DE102004048756A1 - Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung - Google Patents

Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung Download PDF

Info

Publication number
DE102004048756A1
DE102004048756A1 DE102004048756A DE102004048756A DE102004048756A1 DE 102004048756 A1 DE102004048756 A1 DE 102004048756A1 DE 102004048756 A DE102004048756 A DE 102004048756A DE 102004048756 A DE102004048756 A DE 102004048756A DE 102004048756 A1 DE102004048756 A1 DE 102004048756A1
Authority
DE
Germany
Prior art keywords
radiation
photosensitive elements
image converter
scintillator material
absorbs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102004048756A
Other languages
German (de)
English (en)
Inventor
Douglas Albagli
Joseph John Shiang
George Edward Possin
William Andrew Hennesy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE102004048756A1 publication Critical patent/DE102004048756A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

Landscapes

  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE102004048756A 2003-10-06 2004-10-05 Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung Withdrawn DE102004048756A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/681,767 US7019304B2 (en) 2003-10-06 2003-10-06 Solid-state radiation imager with back-side irradiation

Publications (1)

Publication Number Publication Date
DE102004048756A1 true DE102004048756A1 (de) 2005-04-21

Family

ID=34377590

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004048756A Withdrawn DE102004048756A1 (de) 2003-10-06 2004-10-05 Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung

Country Status (3)

Country Link
US (1) US7019304B2 (https=)
JP (1) JP2005114731A (https=)
DE (1) DE102004048756A1 (https=)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4220819B2 (ja) * 2003-03-27 2009-02-04 浜松ホトニクス株式会社 放射線検出器
US7286640B2 (en) * 2004-04-09 2007-10-23 Xradia, Inc. Dual-band detector system for x-ray imaging of biological samples
US7412024B1 (en) 2004-04-09 2008-08-12 Xradia, Inc. X-ray mammography
KR101309394B1 (ko) * 2005-12-23 2013-09-17 쓰리엠 이노베이티브 프로퍼티즈 컴파니 열가소성 실리콘 블록 공중합체를 포함하는 다층 필름
JP5144538B2 (ja) * 2005-12-23 2013-02-13 スリーエム イノベイティブ プロパティズ カンパニー 熱可塑性シリコーンブロックコポリマー類を含むフィルム
US7772558B1 (en) * 2006-03-29 2010-08-10 Radiation Monitoring Devices, Inc. Multi-layer radiation detector and related methods
DE102006038969B4 (de) * 2006-08-21 2013-02-28 Siemens Aktiengesellschaft Röntgenkonverterelement und Verfahren zu dessen Herstellung
JP4894453B2 (ja) * 2006-10-25 2012-03-14 コニカミノルタエムジー株式会社 放射線画像検出器
JP2008139064A (ja) * 2006-11-30 2008-06-19 Konica Minolta Medical & Graphic Inc シンチレータパネルの製造方法、シンチレータパネル及び真空蒸着装置
US7687790B2 (en) * 2007-06-07 2010-03-30 General Electric Company EMI shielding of digital x-ray detectors with non-metallic enclosures
US7723687B2 (en) * 2007-07-03 2010-05-25 Radiation Monitoring Devices, Inc. Lanthanide halide microcolumnar scintillators
JP5091066B2 (ja) * 2008-09-11 2012-12-05 富士フイルム株式会社 固体撮像装置の製造方法
JP5197468B2 (ja) * 2009-03-31 2013-05-15 富士フイルム株式会社 放射線検出装置
DE102009024225A1 (de) * 2009-06-08 2010-12-16 Siemens Aktiengesellschaft Röntgendetektor
JP2011017683A (ja) * 2009-07-10 2011-01-27 Fujifilm Corp 放射線画像検出器及びその製造方法
FR2948379B1 (fr) 2009-07-21 2011-08-19 Saint Gobain Cristaux Et Detecteurs Scintillateur en halogenure de terre rare revetu d'un absorbeur ou reflecteur de lumiere
JP5535670B2 (ja) * 2010-01-28 2014-07-02 富士フイルム株式会社 放射線画像検出器の製造方法
US8710853B2 (en) * 2010-08-31 2014-04-29 Infineon Technologies Ag Capacitance sensing
JP5485860B2 (ja) * 2010-11-18 2014-05-07 富士フイルム株式会社 放射線画像撮影装置
KR101195415B1 (ko) * 2010-12-29 2012-10-29 포항공과대학교 산학협력단 원자층 증착을 이용한 엑스선（Ｘ­ｒａｙ）／감마선（γ­ｒａｙ）집속 광학계의 제조방법
JP5792472B2 (ja) 2011-01-25 2015-10-14 浜松ホトニクス株式会社 放射線画像取得装置
US9281422B2 (en) * 2011-03-24 2016-03-08 Koninklijke Philips N.V. Spectral imaging detector
JP5944254B2 (ja) 2012-07-20 2016-07-05 浜松ホトニクス株式会社 放射線画像取得装置
WO2014069284A1 (ja) * 2012-11-01 2014-05-08 東レ株式会社 放射線検出装置およびその製造方法
WO2014187502A1 (en) * 2013-05-24 2014-11-27 Teledyne Dalsa B.V. A moisture protection structure for a device and a fabrication method thereof
EP3358375B1 (en) * 2015-09-30 2023-09-13 Hamamatsu Photonics K.K. Radiographic image acquisition system and radiographic image acquisition method
JP2018009803A (ja) * 2016-07-11 2018-01-18 コニカミノルタ株式会社 シンチレータパネル
US11802979B2 (en) 2018-05-23 2023-10-31 The Research Foundation For The State University Of New York Flat panel x-ray imager with scintillating glass substrate
JP7325295B2 (ja) * 2019-10-24 2023-08-14 浜松ホトニクス株式会社 シンチレータパネル、放射線検出器、シンチレータパネルの製造方法、及び、放射線検出器の製造方法
CN212696098U (zh) * 2020-06-22 2021-03-12 上海耕岩智能科技有限公司 图像传感器及电子设备
KR20230109134A (ko) * 2020-11-25 2023-07-19 하마마츠 포토닉스 가부시키가이샤 촬상 유닛 및 촬상 시스템

