DE102023125564A1 - Verarbeitungsvorrichtung, system, verfahren und programm - Google Patents
Verarbeitungsvorrichtung, system, verfahren und programm Download PDFInfo
- Publication number
- DE102023125564A1 DE102023125564A1 DE102023125564.9A DE102023125564A DE102023125564A1 DE 102023125564 A1 DE102023125564 A1 DE 102023125564A1 DE 102023125564 A DE102023125564 A DE 102023125564A DE 102023125564 A1 DE102023125564 A1 DE 102023125564A1
- Authority
- DE
- Germany
- Prior art keywords
- structure factor
- range
- short
- factor
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
- G16C—COMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
- G16C60/00—Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20016—Goniometers
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Data Mining & Analysis (AREA)
- Mathematical Physics (AREA)
- Mathematical Analysis (AREA)
- General Engineering & Computer Science (AREA)
- Software Systems (AREA)
- Databases & Information Systems (AREA)
- Pure & Applied Mathematics (AREA)
- Mathematical Optimization (AREA)
- Computational Mathematics (AREA)
- Algebra (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022-157711 | 2022-09-30 | ||
| JP2022157711A JP7737148B2 (ja) | 2022-09-30 | 2022-09-30 | 処理装置、システム、方法およびプログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102023125564A1 true DE102023125564A1 (de) | 2024-04-04 |
Family
ID=90246320
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102023125564.9A Pending DE102023125564A1 (de) | 2022-09-30 | 2023-09-21 | Verarbeitungsvorrichtung, system, verfahren und programm |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20240120036A1 (https=) |
| JP (1) | JP7737148B2 (https=) |
| CN (1) | CN117807347A (https=) |
| DE (1) | DE102023125564A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12587274B2 (en) | 2023-03-28 | 2026-03-24 | Quantum Generative Materials Llc | Satellite optimization management system based on natural language input and artificial intelligence |
| US12368503B2 (en) | 2023-12-27 | 2025-07-22 | Quantum Generative Materials Llc | Intent-based satellite transmit management based on preexisting historical location and machine learning |
| US12603701B2 (en) | 2023-12-27 | 2026-04-14 | Quantum Generative Materials Llc | Distributed satellite constellation management and control system |
| JP7803580B1 (ja) * | 2024-08-22 | 2026-01-21 | 株式会社リガク | 処理装置、システム、方法およびプログラム |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020094945A (ja) | 2018-12-14 | 2020-06-18 | 国立研究開発法人物質・材料研究機構 | X線全散乱による結晶構造解析方法 |
| JP2022157711A (ja) | 2021-03-31 | 2022-10-14 | 株式会社アドヴィックス | 車両用制動制御装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014044079A (ja) | 2012-08-24 | 2014-03-13 | Sumitomo Bakelite Co Ltd | 透明複合シートの評価方法、透明複合シート製品、及び透明複合シート |
| JP2015025746A (ja) | 2013-07-26 | 2015-02-05 | 住友ベークライト株式会社 | 材料の三次元構造の評価方法、材料製品、及び透明複合シート製品 |
-
2022
- 2022-09-30 JP JP2022157711A patent/JP7737148B2/ja active Active
-
2023
- 2023-09-21 DE DE102023125564.9A patent/DE102023125564A1/de active Pending
- 2023-09-28 CN CN202311275932.2A patent/CN117807347A/zh active Pending
- 2023-09-28 US US18/373,967 patent/US20240120036A1/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020094945A (ja) | 2018-12-14 | 2020-06-18 | 国立研究開発法人物質・材料研究機構 | X線全散乱による結晶構造解析方法 |
| JP2022157711A (ja) | 2021-03-31 | 2022-10-14 | 株式会社アドヴィックス | 車両用制動制御装置 |
Non-Patent Citations (2)
| Title |
|---|
| A. Mellergärd, R.L. McGreevy, Acta Crystallogr Acta Crystallogr. 55 (1999) 783-789 |
| M.G. Tucker, M.T. Dove, D.A. Keen, J. Appl. Crystallogr. 34 (2001) 630-638 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN117807347A (zh) | 2024-04-02 |
| US20240120036A1 (en) | 2024-04-11 |
| JP7737148B2 (ja) | 2025-09-10 |
| JP2024051504A (ja) | 2024-04-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE102023125564A1 (de) | Verarbeitungsvorrichtung, system, verfahren und programm | |
| DE112010001894B4 (de) | Verfahren zur Messung einer Oberflächenmikrostruktur, Verfahren zur Datenanalyse einer Oberflächenmikrostrukturmessung und Oberflächenmikrostruktur-Messsystem | |
| DE60217470T2 (de) | Volumetrische analyse von geschichtetem sand | |
| DE112023000011T5 (de) | Ein primäres Frequenzmodulationssteuersystem der thermischen Stromerzeugungseinheit mit kleinen Störungen | |
| DE112020004471T5 (de) | Folgerungsvorrichtung, Trainingsvorrichtung, Folgerungsverfahren und Trainingsverfahren | |
| DE112004001001T5 (de) | Optische Messung von auf Halbleiterwafern gebildeten Strukturen unter Verwendung von Maschinenlernsystemen | |
| DE102008019341A1 (de) | Verfahren zur Analyse von Masken für die Photolithographie | |
| DE10393515T5 (de) | Erzeugung von simulierten Beugungssignalen für zweidimensionale Strukturen | |
| DE102012111504A1 (de) | Röntgenanalyseapparatur | |
| DE112022000915T5 (de) | Erstellen eines statistischen modells und auswerten der modellleistung | |
| DE112019006092T5 (de) | Lose gekoppeltes inspektions- und metrologiesystem zur überwachung eines produktionsprozesses mit hohem volumen | |
| DE102023104071A1 (de) | Vorrichtung und verfahren zum analysieren eines beugungsmusters einer mischung, und informationsspeichermedium | |
| DE102009000904A1 (de) | Verfahren und Systeme zum Berechnen einer Grössenverteilung von kleinen Partikeln | |
| DE112005001600T5 (de) | Simulation von Abtaststrahlbildern durch Kombination von aus einem Oberflächenmodell extrahierten Grundmerkmalen | |
| EP3137885B1 (de) | Verfahren zur identifikation kristalliner phasen | |
| DE102021213762B4 (de) | Verfahren zur Erstellung von Datensätzen für die Bewertung zumindest eines Lebensdauerparameters einer Batteriezelle, Vorrichtung und Software hierfür. | |
| DE102022135019A1 (de) | Computerimplementiertes Verfahren, computerlesbares Medium, Computerprogrammprodukt, und entsprechende Systeme zum Simulieren elektromagnetischer Nahfelder oder Luftbilder von Fotolithografiemasken | |
| DE60037235T2 (de) | Verfahren zur ermittlung eines wahren spektrums aus einem gemessenen spektrum | |
| DE102023211154A1 (de) | Vorrichtung und Verfahren zur 3D-Tensor-Vervollständigung | |
| DE102015110656A1 (de) | Verfahren und Vorrichtung zum Quantifizieren von Freimaßtoleranzen und der Prozessfähigkeit unabhängig von Bezugspunkten | |
| DE102024123706A1 (de) | Berechnungsvorrichtung, verfahren und programm | |
| DE102023106687A1 (de) | Korrekturvorrichtung, system, verfahren und programm | |
| EP1269155B1 (de) | Verfahren zur brechzahlbestimmung | |
| DE102023128330A1 (de) | Kristallinitätsgrad-messvorrichtung und kristallinitätsgrad-messverfahren und informationsspeichermedium | |
| DE112021003536T5 (de) | Faktoranalysevorrichtung, faktoranalyseverfahren und faktoranalyseprogramm |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |