DE102009043747A1 - Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop - Google Patents

Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop Download PDF

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Publication number
DE102009043747A1
DE102009043747A1 DE102009043747A DE102009043747A DE102009043747A1 DE 102009043747 A1 DE102009043747 A1 DE 102009043747A1 DE 102009043747 A DE102009043747 A DE 102009043747A DE 102009043747 A DE102009043747 A DE 102009043747A DE 102009043747 A1 DE102009043747 A1 DE 102009043747A1
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DE
Germany
Prior art keywords
sample
illumination
image
tirf
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE102009043747A
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German (de)
English (en)
Inventor
Ingo Dr. Kleppe
Youheni Novikau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Microscopy GmbH
Carl Zeiss MicroImaging GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy GmbH, Carl Zeiss MicroImaging GmbH filed Critical Carl Zeiss Microscopy GmbH
Priority to DE102009043747A priority Critical patent/DE102009043747A1/de
Priority to PCT/EP2010/005295 priority patent/WO2011038817A1/de
Priority to EP10749799.2A priority patent/EP2483732B1/de
Priority to JP2012531254A priority patent/JP5707408B2/ja
Publication of DE102009043747A1 publication Critical patent/DE102009043747A1/de
Priority to US13/499,328 priority patent/US9588045B2/en
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/56—Optics using evanescent waves, i.e. inhomogeneous waves
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE102009043747A 2009-09-30 2009-09-30 Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop Ceased DE102009043747A1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE102009043747A DE102009043747A1 (de) 2009-09-30 2009-09-30 Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop
PCT/EP2010/005295 WO2011038817A1 (de) 2009-09-30 2010-08-28 Verfahren zur erzeugung eines mikroskopbildes und mikroskop
EP10749799.2A EP2483732B1 (de) 2009-09-30 2010-08-28 Verfahren zur erzeugung eines mikroskopbildes und mikroskop
JP2012531254A JP5707408B2 (ja) 2009-09-30 2010-09-29 顕微鏡画像を形成するための方法および顕微鏡
US13/499,328 US9588045B2 (en) 2009-09-30 2012-03-30 Method for generating a microscope image and microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102009043747A DE102009043747A1 (de) 2009-09-30 2009-09-30 Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop

Publications (1)

Publication Number Publication Date
DE102009043747A1 true DE102009043747A1 (de) 2011-03-31

Family

ID=42761248

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102009043747A Ceased DE102009043747A1 (de) 2009-09-30 2009-09-30 Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop

Country Status (5)

Country Link
US (1) US9588045B2 (https=)
EP (1) EP2483732B1 (https=)
JP (1) JP5707408B2 (https=)
DE (1) DE102009043747A1 (https=)
WO (1) WO2011038817A1 (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120008197A1 (en) * 2010-07-06 2012-01-12 Sebastian Borck Microscope, more particularly fluorescence microscope, dichroic beam splitter and use thereof
WO2014037716A1 (en) * 2012-09-04 2014-03-13 The University Of Nottingham Monitoring and/or characterising biological or chemical material
EP2801854B1 (en) 2013-05-10 2017-07-19 Ruprecht-Karls-Universität Heidelberg Method and apparatus for combination of localization microscopy and structured illumination microscopy
DE102018108657A1 (de) * 2018-04-12 2019-10-17 Jenoptik Optical Systems Gmbh Mikroskop mit strukturierter Beleuchtung
CN111386439A (zh) * 2017-09-18 2020-07-07 安盟生技股份有限公司 干涉成像设备及其应用
CN112326665A (zh) * 2020-09-28 2021-02-05 之江实验室 一种基于空间分步式移频照明的缺陷检测系统

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009043747A1 (de) 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop
DE102011077269A1 (de) * 2011-06-09 2012-12-13 Carl Zeiss Microimaging Gmbh Hochauflösende Lumineszenzmikroskopie
WO2014017067A1 (ja) * 2012-07-27 2014-01-30 株式会社ニコン 構造化照明装置及び構造化照明顕微鏡
US20150301030A1 (en) 2014-04-22 2015-10-22 Q-State Biosciences, Inc. Models for parkinson's disease studies
JP2016181643A (ja) * 2015-03-25 2016-10-13 株式会社アマダホールディングス 半導体レーザ発振器
WO2016187543A1 (en) * 2015-05-21 2016-11-24 Q-State Biosciences, Inc. Optogenetics microscope
KR20170042432A (ko) * 2015-10-08 2017-04-19 삼성전자주식회사 포토레지스트 패턴의 검사 방법
US10901202B2 (en) * 2018-09-19 2021-01-26 Illumina, Inc. Structured illumination of a sample
FR3096146B1 (fr) 2019-05-16 2022-07-29 Univ Grenoble Alpes Dispositif de creation d’un champ evanescent a motifs sur une surface et procede associe
GB201907953D0 (en) 2019-06-04 2019-07-17 Smi Drug Discovery Ltd An optical microscope
DE102019118003B3 (de) * 2019-07-03 2020-10-22 Leibniz-Institut für Photonische Technologien e. V. Mikroskopieanordnung und Mikroskopieverfahren für eine großflächige, hochauflösende chirale Bildgebung sowie deren Verwendung
KR102258893B1 (ko) * 2019-11-28 2021-05-31 재단법인대구경북과학기술원 내시현미경의 수직 분해능 최적화 장치, 최적화 광학 시스템 및 최적화 방법
US20230314327A1 (en) * 2022-04-04 2023-10-05 10X Genomics, Inc. Systems and methods for nearly isotropic optical resolution using tilted structured illumination microscopy

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19702753A1 (de) 1997-01-27 1998-07-30 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
US5867604A (en) 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
EP1157297B1 (de) 1999-03-02 2002-11-06 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und vorrichtung zur objektabbildung
WO2006127692A2 (en) 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels
US20080088920A1 (en) 2004-07-16 2008-04-17 Ralf Wolleschensky Optical scanning microscope

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6255642B1 (en) * 1999-06-23 2001-07-03 Massachusetts Institute Of Technology Standing wave total internal reflection imaging
JP4414722B2 (ja) * 2003-10-15 2010-02-10 オリンパス株式会社 レーザー顕微鏡
WO2005092490A1 (ja) * 2004-03-27 2005-10-06 Futao Kaneko 光反応性薄膜加工法並びに光反応性薄膜加工装置
DE102004034998A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit bewegter Lochscheibe und Verwendung
US7485875B2 (en) * 2005-07-22 2009-02-03 Carl Zeiss Microimaging Gmbh Resolution-enhanced luminescence microscopy
GB0707433D0 (en) * 2007-04-18 2007-05-23 Stfc Science & Technology Fluorescence measurement
DE102008009216A1 (de) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
US20090318815A1 (en) * 2008-05-23 2009-12-24 Michael Barnes Systems and methods for hyperspectral medical imaging
US8019136B2 (en) * 2008-12-03 2011-09-13 Academia Sinica Optical sectioning microscopy
DE102009043747A1 (de) 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5867604A (en) 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
DE19702753A1 (de) 1997-01-27 1998-07-30 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
EP1157297B1 (de) 1999-03-02 2002-11-06 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und vorrichtung zur objektabbildung
US20080088920A1 (en) 2004-07-16 2008-04-17 Ralf Wolleschensky Optical scanning microscope
WO2006127692A2 (en) 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"Doubling the lateral resolution of wide field fluorescence microscopy" von Gustafson, Agard, Sedat, SPIE Vol. 3919 (2000), 1605-7422

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120008197A1 (en) * 2010-07-06 2012-01-12 Sebastian Borck Microscope, more particularly fluorescence microscope, dichroic beam splitter and use thereof
WO2014037716A1 (en) * 2012-09-04 2014-03-13 The University Of Nottingham Monitoring and/or characterising biological or chemical material
EP2801854B1 (en) 2013-05-10 2017-07-19 Ruprecht-Karls-Universität Heidelberg Method and apparatus for combination of localization microscopy and structured illumination microscopy
CN111386439A (zh) * 2017-09-18 2020-07-07 安盟生技股份有限公司 干涉成像设备及其应用
CN111386439B (zh) * 2017-09-18 2022-07-12 安盟生技股份有限公司 干涉成像设备及其应用
DE102018108657A1 (de) * 2018-04-12 2019-10-17 Jenoptik Optical Systems Gmbh Mikroskop mit strukturierter Beleuchtung
DE102018108657B4 (de) 2018-04-12 2024-03-28 Jenoptik Optical Systems Gmbh Vorrichtung zur Aufnahme wenigstens eines mikroskopischen Bildes und Verfahren zur Aufnahme eines mikroskopischen Bildes
CN112326665A (zh) * 2020-09-28 2021-02-05 之江实验室 一种基于空间分步式移频照明的缺陷检测系统
CN112326665B (zh) * 2020-09-28 2023-12-19 之江实验室 一种基于空间分步式移频照明的缺陷检测系统

Also Published As

Publication number Publication date
EP2483732A1 (de) 2012-08-08
US9588045B2 (en) 2017-03-07
JP5707408B2 (ja) 2015-04-30
JP2013506163A (ja) 2013-02-21
US20130068967A1 (en) 2013-03-21
WO2011038817A1 (de) 2011-04-07
EP2483732B1 (de) 2023-06-21

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Date Code Title Description
R081 Change of applicant/patentee

Owner name: CARL ZEISS MICROSCOPY GMBH, DE

Free format text: FORMER OWNER: CARL ZEISS MICROLMAGING GMBH, 07745 JENA, DE

Effective date: 20130204

R012 Request for examination validly filed
R016 Response to examination communication
R002 Refusal decision in examination/registration proceedings
R003 Refusal decision now final