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5083031A (en) * 1986-08-19 1992-01-21 International Sensor Technology, Inc. Radiation dosimeters
EP0562143B1 (en) * 1992-03-27 1997-06-25 Nichia Kagaku Kogyo K.K. Solid-state image converting device
US5686733A (en) * 1996-03-29 1997-11-11 Mcgill University Megavoltage imaging method using a combination of a photoreceptor with a high energy photon converter and intensifier
CA2184667C (en) * 1996-09-03 2000-06-20 Bradley Trent Polischuk Multilayer plate for x-ray imaging and method of producing same
US6031234A (en) 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
US6060714A (en) * 1998-01-23 2000-05-09 Ois Optical Imaging Systems, Inc. Large area imager with photo-imageable interface barrier layer
US6541774B1 (en) * 2000-11-03 2003-04-01 General Electric Company Radiation imager cover
US6784433B2 (en) * 2001-07-16 2004-08-31 Edge Medical Devices Ltd. High resolution detector for X-ray imaging
US6895077B2 (en) * 2001-11-21 2005-05-17 University Of Massachusetts Medical Center System and method for x-ray fluoroscopic imaging
US7122804B2 (en) 2002-02-15 2006-10-17 Varian Medical Systems Technologies, Inc. X-ray imaging device

Also Published As

Publication number Publication date
US20050072931A1 (en) 2005-04-07
JP2005114731A (ja) 2005-04-28
US7019304B2 (en) 2006-03-28

Similar Documents

Publication Publication Date Title
DE102004048756A1 (de) Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung
JP7365601B2 (ja) 光検出器
US7616243B2 (en) Method and apparatus for improving and controlling dynamic range in an image sensor
CN102170828B (zh) 射线照相成像系统
JP5067154B2 (ja) 撮像装置
KR101295923B1 (ko) 고체 촬상 장치, 그 구동 방법 및 카메라
US8633996B2 (en) Image sensor having nonlinear response
KR101407807B1 (ko) 고체 촬상 장치
US11869918B2 (en) Quantum dot digital radiographic detection system
US20080239129A1 (en) Method and device for driving solid-state imaging device, imaging apparatus, and image synthesizing method
US20130028379A1 (en) Enhanced resolution imaging systems for digital radiography
US6259124B1 (en) Active pixel sensor with high fill factor blooming protection
EP3443413B1 (de) Vorrichtung zur optischen aufnahme eines schirms
Esposito et al. DynAMITe: a wafer scale sensor for biomedical applications
TW293902B (https=)
US20060186363A1 (en) Enhanced spectral range imaging sensor
Maidment et al. Scanned-slot digital mammography
JP2011015103A (ja) 固体撮像装置及びその制御方法
DE60013738T2 (de) Leuchtstoffträger mit verbessertem Leuchtwirkungsgrad
Abdelghafar et al. Light-Emission Crosstalk Model and Dynamic Correction Algorithm for Large-Scale SPAD Image Sensors
Zentai et al. Pros and cons of CMOS X-ray imagers
Widenhorn et al. Measurements of dark current in a CCD imager during light exposures
Shanks et al. Characterization of a fast-framing x-ray camera with wide dynamic range for high-energy imaging
JP2006156511A (ja) 光電変換素子及び光電変換装置
DE102006042484A1 (de) Strahlungsdetektor

Legal Events

Date Code Title Description
R012 Request for examination validly filed

Effective date: 20110915

R016 Response to examination communication
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee