DE10158795B4 - Magnetoresistive Speicherzelle mit dynamischer Referenzschicht - Google Patents
Magnetoresistive Speicherzelle mit dynamischer Referenzschicht Download PDFInfo
- Publication number
- DE10158795B4 DE10158795B4 DE10158795A DE10158795A DE10158795B4 DE 10158795 B4 DE10158795 B4 DE 10158795B4 DE 10158795 A DE10158795 A DE 10158795A DE 10158795 A DE10158795 A DE 10158795A DE 10158795 B4 DE10158795 B4 DE 10158795B4
- Authority
- DE
- Germany
- Prior art keywords
- layer
- magnetization
- memory cell
- support
- magnetoresistive memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Materials of the active region
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Thin Magnetic Films (AREA)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10158795A DE10158795B4 (de) | 2001-11-30 | 2001-11-30 | Magnetoresistive Speicherzelle mit dynamischer Referenzschicht |
| JP2003550230A JP4219814B2 (ja) | 2001-11-30 | 2002-11-25 | 動的な基準層を有する磁気抵抗メモリーセル |
| EP02787395A EP1449220B1 (de) | 2001-11-30 | 2002-11-25 | Magnetoresistive speicherzelle mit dynamischer referenzschicht |
| PCT/DE2002/004323 WO2003049120A2 (de) | 2001-11-30 | 2002-11-25 | Magnetoresistive speicherzelle mit dynamischer referenzschicht |
| DE50202668T DE50202668D1 (de) | 2001-11-30 | 2002-11-25 | Magnetoresistive speicherzelle mit dynamischer referenzschicht |
| KR1020047008163A KR100613536B1 (ko) | 2001-11-30 | 2002-11-25 | 자기저항 메모리 셀의 저항 차를 증가시키는 장치 및 방법 |
| CNA028239296A CN1599937A (zh) | 2001-11-30 | 2002-11-25 | 包括动态参考层之磁阻记忆胞元 |
| US10/497,007 US7369426B2 (en) | 2001-11-30 | 2002-11-25 | Magnetoresistive memory cell with dynamic reference layer |
| TW091134489A TW588355B (en) | 2001-11-30 | 2002-11-27 | Magnetoresistive memory cell with dynamic reference layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10158795A DE10158795B4 (de) | 2001-11-30 | 2001-11-30 | Magnetoresistive Speicherzelle mit dynamischer Referenzschicht |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE10158795A1 DE10158795A1 (de) | 2003-06-18 |
| DE10158795B4 true DE10158795B4 (de) | 2005-12-22 |
Family
ID=7707532
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10158795A Expired - Fee Related DE10158795B4 (de) | 2001-11-30 | 2001-11-30 | Magnetoresistive Speicherzelle mit dynamischer Referenzschicht |
| DE50202668T Expired - Fee Related DE50202668D1 (de) | 2001-11-30 | 2002-11-25 | Magnetoresistive speicherzelle mit dynamischer referenzschicht |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE50202668T Expired - Fee Related DE50202668D1 (de) | 2001-11-30 | 2002-11-25 | Magnetoresistive speicherzelle mit dynamischer referenzschicht |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7369426B2 (https=) |
| EP (1) | EP1449220B1 (https=) |
| JP (1) | JP4219814B2 (https=) |
| KR (1) | KR100613536B1 (https=) |
| CN (1) | CN1599937A (https=) |
| DE (2) | DE10158795B4 (https=) |
| TW (1) | TW588355B (https=) |
| WO (1) | WO2003049120A2 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6667901B1 (en) * | 2003-04-29 | 2003-12-23 | Hewlett-Packard Development Company, L.P. | Dual-junction magnetic memory device and read method |
| DE102004047411B3 (de) * | 2004-09-28 | 2006-05-11 | Funktionale Materialien Rostock E.V. | Magnetisches Speicherschichtsystem |
| FR2914482B1 (fr) * | 2007-03-29 | 2009-05-29 | Commissariat Energie Atomique | Memoire magnetique a jonction tunnel magnetique |
| JP2009146512A (ja) * | 2007-12-14 | 2009-07-02 | Hitachi Global Storage Technologies Netherlands Bv | 磁気ヘッド及び磁気記録装置 |
| JP5103259B2 (ja) * | 2008-04-22 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 磁気記憶素子及び磁気記憶装置 |
