DE102020003312A1 - Massenspektrometer - Google Patents
Massenspektrometer Download PDFInfo
- Publication number
- DE102020003312A1 DE102020003312A1 DE102020003312.1A DE102020003312A DE102020003312A1 DE 102020003312 A1 DE102020003312 A1 DE 102020003312A1 DE 102020003312 A DE102020003312 A DE 102020003312A DE 102020003312 A1 DE102020003312 A1 DE 102020003312A1
- Authority
- DE
- Germany
- Prior art keywords
- ion
- time
- ion trap
- voltage
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000004949 mass spectrometry Methods 0.000 title claims abstract description 16
- 238000005040 ion trap Methods 0.000 claims abstract description 92
- 238000005259 measurement Methods 0.000 claims abstract description 84
- 238000001228 spectrum Methods 0.000 claims abstract description 26
- 238000004458 analytical method Methods 0.000 claims abstract description 23
- 238000001819 mass spectrum Methods 0.000 claims abstract description 21
- 230000001360 synchronised effect Effects 0.000 claims abstract description 11
- 238000001514 detection method Methods 0.000 claims abstract description 10
- 230000005684 electric field Effects 0.000 claims description 9
- 230000008030 elimination Effects 0.000 claims description 4
- 238000003379 elimination reaction Methods 0.000 claims description 4
- 230000001105 regulatory effect Effects 0.000 claims description 4
- 150000002500 ions Chemical class 0.000 abstract description 148
- 238000000034 method Methods 0.000 abstract description 31
- 230000008569 process Effects 0.000 abstract description 27
- 239000000523 sample Substances 0.000 description 41
- 238000001269 time-of-flight mass spectrometry Methods 0.000 description 23
- 239000007788 liquid Substances 0.000 description 10
- 238000012545 processing Methods 0.000 description 9
- 238000001816 cooling Methods 0.000 description 8
- 238000013500 data storage Methods 0.000 description 7
- 230000037427 ion transport Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000003795 desorption Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005036 potential barrier Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000000451 chemical ionisation Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000000132 electrospray ionisation Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 239000000112 cooling gas Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/423—Two-dimensional RF ion traps with radial ejection
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019128722A JP2021015688A (ja) | 2019-07-10 | 2019-07-10 | 質量分析装置 |
| JP2019-128722 | 2019-07-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102020003312A1 true DE102020003312A1 (de) | 2021-01-14 |
Family
ID=74058608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102020003312.1A Ceased DE102020003312A1 (de) | 2019-07-10 | 2020-06-02 | Massenspektrometer |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20210013022A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2021015688A (cg-RX-API-DMAC7.html) |
| CN (1) | CN112216594A (cg-RX-API-DMAC7.html) |
| DE (1) | DE102020003312A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201802917D0 (en) | 2018-02-22 | 2018-04-11 | Micromass Ltd | Charge detection mass spectrometry |
| US11380531B2 (en) * | 2019-11-08 | 2022-07-05 | Thermo Finnigan Llc | Methods and apparatus for high speed mass spectrometry |
| US11842891B2 (en) | 2020-04-09 | 2023-12-12 | Waters Technologies Corporation | Ion detector |
| JP7548134B2 (ja) * | 2021-06-16 | 2024-09-10 | 株式会社島津製作所 | 質量分析装置 |
| CN113725062B (zh) * | 2021-09-07 | 2023-07-07 | 国开启科量子技术(北京)有限公司 | 离子阱射频装置 |
| CN117981048A (zh) * | 2021-09-23 | 2024-05-03 | Dh科技发展私人贸易有限公司 | 用于非接触式样品喷射的信号解卷积的系统和方法 |
| EP4449473A1 (en) | 2021-12-15 | 2024-10-23 | Waters Technologies Corporation | An inductive detector with integrated amplifier |
| KR20230135421A (ko) * | 2022-03-16 | 2023-09-25 | 에이치비솔루션㈜ | Tof-meis 신호 개선 시스템 |
-
2019
- 2019-07-10 JP JP2019128722A patent/JP2021015688A/ja not_active Withdrawn
-
2020
- 2020-05-22 US US16/881,131 patent/US20210013022A1/en not_active Abandoned
- 2020-06-02 DE DE102020003312.1A patent/DE102020003312A1/de not_active Ceased
- 2020-06-19 CN CN202010567636.XA patent/CN112216594A/zh not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| JP2021015688A (ja) | 2021-02-12 |
| CN112216594A (zh) | 2021-01-12 |
| US20210013022A1 (en) | 2021-01-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R002 | Refusal decision in examination/registration proceedings | ||
| R003 | Refusal decision now final |