | 2001-03-27 | Vascular Innovations, Inc. | Method and system for attaching a graft to a blood vessel |
| US20030031538A1 (en) * | 2001-06-30 | 2003-02-13 | Applied Materials, Inc. | Datum plate for use in installations of substrate handling systems |
| US7084466B1 (en) * | 2002-12-09 | 2006-08-01 | Novellus Systems, Inc. | Liquid detection end effector sensor and method of using the same |
| TW200520049A (en) * | 2003-10-21 | 2005-06-16 | Nikon Corp | Environment-controlling apparatus, device-producing apparatus, device-producing method, and exposure apparatus |
| GB2415291B (en) * | 2004-06-15 | 2008-08-13 | Nanobeam Ltd | Charged particle beam system |
| US7607879B2 (en) * | 2004-06-15 | 2009-10-27 | Brooks Automation, Inc. | Substrate processing apparatus with removable component module |
| US7578650B2 (en) * | 2004-07-29 | 2009-08-25 | Kla-Tencor Technologies Corporation | Quick swap load port |
| US7375490B2 (en) * | 2004-09-14 | 2008-05-20 | Siemens Energy & Automation, Inc. | Methods for managing electrical power |
| US7622884B2 (en) * | 2004-09-14 | 2009-11-24 | Siemens Industry, Inc. | Methods for managing electrical power |
| JP4579723B2 (ja) * | 2005-03-07 | 2010-11-10 | 川崎重工業株式会社 | 搬送系ユニットおよび分割体 |
| US9457442B2 (en) * | 2005-06-18 | 2016-10-04 | Futrfab, Inc. | Method and apparatus to support process tool modules in a cleanspace fabricator |
| US7604449B1 (en) * | 2005-06-27 | 2009-10-20 | Kla-Tencor Technologies Corporation | Equipment front end module |
| US8821099B2 (en) | 2005-07-11 | 2014-09-02 | Brooks Automation, Inc. | Load port module |
| US7637708B2 (en) * | 2006-01-09 | 2009-12-29 | Sumco Corporation | Production system for wafer |
| KR100832772B1 (ko) * | 2006-05-22 | 2008-05-27 | 주식회사 나온테크 | 반도체이송장비 |
| JP4606388B2 (ja) * | 2006-06-12 | 2011-01-05 | 川崎重工業株式会社 | 基板移載装置の搬送系ユニット |
| US8021513B2 (en) * | 2006-08-23 | 2011-09-20 | Tokyo Electron Limited | Substrate carrying apparatus and substrate carrying method |
| US7690881B2 (en) * | 2006-08-30 | 2010-04-06 | Asm Japan K.K. | Substrate-processing apparatus with buffer mechanism and substrate-transferring apparatus |
| US9117859B2 (en) | 2006-08-31 | 2015-08-25 | Brooks Automation, Inc. | Compact processing apparatus |
| US7934898B2 (en) * | 2007-07-16 | 2011-05-03 | Semitool, Inc. | High throughput semiconductor wafer processing |
| TWI379748B (en) * | 2007-07-20 | 2012-12-21 | Applied Materials Inc | Dual-mode robot systems,substrate transfer apparatus and methods for electronic device manufacturing, and method of calibrating |
| JP5185853B2 (ja) * | 2009-02-16 | 2013-04-17 | アテル株式会社 | 基板搬送装置 |
| JP5603030B2 (ja) * | 2009-06-23 | 2014-10-08 | Dmg森精機株式会社 | 加工機械の温度制御装置 |
| JP5445015B2 (ja) | 2009-10-14 | 2014-03-19 | シンフォニアテクノロジー株式会社 | キャリア移載促進装置 |
| JP5952526B2 (ja) * | 2011-02-04 | 2016-07-13 | 株式会社ダイヘン | ワーク搬送システム |
| US9545724B2 (en) * | 2013-03-14 | 2017-01-17 | Brooks Automation, Inc. | Tray engine with slide attached to an end effector base |
| CN103824794B (zh) * | 2014-03-07 | 2016-09-28 | 上海华虹宏力半导体制造有限公司 | 用于控制smif和机台的控制装置、运输装置 |
| KR101593386B1 (ko) | 2014-09-01 | 2016-02-15 | 로체 시스템즈(주) | 퍼지 모듈 및 이를 포함하는 로드 포트 |
| EP3016136B1 (en) * | 2014-10-27 | 2021-07-21 | Robert Bosch GmbH | Transport system with magnetically driven transport elements and according transportation method |
