DE102010018830A1 - Flüssigkeitsverdampfer - Google Patents
Flüssigkeitsverdampfer Download PDFInfo
- Publication number
- DE102010018830A1 DE102010018830A1 DE102010018830A DE102010018830A DE102010018830A1 DE 102010018830 A1 DE102010018830 A1 DE 102010018830A1 DE 102010018830 A DE102010018830 A DE 102010018830A DE 102010018830 A DE102010018830 A DE 102010018830A DE 102010018830 A1 DE102010018830 A1 DE 102010018830A1
- Authority
- DE
- Germany
- Prior art keywords
- liquid
- chamber
- opening
- channel
- evaporation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F24—HEATING; RANGES; VENTILATING
- F24H—FLUID HEATERS, e.g. WATER OR AIR HEATERS, HAVING HEAT-GENERATING MEANS, e.g. HEAT PUMPS, IN GENERAL
- F24H9/00—Details
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01B—BOILING; BOILING APPARATUS ; EVAPORATION; EVAPORATION APPARATUS
- B01B1/00—Boiling; Boiling apparatus for physical or chemical purposes ; Evaporation in general
- B01B1/005—Evaporation for physical or chemical purposes; Evaporation apparatus therefor, e.g. evaporation of liquids for gas phase reactions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
- H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B6/00—Heating by electric, magnetic or electromagnetic fields
- H05B6/64—Heating using microwaves
- H05B6/80—Apparatus for specific applications
- H05B6/802—Apparatus for specific applications for heating fluids
- H05B6/804—Water heaters, water boilers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/4022—Concentrating samples by thermal techniques; Phase changes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electromagnetism (AREA)
- Thermal Sciences (AREA)
- Combustion & Propulsion (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010018830A DE102010018830A1 (de) | 2010-04-29 | 2010-04-29 | Flüssigkeitsverdampfer |
US13/643,514 US20130077943A1 (en) | 2010-04-29 | 2011-04-26 | Liquid evaporator |
CA2797608A CA2797608A1 (en) | 2010-04-29 | 2011-04-26 | Liquid evaporator |
JP2013506637A JP2013527443A (ja) | 2010-04-29 | 2011-04-26 | 液体蒸発器 |
CN2011800324679A CN103108682A (zh) | 2010-04-29 | 2011-04-26 | 液体蒸发器 |
EP11717251A EP2563490A1 (de) | 2010-04-29 | 2011-04-26 | Flüssigkeitsverdampfer |
PCT/EP2011/056593 WO2011134968A1 (de) | 2010-04-29 | 2011-04-26 | Flüssigkeitsverdampfer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010018830A DE102010018830A1 (de) | 2010-04-29 | 2010-04-29 | Flüssigkeitsverdampfer |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102010018830A1 true DE102010018830A1 (de) | 2011-11-03 |
Family
ID=44359508
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102010018830A Withdrawn DE102010018830A1 (de) | 2010-04-29 | 2010-04-29 | Flüssigkeitsverdampfer |
Country Status (7)
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6103764B2 (ja) * | 2013-05-14 | 2017-03-29 | 国立大学法人福井大学 | 試料溶液の質量分析方法及びその装置 |
CN103529149A (zh) * | 2013-10-28 | 2014-01-22 | 徐继承 | 一种防堵塞的低压液化气体检验用进样蒸发器 |
CN103543228A (zh) * | 2013-10-28 | 2014-01-29 | 徐继承 | 一种含有大气平衡装置的低压液化气体检验用进样蒸发器 |
CN104392883A (zh) * | 2014-10-22 | 2015-03-04 | 常州博锐恒电子科技有限公司 | 一种注入机固体进料方法 |
CN116647901A (zh) | 2017-12-22 | 2023-08-25 | 华为技术有限公司 | 无线唤醒包发送与接收方法与装置 |
CN109289948B (zh) * | 2018-10-08 | 2020-02-18 | 重庆大学 | 一种光热定向操控液滴迁移聚合装置及其使用方法 |
CN109444248B (zh) * | 2018-11-20 | 2020-10-30 | 中国地质大学(武汉) | 一种基于激光的溶液剥蚀进样分析方法 |
NL2023927B1 (en) | 2019-10-01 | 2021-06-01 | Berkin Bv | In-flow evaporator |
CN115155077B (zh) * | 2022-07-04 | 2023-08-18 | 枣庄学院 | 多组分液体微量蒸发装置 |
US11938414B1 (en) * | 2022-10-04 | 2024-03-26 | Honeywell Federal Manufacturing & Technologies, Llc | Microfluidic film evaporation with femtosecond laser-patterned surface |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005016512A1 (de) | 2003-08-02 | 2005-02-24 | Bayer Materialscience Ag | Verfahren zur entfernung von flüchtigen verbindungen aus stoffgemischen mittels mikroverdampfer |
US7309859B2 (en) | 1994-07-11 | 2007-12-18 | Agilent Technologies, Inc. | Ion sampling for APPI mass spectrometry |
WO2008101669A1 (de) | 2007-02-19 | 2008-08-28 | Bayer Technology Services Gmbh | Massenspektrometer |
US7618027B2 (en) | 2006-03-20 | 2009-11-17 | Rasirc | Vaporizer for delivery of low vapor pressure gases |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2753533B1 (fr) * | 1996-09-17 | 1998-10-09 | Commissariat Energie Atomique | Procede et dispositif de caracterisation d'une modification au cours du temps de l'etat de condensation de gouttelettes sur une cible |
US5917185A (en) * | 1997-06-26 | 1999-06-29 | Iowa State University Research Foundation, Inc. | Laser vaporization/ionization interface for coupling microscale separation techniques with mass spectrometry |
JP3925000B2 (ja) * | 1999-09-06 | 2007-06-06 | 株式会社日立製作所 | 噴霧器及びそれを用いた分析装置 |
DE10049856A1 (de) * | 2000-10-09 | 2002-03-07 | Siemens Ag | Vorrichtung zum kontinuierlichen Verdampfen kleiner Mengen einer Flüssigkeit |
US20040099310A1 (en) * | 2001-01-05 | 2004-05-27 | Per Andersson | Microfluidic device |
JP2003035699A (ja) * | 2001-07-19 | 2003-02-07 | Kitakyushu Foundation For The Advancement Of Industry Science & Technology | 超音速分子ジェット分光分析方法及び装置 |
DE10242797A1 (de) * | 2002-09-14 | 2004-03-25 | Degussa Ag | Verfahren und Vorrichtung zur Phasenumwandlung von Stoffen |
UA79331C2 (en) * | 2002-11-08 | 2007-06-11 | Oleksandr V Vladimirov | Method for manufacturing gas-discharge electron lamps (variants) |
ITRM20070105A1 (it) * | 2007-02-26 | 2008-08-27 | Univ Roma | Impianto di distillazione di acqua per uso iniettabile |
JP2009069088A (ja) * | 2007-09-18 | 2009-04-02 | Fujitaro Imasaka | レーザー蒸発法に基づくパルス試料導入方法 |
WO2012040493A2 (en) * | 2010-09-22 | 2012-03-29 | California Institute Of Technology | A lateral flow microfluidic assaying device and related method |
-
2010
- 2010-04-29 DE DE102010018830A patent/DE102010018830A1/de not_active Withdrawn
-
2011
- 2011-04-26 JP JP2013506637A patent/JP2013527443A/ja active Pending
- 2011-04-26 CA CA2797608A patent/CA2797608A1/en active Pending
- 2011-04-26 WO PCT/EP2011/056593 patent/WO2011134968A1/de active Application Filing
- 2011-04-26 US US13/643,514 patent/US20130077943A1/en not_active Abandoned
- 2011-04-26 CN CN2011800324679A patent/CN103108682A/zh active Pending
- 2011-04-26 EP EP11717251A patent/EP2563490A1/de not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7309859B2 (en) | 1994-07-11 | 2007-12-18 | Agilent Technologies, Inc. | Ion sampling for APPI mass spectrometry |
WO2005016512A1 (de) | 2003-08-02 | 2005-02-24 | Bayer Materialscience Ag | Verfahren zur entfernung von flüchtigen verbindungen aus stoffgemischen mittels mikroverdampfer |
US7618027B2 (en) | 2006-03-20 | 2009-11-17 | Rasirc | Vaporizer for delivery of low vapor pressure gases |
WO2008101669A1 (de) | 2007-02-19 | 2008-08-28 | Bayer Technology Services Gmbh | Massenspektrometer |
Non-Patent Citations (6)
Title |
---|
"Complex MEMS: A fully integrated TOF micro mass spectrometer" veröffentlicht in Sensors and Actuators A: Physical, 138 (1) (2007), Seiten 22-27 |
"Fundamentals of Microfabrication" von Marc Madou, CRC Press Boca Raton FLA 1997 |
"Mikrosystemtechnik für Ingenieure" von W. Menz. J. Mohr und O. Paul, Wiley-VCH, Weinheim 2005 |
Duck-Jung Lee et al., Glass-to-Glass Anodic Bonding for High Vacuum Packaging of Microelectronics and its Stability, MEMS 2000, The Thirteenth Annual International Conference an Micro Electro Mechanical Systems, 23-27 January 2000, Seiten 253-258 |
J. Wie et al., Low Temperature Glass-to-Glass Wafer Bonding, IEEE Transactions on advanced packaging, Vol. 26, No. 3, 2003, Seiten 289-294 |
Q.-Y. Tong, U. Gösele: Semiconductor Wafer Bonding: Science and Technology; The Electrochemical Society Series, Wiley-Verlag, New York (1999) |
Also Published As
Publication number | Publication date |
---|---|
WO2011134968A1 (de) | 2011-11-03 |
JP2013527443A (ja) | 2013-06-27 |
US20130077943A1 (en) | 2013-03-28 |
CN103108682A (zh) | 2013-05-15 |
CA2797608A1 (en) | 2011-11-03 |
EP2563490A1 (de) | 2013-03-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R081 | Change of applicant/patentee |
Owner name: KROHNE MESSTECHNIK GMBH, DE Free format text: FORMER OWNERS: BAYER TECHNOLOGY SERVICES GMBH, 51373 LEVERKUSEN, DE; KROHNE MESSTECHNIK GMBH, 47058 DUISBURG, DE Effective date: 20130226 Owner name: BAYER INTELLECTUAL PROPERTY GMBH, DE Free format text: FORMER OWNERS: BAYER TECHNOLOGY SERVICES GMBH, 51373 LEVERKUSEN, DE; KROHNE MESSTECHNIK GMBH, 47058 DUISBURG, DE Effective date: 20130226 Owner name: KROHNE MESSTECHNIK GMBH, DE Free format text: FORMER OWNER: BAYER TECHNOLOGY SERVICES GMBH, KROHNE MESSTECHNIK GMBH, , DE Effective date: 20130226 Owner name: BAYER INTELLECTUAL PROPERTY GMBH, DE Free format text: FORMER OWNER: BAYER TECHNOLOGY SERVICES GMBH, KROHNE MESSTECHNIK GMBH, , DE Effective date: 20130226 |
|
R120 | Application withdrawn or ip right abandoned |