CN1599937A - 包括动态参考层之磁阻记忆胞元 - Google Patents
包括动态参考层之磁阻记忆胞元 Download PDFInfo
- Publication number
- CN1599937A CN1599937A CNA028239296A CN02823929A CN1599937A CN 1599937 A CN1599937 A CN 1599937A CN A028239296 A CNA028239296 A CN A028239296A CN 02823929 A CN02823929 A CN 02823929A CN 1599937 A CN1599937 A CN 1599937A
- Authority
- CN
- China
- Prior art keywords
- layer
- magnetization
- redundant
- memory cell
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Materials of the active region
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Thin Magnetic Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10158795.3 | 2001-11-30 | ||
| DE10158795A DE10158795B4 (de) | 2001-11-30 | 2001-11-30 | Magnetoresistive Speicherzelle mit dynamischer Referenzschicht |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1599937A true CN1599937A (zh) | 2005-03-23 |
Family
ID=7707532
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA028239296A Pending CN1599937A (zh) | 2001-11-30 | 2002-11-25 | 包括动态参考层之磁阻记忆胞元 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7369426B2 (https=) |
| EP (1) | EP1449220B1 (https=) |
| JP (1) | JP4219814B2 (https=) |
| KR (1) | KR100613536B1 (https=) |
| CN (1) | CN1599937A (https=) |
| DE (2) | DE10158795B4 (https=) |
| TW (1) | TW588355B (https=) |
| WO (1) | WO2003049120A2 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6667901B1 (en) * | 2003-04-29 | 2003-12-23 | Hewlett-Packard Development Company, L.P. | Dual-junction magnetic memory device and read method |
| DE102004047411B3 (de) * | 2004-09-28 | 2006-05-11 | Funktionale Materialien Rostock E.V. | Magnetisches Speicherschichtsystem |
| FR2914482B1 (fr) * | 2007-03-29 | 2009-05-29 | Commissariat Energie Atomique | Memoire magnetique a jonction tunnel magnetique |
| JP2009146512A (ja) * | 2007-12-14 | 2009-07-02 | Hitachi Global Storage Technologies Netherlands Bv | 磁気ヘッド及び磁気記録装置 |
| JP5103259B2 (ja) * | 2008-04-22 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 磁気記憶素子及び磁気記憶装置 |
| EP2575135B1 (en) * | 2011-09-28 | 2015-08-05 | Crocus Technology S.A. | Magnetic random access memory (MRAM) cell and method for reading the MRAM cell using a self-referenced read operation |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4243358A1 (de) * | 1992-12-21 | 1994-06-23 | Siemens Ag | Magnetowiderstands-Sensor mit künstlichem Antiferromagneten und Verfahren zu seiner Herstellung |
| JPH0945074A (ja) | 1995-08-01 | 1997-02-14 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果を利用したメモリー素子および増幅素子 |
| EP0875901B1 (en) * | 1997-04-28 | 2006-08-09 | Canon Kabushiki Kaisha | Magnetic thin-film memory element utilizing GMR effect, and magnetic thin-film memory |
| JP3891511B2 (ja) | 1997-06-12 | 2007-03-14 | キヤノン株式会社 | 磁性薄膜メモリ及びその記録再生方法 |
| TW411471B (en) * | 1997-09-17 | 2000-11-11 | Siemens Ag | Memory-cell device |
| JP2000090658A (ja) | 1998-09-09 | 2000-03-31 | Sanyo Electric Co Ltd | 磁気メモリ素子 |
| US6436526B1 (en) | 1999-06-17 | 2002-08-20 | Matsushita Electric Industrial Co., Ltd. | Magneto-resistance effect element, magneto-resistance effect memory cell, MRAM and method for performing information write to or read from the magneto-resistance effect memory cell |
| US6233172B1 (en) | 1999-12-17 | 2001-05-15 | Motorola, Inc. | Magnetic element with dual magnetic states and fabrication method thereof |
| US6404674B1 (en) * | 2001-04-02 | 2002-06-11 | Hewlett Packard Company Intellectual Property Administrator | Cladded read-write conductor for a pinned-on-the-fly soft reference layer |
| US6576969B2 (en) * | 2001-09-25 | 2003-06-10 | Hewlett-Packard Development Company, L.P. | Magneto-resistive device having soft reference layer |
| US6795281B2 (en) * | 2001-09-25 | 2004-09-21 | Hewlett-Packard Development Company, L.P. | Magneto-resistive device including soft synthetic ferrimagnet reference layer |
| US6538917B1 (en) | 2001-09-25 | 2003-03-25 | Hewlett-Packard Development Company, L.P. | Read methods for magneto-resistive device having soft reference layer |
| US7193889B2 (en) * | 2004-02-11 | 2007-03-20 | Hewlett-Packard Development Company, Lp. | Switching of MRAM devices having soft magnetic reference layers |
-
2001
- 2001-11-30 DE DE10158795A patent/DE10158795B4/de not_active Expired - Fee Related
-
2002
- 2002-11-25 WO PCT/DE2002/004323 patent/WO2003049120A2/de not_active Ceased
- 2002-11-25 KR KR1020047008163A patent/KR100613536B1/ko not_active Expired - Fee Related
- 2002-11-25 CN CNA028239296A patent/CN1599937A/zh active Pending
- 2002-11-25 JP JP2003550230A patent/JP4219814B2/ja not_active Expired - Fee Related
- 2002-11-25 EP EP02787395A patent/EP1449220B1/de not_active Expired - Lifetime
- 2002-11-25 DE DE50202668T patent/DE50202668D1/de not_active Expired - Fee Related
- 2002-11-25 US US10/497,007 patent/US7369426B2/en not_active Expired - Fee Related
- 2002-11-27 TW TW091134489A patent/TW588355B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1449220A2 (de) | 2004-08-25 |
| DE50202668D1 (de) | 2005-05-04 |
| DE10158795B4 (de) | 2005-12-22 |
| JP2005512316A (ja) | 2005-04-28 |
| JP4219814B2 (ja) | 2009-02-04 |
| EP1449220B1 (de) | 2005-03-30 |
| WO2003049120A2 (de) | 2003-06-12 |
| KR100613536B1 (ko) | 2006-08-16 |
| WO2003049120A3 (de) | 2004-02-05 |
| DE10158795A1 (de) | 2003-06-18 |
| US20050116308A1 (en) | 2005-06-02 |
| KR20050044613A (ko) | 2005-05-12 |
| US7369426B2 (en) | 2008-05-06 |
| TW588355B (en) | 2004-05-21 |
| TW200301481A (en) | 2003-07-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6888184B1 (en) | Shielded magnetic ram cells | |
| US10290337B2 (en) | Three terminal SOT memory cell with anomalous hall effect | |
| TW591813B (en) | Magnetoresistive effect element and magnetic memory having the same | |
| US7110284B2 (en) | Magnetic nonvolatile memory cell and magnetic random access memory using the same | |
| KR100574714B1 (ko) | 자성체 논리 소자 및 자성체 논리 소자 어레이 | |
| CN100350495C (zh) | 具有软基准层的磁阻器件 | |
| US7589994B2 (en) | Methods of writing data to magnetic random access memory devices with bit line and/or digit line magnetic layers | |
| US20030089933A1 (en) | Cladding of a conductive interconnect for programming a MRAM device using multiple magnetic layers | |
| JP4595541B2 (ja) | 磁気ランダムアクセスメモリ | |
| CN1379408A (zh) | 用于运行中固定的软参考层的包围层读-写导体 | |
| CN1708810A (zh) | 磁电阻随机存取存储器 | |
| US8654576B2 (en) | Spin valve element, method of driving the same, and storage device using the same | |
| KR100969285B1 (ko) | 전자 장치, 메모리 장치, 자기 메모리 장치 어레이, 전자장치 제조 방법, 하부 구조 자기 메모리 장치 제조 방법및 상부 구조 자기 메모리 장치 제조 방법 | |
| TW200907964A (en) | Structure of magnetic memory cell and magnetic memory device | |
| CN101060011A (zh) | 数据写入方法 | |
| US7016221B2 (en) | Magnetoresistive effect element, magnetic memory device and method of fabricating the same | |
| JPH0991949A (ja) | 磁性薄膜メモリ素子及び磁性薄膜メモリ | |
| CN1599937A (zh) | 包括动态参考层之磁阻记忆胞元 | |
| KR100631354B1 (ko) | 스핀 밸브 자기 저항 효과형 소자와 그 제조법, 및 이 소자를 이용한 자기 헤드 | |
| JP2009514229A (ja) | 磁気トンネル接合電流センサ | |
| US7894252B2 (en) | Magnetic memory cell and method of fabricating same | |
| JP2003188359A (ja) | 磁気的に軟らかい合成フェリ磁性体基準層を含む磁気抵抗素子 | |
| TWI334138B (en) | Magnetic memory device | |
| JP2004509476A (ja) | 磁性層系並びにかゝる層を有する構造要素 | |
| JP2002008366A (ja) | 磁気ランダムアクセスメモリおよびその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20050323 |