| US10177020B2 (en) | 2015-02-07 | 2019-01-08 | Kla-Tencor Corporation | System and method for high throughput work-in-process buffer |
| KR101852323B1 (ko) * | 2016-07-05 | 2018-04-26 | 로체 시스템즈(주) | 퍼지 모듈 지그 및 이를 포함한 퍼지 모듈 |
| US10541165B2 (en) | 2016-11-10 | 2020-01-21 | Applied Materials, Inc. | Systems, apparatus, and methods for an improved load port backplane |
| CN109065470B (zh) * | 2018-06-20 | 2024-03-19 | 常州瑞赛环保科技有限公司 | 光伏板研磨分离装置 |
| US10784136B2 (en) | 2018-07-27 | 2020-09-22 | Onto Innovation Inc. | FOUP purge shield |
| US10533852B1 (en) * | 2018-09-27 | 2020-01-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Leveling sensor, load port including the same, and method of leveling a load port |
| CN109212703B (zh) * | 2018-11-06 | 2023-04-18 | 中国工程物理研究院激光聚变研究中心 | 用于光学元件离线精密装校的自洁净型自动化夹具库 |
| US11527425B2 (en) * | 2019-12-31 | 2022-12-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Systems and methods for tray cassette warehousing |
| TWI705516B (zh) * | 2020-01-22 | 2020-09-21 | 迅得機械股份有限公司 | 晶圓盒移載裝置 |
| CN114242632A (zh) * | 2020-06-28 | 2022-03-25 | 上海果纳半导体技术有限公司 | 半导体设备的载入装置以及半导体设备 |
| US12076854B2 (en) * | 2021-03-18 | 2024-09-03 | Applied Materials, Inc. | Increased number of load ports on factory interface with robot that moves on track |
| JP2023082554A (ja) * | 2021-12-02 | 2023-06-14 | 株式会社東京精密 | 筐体及びプローバ |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US87400A (en) * | 1869-03-02 | Gultivatoe | ||
| US115414A (en) * | 1871-05-30 | Improvement in sand-papering machines | ||
| US87092A (en) * | 1869-02-23 | Improvement in saw-teeth | ||
| US729463A (en) * | 1902-12-31 | 1903-05-26 | Emile F Weidig | Lantern. |
| DE4207341C1 (enExample) * | 1992-03-09 | 1993-07-15 | Acr Automation In Cleanroom Gmbh, 7732 Niedereschach, De | |
| JP3089153B2 (ja) * | 1993-12-13 | 2000-09-18 | 信越化学工業株式会社 | リソグラフィー用ペリクル |
| US5613821A (en) * | 1995-07-06 | 1997-03-25 | Brooks Automation, Inc. | Cluster tool batchloader of substrate carrier |
| KR200143675Y1 (ko) * | 1996-07-25 | 1999-06-15 | 윤종용 | 반도체 포토설비의 공기 순환장치 |
| US6138721A (en) * | 1997-09-03 | 2000-10-31 | Asyst Technologies, Inc. | Tilt and go load port interface alignment system |
| WO1999028952A2 (en) * | 1997-11-28 | 1999-06-10 | Fortrend Engineering Corporation | Wafer-mapping load port interface |
| JPH11220001A (ja) | 1998-01-30 | 1999-08-10 | Hitachi Ltd | 半導体基板処理装置におけるロードポート及びロードポート搬送台車 |
| US6050891A (en) * | 1998-02-06 | 2000-04-18 | Applied Materials, Inc. | Vacuum processing system with turbo-axial fan in clean-air supply system of front end environment |
| US6220808B1 (en) * | 1998-07-13 | 2001-04-24 | Asyst Technologies, Inc. | Ergonomic, variable size, bottom opening system compatible with a vertical interface |
| US6281516B1 (en) * | 1998-07-13 | 2001-08-28 | Newport Corporation | FIMS transport box load interface |
| US6502869B1 (en) * | 1998-07-14 | 2003-01-07 | Asyst Technologies, Inc. | Pod door to port door retention system |
| US6261044B1 (en) * | 1998-08-06 | 2001-07-17 | Asyst Technologies, Inc. | Pod to port door retention and evacuation system |
| US6188323B1 (en) * | 1998-10-15 | 2001-02-13 | Asyst Technologies, Inc. | Wafer mapping system |
| US6520727B1 (en) * | 2000-04-12 | 2003-02-18 | Asyt Technologies, Inc. | Modular sorter |
| US6364593B1 (en) * | 2000-06-06 | 2002-04-02 | Brooks Automation | Material transport system |
-
2002
- 2002-03-01 US US10/087,638 patent/US7100340B2/en not_active Expired - Lifetime
- 2002-08-30 KR KR1020047003050A patent/KR100809107B1/ko not_active Expired - Fee Related
- 2002-08-30 WO PCT/US2002/030297 patent/WO2003019630A2/en not_active Ceased
- 2002-08-30 CN CNB028193776A patent/CN100359634C/zh not_active Expired - Lifetime
- 2002-08-30 JP JP2003522990A patent/JP4309263B2/ja not_active Expired - Lifetime
- 2002-08-30 DE DE10297170T patent/DE10297170T5/de not_active Withdrawn
-
2006
- 2006-02-10 US US11/352,154 patent/US20060177289A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CN1561537A (zh) | 2005-01-05 |
| WO2003019630A3 (en) | 2003-11-20 |
| US20030044268A1 (en) | 2003-03-06 |
| JP2005525688A (ja) | 2005-08-25 |
| US7100340B2 (en) | 2006-09-05 |
| US20060177289A1 (en) | 2006-08-10 |
| WO2003019630A2 (en) | 2003-03-06 |
| JP4309263B2 (ja) | 2009-08-05 |
| CN100359634C (zh) | 2008-01-02 |
| KR100809107B1 (ko) | 2008-03-04 |
| KR20040048402A (ko) | 2004-06-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE10297170T5 (de) | Einheitlicher Rahmen für ein Handhabungssystem für Halbleitermaterial | |
| DE10297169T5 (de) | Handhabungssystem für Halbleitermaterial | |
| DE10297171T5 (de) | Wafermaschine | |
| DE69936645T2 (de) | Behälter mit waferkassette | |
| DE4425208C2 (de) | Einrichtung zur Kopplung von Be- und Entladegeräten mit Halbleiterbearbeitungsmaschinen | |
| DE69205573T2 (de) | Fertigungsstrasse Architektur mit vollautomatisierten und rechnergesteuerten Fördereinrichtungen geeignet für abdichtbaren tragbaren unter Druck stehenden Behältern. | |
| DE69713065T2 (de) | Ladungsschleusenvorrichtung für ein ionenimplantierungssystem | |
| DE60025708T2 (de) | Mehrstufiger einzelantrieb für foup-türöffnungssystem | |
| DE69837718T2 (de) | Integrierter pufferraum, abgabe- und lagersystem | |
| CN1996552B (zh) | 晶片机 | |
| DE19726305C2 (de) | System zum Transportieren von Objekten zwischen Umgebungen mit kontrollierten Bedingungen | |
| DE69830905T2 (de) | Vorrichtung zur behandlung von einzelnen halbleiterscheiben mit mehreren schleusenkammern und verfahren zum beladen und entladen | |
| DE69205571T2 (de) | Unter Druck stehende Koppelsysteme zum Transferieren von einem Halbleiterwafer zwischen einem tragbaren abdichtbaren unter druckstehenden Behälter und einer Bearbeitungsanlage. | |
| WO2008008737A2 (en) | Variable lot size load port | |
| CH695872A5 (de) | Reticle-Handhabungsvorrichtung. | |
| DE4310149C2 (de) | Einrichtung zur Handhabung von scheibenförmigen Objekten in einer Handhabungsebene eines lokalen Reinraumes | |
| DE202019101792U1 (de) | Öffnungsvorrichtung | |
| DE10053232C2 (de) | Substrat-Zuführungsmodul und System aus Substrat-Zuführungsmodul und Arbeitsstation | |
| EP3750180B1 (de) | Ladeschleuse für einen substratbehälter und vorrichtung mit einer ladeschleuse | |
| TW579564B (en) | Unified frame, system for transferring semiconductor wafers and related substrate objects, and system for transporting wafers |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8125 | Change of the main classification |
Ipc: H01L 21/67 AFI20090904BHDE |
|
| 8139 | Disposal/non-payment of the annual fee |