CN2419594Y - Optical Measuring Instrument for Object Vibration Amplitude - Google Patents

Optical Measuring Instrument for Object Vibration Amplitude Download PDF

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Publication number
CN2419594Y
CN2419594Y CN 00217068 CN00217068U CN2419594Y CN 2419594 Y CN2419594 Y CN 2419594Y CN 00217068 CN00217068 CN 00217068 CN 00217068 U CN00217068 U CN 00217068U CN 2419594 Y CN2419594 Y CN 2419594Y
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China
Prior art keywords
light
measuring instrument
vibration amplitude
lens
beam splitter
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Expired - Fee Related
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CN 00217068
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Chinese (zh)
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王向朝
王学锋
钱锋
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Abstract

An optical measuring instrument for vibration amplitude of object is composed of the first lens, the second lens, beam splitter, polarizing converter and object to be measured. The light beam with speckle noise reflected by the object to be measured is reflected by the polarization beam splitter and converged to the photorefractive crystal by the fourth lens. The phase conjugate light generated by the photorefractive crystal is reflected to the object to be measured by the polarization beam splitter, and the phase conjugate light reflected by the object to be measured does not have speckle noise. Therefore, the vibration amplitude of the object to be measured, whether the surface is smooth or rough, can be detected with sub-nanometer resolution.