| EP2575135B1 (en) * | 2011-09-28 | 2015-08-05 | Crocus Technology S.A. | Magnetic random access memory (MRAM) cell and method for reading the MRAM cell using a self-referenced read operation |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999014760A1 (de) * | 1997-09-17 | 1999-03-25 | Infineon Technologies Ag | Speicherzellenanordnung und deren verwendung als magnetisches ram und als assoziativer speicher |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4243358A1 (de) * | 1992-12-21 | 1994-06-23 | Siemens Ag | Magnetowiderstands-Sensor mit künstlichem Antiferromagneten und Verfahren zu seiner Herstellung |
| JPH0945074A (ja) | 1995-08-01 | 1997-02-14 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果を利用したメモリー素子および増幅素子 |
| EP0875901B1 (en) * | 1997-04-28 | 2006-08-09 | Canon Kabushiki Kaisha | Magnetic thin-film memory element utilizing GMR effect, and magnetic thin-film memory |
| JP3891511B2 (ja) | 1997-06-12 | 2007-03-14 | キヤノン株式会社 | 磁性薄膜メモリ及びその記録再生方法 |
| JP2000090658A (ja) | 1998-09-09 | 2000-03-31 | Sanyo Electric Co Ltd | 磁気メモリ素子 |
| US6436526B1 (en) | 1999-06-17 | 2002-08-20 | Matsushita Electric Industrial Co., Ltd. | Magneto-resistance effect element, magneto-resistance effect memory cell, MRAM and method for performing information write to or read from the magneto-resistance effect memory cell |
| US6233172B1 (en) | 1999-12-17 | 2001-05-15 | Motorola, Inc. | Magnetic element with dual magnetic states and fabrication method thereof |
| US6404674B1 (en) * | 2001-04-02 | 2002-06-11 | Hewlett Packard Company Intellectual Property Administrator | Cladded read-write conductor for a pinned-on-the-fly soft reference layer |
| US6576969B2 (en) * | 2001-09-25 | 2003-06-10 | Hewlett-Packard Development Company, L.P. | Magneto-resistive device having soft reference layer |
| US6795281B2 (en) * | 2001-09-25 | 2004-09-21 | Hewlett-Packard Development Company, L.P. | Magneto-resistive device including soft synthetic ferrimagnet reference layer |
| US6538917B1 (en) | 2001-09-25 | 2003-03-25 | Hewlett-Packard Development Company, L.P. | Read methods for magneto-resistive device having soft reference layer |
| US7193889B2 (en) * | 2004-02-11 | 2007-03-20 | Hewlett-Packard Development Company, Lp. | Switching of MRAM devices having soft magnetic reference layers |
-
2001
- 2001-11-30 DE DE10158795A patent/DE10158795B4/de not_active Expired - Fee Related
-
2002
- 2002-11-25 WO PCT/DE2002/004323 patent/WO2003049120A2/de not_active Ceased
- 2002-11-25 KR KR1020047008163A patent/KR100613536B1/ko not_active Expired - Fee Related
- 2002-11-25 CN CNA028239296A patent/CN1599937A/zh active Pending
- 2002-11-25 JP JP2003550230A patent/JP4219814B2/ja not_active Expired - Fee Related
- 2002-11-25 EP EP02787395A patent/EP1449220B1/de not_active Expired - Lifetime
- 2002-11-25 DE DE50202668T patent/DE50202668D1/de not_active Expired - Fee Related
- 2002-11-25 US US10/497,007 patent/US7369426B2/en not_active Expired - Fee Related
- 2002-11-27 TW TW091134489A patent/TW588355B/zh not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999014760A1 (de) * | 1997-09-17 | 1999-03-25 | Infineon Technologies Ag | Speicherzellenanordnung und deren verwendung als magnetisches ram und als assoziativer speicher |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1449220A2 (de) | 2004-08-25 |
| DE50202668D1 (de) | 2005-05-04 |
| CN1599937A (zh) | 2005-03-23 |
| JP2005512316A (ja) | 2005-04-28 |
| JP4219814B2 (ja) | 2009-02-04 |
| EP1449220B1 (de) | 2005-03-30 |
| WO2003049120A2 (de) | 2003-06-12 |
| KR100613536B1 (ko) | 2006-08-16 |
| WO2003049120A3 (de) | 2004-02-05 |
| DE10158795A1 (de) | 2003-06-18 |
| US20050116308A1 (en) | 2005-06-02 |
| KR20050044613A (ko) | 2005-05-12 |
| US7369426B2 (en) | 2008-05-06 |
| TW588355B (en) | 2004-05-21 |
| TW200301481A (en) | 2003-07-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |