DE10083886T1 - Jittermessgerät und -verfahren sowie das Jittermessgerät aufweisendes Halbleiter-IC-Testgerät - Google Patents

Jittermessgerät und -verfahren sowie das Jittermessgerät aufweisendes Halbleiter-IC-Testgerät

Info

Publication number
DE10083886T1
DE10083886T1 DE10083886T DE10083886T DE10083886T1 DE 10083886 T1 DE10083886 T1 DE 10083886T1 DE 10083886 T DE10083886 T DE 10083886T DE 10083886 T DE10083886 T DE 10083886T DE 10083886 T1 DE10083886 T1 DE 10083886T1
Authority
DE
Germany
Prior art keywords
measuring device
jitter measuring
semiconductor
well
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10083886T
Other languages
English (en)
Inventor
Takahiro Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10083886T1 publication Critical patent/DE10083886T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
    • G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE10083886T 1999-11-19 2000-11-16 Jittermessgerät und -verfahren sowie das Jittermessgerät aufweisendes Halbleiter-IC-Testgerät Withdrawn DE10083886T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP33038999 1999-11-19
PCT/JP2000/008076 WO2001038888A1 (fr) 1999-11-19 2000-11-16 Appareil et procede de mesure d'instabilite et appareil de controle pour circuit integre a semi-conducteur equipe de l'appareil de mesure d'instabilite

Publications (1)

Publication Number Publication Date
DE10083886T1 true DE10083886T1 (de) 2002-04-11

Family

ID=18232066

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10083886T Withdrawn DE10083886T1 (de) 1999-11-19 2000-11-16 Jittermessgerät und -verfahren sowie das Jittermessgerät aufweisendes Halbleiter-IC-Testgerät

Country Status (3)

Country Link
JP (1) JP3609780B2 (de)
DE (1) DE10083886T1 (de)
WO (1) WO2001038888A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7856330B2 (en) 2006-02-27 2010-12-21 Advantest Corporation Measuring apparatus, testing apparatus, and electronic device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6934647B2 (en) * 2002-10-22 2005-08-23 Agilent Technologies, Inc. Efficient sampling of digital waveforms for eye diagram analysis

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08179013A (ja) * 1994-12-26 1996-07-12 Hitachi Ltd Ｌｓｉテスタ
JPH08262082A (ja) * 1995-03-23 1996-10-11 Advantest Corp サンプリング・デジタイザ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7856330B2 (en) 2006-02-27 2010-12-21 Advantest Corporation Measuring apparatus, testing apparatus, and electronic device

Also Published As

Publication number Publication date
WO2001038888A1 (fr) 2001-05-31
JP3609780B2 (ja) 2005-01-12

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8139 Disposal/non-payment of the annual fee