Description

The optical measuring instrument of object vibration amplitude
The utility model relates to the measuring instrument of object vibration amplitude, and particularly this measuring instrument is not only applicable to ganoid testee, and is applicable to shaggy testee.
Formerly in the technology, as a kind of effective untouchable precision measuring instrument, laser interferometer has obtained using widely.When using traditional homodyne or high-precision difference interference measuring instrument to measure, in order to obtain the interference signal of high s/n ratio, the surface of testee is necessary for the shiny surface near minute surface.Yet the surface of most testees is coarse.Contain a large amount of speckle noises from the light of such surface reflection, this causes difficulty to high-acruracy survey.The interferometer that is used for measuring vibrations that proposes such as Suzuki Xiaochang (Takamasa Suzuki) Mr. of Japanese Nigata (Niigata) university, (referring to technology formerly: Takamasa Suzuki, Takao Okada, OsamiSasaki, and Takeo Maruyama, " Real-time vibration measurement using a feedback typeof laser diode interferometer with an optical fiber; " Opt.Eng., 1997,36 (9), 2496-2502.) if testee wherein is the object of rough surface, can't realize that then the high-quality of vibration amplitude is measured.In addition, also only be 40 nanometer (4 * 1O under the best situation of the vibration amplitude measuring accuracy of this interferometer -8Rice).
The purpose of this utility model is exactly in order to overcome the deficiency in the above-mentioned technology formerly, a kind of optical measuring instrument of Measuring Object vibration amplitude to be provided, and it will utilize the phase compensation characteristic of phase-conjugation light, in conjunction with the structure of sinusoidal phase modulation, realizes Ya Nami (10 -10Rice is to 10 -12Rice) precision ground Measuring Object vibration amplitude, and no matter the surface of testee is smooth or coarse all can measuring.
The optical measuring instrument of object vibration amplitude of the present utility model, its structure as shown in Figure 1.It comprises light source 1, along the linearly polarized light beam G of light source 1 emission 0Working direction on be equipped with first lens, 2, the second lens 3 and beam splitter 5 with light source 1 successively with optical axis O-O ground.Light beam G 0Be divided into transmitted light beam Gt through beam splitter 5 1With folded light beam Gf 1, at transmitted light beam Gt 1Be equipped with polarization beam apparatus 8 successively on the light path of advancing and polarisation transformer 11 shines testee 12.Folded light beam Gf on the reflecting surface of beam splitter 5 relative light sources 1 1Light path on be equipped with reference to reflection attenuation device 4.Along the folded light beam Gf on the reflecting surface of beam splitter 5 relative testees 12 2Light path on be equipped with the 3rd lens 6 and photoelectric apparatus 7.The electric signal of photoelectric apparatus 7 outputs is by amplifier 13 and data collecting card 14 input computing machines 15.On the reflection direction of the polarization beam apparatus 8 relative testee 12 reflectings surface direction vertical, be equipped with the 4th lens 9 with light source 1 optical axis O-O.Focus place at the 4th lens 9 is equipped with photorefractive crystal 10.That is to say the light beam Gp that sees through polarisation transformer 11 by testee 12 reflection backs 2Polarization direction and the light beam Gp that sees through for the first time before the polarisation transformer 11 1The polarization direction vertical.Light beam Gp 2Reflect after the 4th lens 9 are assembled to photorefractive crystal 10 by polarization beam apparatus 8.The phase-conjugation light that is produced by photorefractive crystal 10 is polarized beam splitter 8 reflections behind the 4th lens 9 collimations, seeing through polarisation transformer 11 backs shines on the testee 12 for the second time, the phase-conjugation light that reflects by testee 12 behind polarisation transformer 11, the light beam Gp before polarization direction and the testee of incident for the first time 12 1The polarization direction is identical.This light beam is back to beam splitter 5 after seeing through polarization beam apparatus 8, is assembled to photoelectric apparatus 7 through the 3rd lens 6 by beam splitter 5 reflections again.
Above said light source 1 be meant and in measurement mechanism of the present utility model, can make photorefractive crystal 10 produce LASER Light Source phase-conjugation light, that have a certain specific wavelength, be gas laser, or semiconductor laser, or solid state laser etc.
Said is beam reflection elements with reference to reflection attenuation device 4, and its reflectivity satisfies when measuring with after beam splitter 5 cooperates, and the object light that photoelectric apparatus 7 receives and the beam intensity ratio of reference light approached 1: 1.So with reference to the reflection attenuation device is to plate the parallel flat 401 of analysing light film and anti-reflection film respectively by the two sides to constitute with attenuator 404, as shown in Figure 2.Or plate parallel flat 401 and two polarizers 402,403 of analysing light film and anti-reflection film respectively by the two sides and constitute, as shown in Figure 1.Or only plate the parallel flat of analysing light film and anti-reflection film respectively and constitute by a two sides.
Said beam splitter 5 is meant and incident light can be divided into the element of two-beam by certain splitting ratio, be Amici prism, or parallel flat of analysing light film and anti-reflection film etc. plated on the two sides respectively.
Said photoelectric apparatus 7 is electrooptical devices such as photodiode, or photoelectric cell.
Said polarization beam apparatus 8 is with the orthogonal two-beam in polarization direction separately that is to say, in the utility model, as depicted in figs. 1 and 2, allows the polarization direction be that the light beam of A sees through, and allows polarization direction another Shu Guang vertical with A be reflected.Be polarization splitting prism, or the polarization parallel flat board etc.
After said photorefractive crystal 10 is meant that light source 1 emitted light beams shines on this photorefractive crystal 10 through above-mentioned each optical element, can produce the photorefractive crystal of self-pumping phase-conjugation light, be barium titanate (BaTiO 3) crystal, or potassium sodium strontium barium niobate (KNSBN) crystal, or the strontium barium niobate crystal etc.
Said polarisation transformer 11 is meant a branch of polarized light by it, by testee 12 reflections, returns the optical element that changes 90 degree once more by its rear polarizer direction, is Faraday rotator, or quarter-wave plate etc.
Structure as depicted in figs. 1 and 2 is the linearly polarized light G of A when the polarization direction that light source 1 sends 0Behind first lens 2 and second lens, 3 expansion bundles, see through the light beam Gt of beam splitter 5 1, shine on the testee 12 through polarization beam apparatus 8 and polarisation transformer 11.After the light beam that contains a large amount of speckle noises of testee 12 reflections saw through polarisation transformer 11, its polarization direction became the light beam Gp of B 2The polarization direction vertical with polarization direction A.Light beam Gp 2After polarization beam apparatus 8 reflections, assemble to photorefractive crystal 10 by the 4th lens 9.The phase-conjugation light that is produced by photorefractive crystal 10 collimates through the 4th lens 9, by polarization beam apparatus 8 reflections, shine testee 12 after seeing through polarisation transformer 11 again, because phase-conjugation light has the phase compensation characteristic, therefore the phase-conjugation light that is reflected by testee 12 for the second time no longer contains dapple noise.Simultaneously, these phase conjugation light transmission polarisation transformer 11 rear polarizer directions become A again, and this light beam sees through polarization beam apparatus 8 backs by beam splitter 5 reflections, is assembled to photoelectric apparatus 7 by the 3rd lens 6 then, and this Shu Guang is called object light.The linearly polarized light beam G that sends by light source 1 0Folded light beam Gf after beam splitter 5 reflections 1Shine with reference on the reflection attenuation device 4.After seeing through beam splitter 5 again with reference to the folded light beam of reflection attenuation device 4, assemble to photoelectric apparatus 7, be called reference light by reference reflection attenuation device 4 beam reflected by the 3rd lens 6.Reference light and object light interference.After the electric signal that is received back output by photoelectric apparatus 7 was amplified by amplifier 13, data collecting card 14 was stored in the computing machine 15 to carry out data processing after the analog electrical signal of amplifier 13 outputs is converted to digital signal.
Photoelectric apparatus 7 detected interference signals
I (t)=I 0(t)+S 0(t) cos[zcos (ω cT+ θ)+α 0+ α (t)], (1) wherein, I 0(t) and S 0(t) be respectively the amplitude of interference signal DC component and AC compounent, α 0Phase place for testee 12 interference signal when static.α (t) is the phase change that testee 12 vibrations are introduced.ω cBe the frequency of sinusoidal phase modulation, t is the time, and θ is the initial phase of modulation signal.The amplitude z=4 π a/ λ of interference signal phase modulation (PM) 0, wherein a is a vibration amplitude to be measured, λ 0Centre wavelength for light source 1.Formula (1) is carried out Fourier transform try to achieve the z value.The vibration amplitude of testee 12
a=λ 0z/4π。(2) measuring accuracy of z reaches 0.01rad and is easier to realize.If adopting wavelength is the Argon ion laser of 514nm, the measuring accuracy of amplitude is 0.4nm.If the measuring accuracy of z is brought up to 0.001rad, then the measuring accuracy of amplitude is brought up to 0.04nm (4 * 10 -11Rice).
The utility model has the advantages that:
1. owing to contain photorefractive crystal 10 in the measuring instrument of the present utility model, produce phase-conjugation light, can eliminate the speckle noise that testee 12 brings with phase compensation characteristic.Therefore measuring instrument of the present utility model has enlarged the scope of measuring object greatly to no matter being that ganoid or coarse testee 12 all is suitable for.Make the surface of testee 12 expand general more coarse surfaces such as stainless steel, aluminium sheet to by shiny surface near minute surface.
2. owing to contain photorefractive crystal 10 in the measuring instrument of the present utility model, produce phase-conjugation light, can eliminate the speckle noise that testee 12 brings with phase compensation characteristic.Even measured surface is a rough surface, the resolution of its measurement still can reach Ya Nami.Therefore, measuring accuracy height.Even measured surface is a rough surface, measuring accuracy still can reach inferior nanometer scale (10 -10Rice is to 10 -12Rice).
3. measuring instrument of the present utility model is simple in structure, compact, reasonable.
Description of drawings
Fig. 1 is the synoptic diagram of the optical measuring instrument of object vibration amplitude of the present utility model, is to plate parallel-plate 401 and two polarizers 402 and 403 of analysing light film and anti-reflection film respectively by the two sides to constitute with reference to reflection attenuation device 4 wherein.
Fig. 2 is the structural representation of measuring instrument of the present utility model, is to be coated with the parallel flat 401 of analysing light film and anti-reflection film respectively by the two sides to constitute with attenuator 404 with reference to reflection attenuation device 4 wherein.
Embodiment:
Structure as shown in Figure 2.Wherein light source 1 is the argon ion gas laser of wavelength 514nm, and beam splitter 5 is parallel flats that light film, another side plating anti-reflection film are analysed in the one side plating.Photoelectricity receiving element 7 is a photodiode.Polarization beam apparatus 8 is polarization splitting prisms.Being coated with the parallel flat 401 of analysing light film and anti-reflection film with reference to reflection attenuation device 4 respectively by the two sides constitutes with attenuator 404.Polarisation transformer 11 is Faraday rotators.Photorefractive crystal 10 is barium titanate (BaTiO 3) crystal.Testee 12 is for having the aluminium sheet of rough surface.The vibration amplitude that records this aluminium sheet is 130nm, and measuring accuracy is 0.5nm, and resolution is less than 5 * 10 -10Rice.

Claims (6)

1. the optical measuring instrument of an object vibration amplitude comprises: light source (1), and along the linearly polarized light beam (G of light source (1) emission 0) on the working direction, with the same optical axis of light source (1) (O-O) be equipped with first lens (2), second lens (3) and beam splitter (5) successively; Beam splitter (5) transmitted light beam (Gt 1) light path on be equipped with polarisation transformer (11) and testee (12); Folded light beam (Gf on the reflecting surface of the relative light source (1) of beam splitter (5) 1) light path on be equipped with reference to reflection attenuation device (4); Folded light beam (Gf on the reflecting surface of the relative testee (12) of beam splitter (5) 2) light path on be equipped with the 3rd lens (6) and photoelectric apparatus (7); The electric signal of photoelectric apparatus (7) output is by amplifier (13) and data collecting card (14) input computing machine (15); It is characterized in that between beam splitter (5) and the polarisation transformer (11), be equipped with polarization beam apparatus (8) (O-O) with beam splitter (5) and the same optical axis of polarisation transformer (11); Be equipped with the 4th lens (9) on polarization beam apparatus (8) direction that relatively reflection direction of testee (12) reflecting surface is vertical with light source (1) optical axis (O-O); The focus place of the 4th lens (9) is equipped with photorefractive crystal (10).
2. the optical measuring instrument of object vibration amplitude according to claim 1 is characterized in that said light source (1) is a gas laser, or semiconductor laser, or solid state laser.
3. the optical measuring instrument of object vibration amplitude according to claim 1 is characterized in that said photorefractive crystal (10) is a barium titanate crystal, or potassium sodium strontium barium niobate crystal, or the strontium barium niobate crystal.
4. the optical measuring instrument of object vibration amplitude according to claim 1, it is characterized in that said is to plate the parallel flat (401) of analysing light film and anti-reflection film respectively by the two sides to plate parallel flat (401) and two polarizers (402 of analysing light film and anti-reflection film respectively with attenuator (404) formation or by the two sides with reference to reflection attenuation device (4), 403) constitute, or plate the parallel flat of analysing light film and anti-reflection film respectively by a two sides and constitute.
5. the optical measuring instrument of object vibration amplitude according to claim 1 is characterized in that said polarization beam apparatus 8 is polarization splitting prisms, or the polarization parallel flat board.
6. the optical measuring instrument of object vibration amplitude according to claim 1 is characterized in that said polarisation transformer 11 is Faraday rotators, or quarter-wave plate.
CN 00217068 2000-03-30 2000-03-30 Optical Measuring Instrument for Object Vibration Amplitude Expired - Fee Related CN2419594Y (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101620764B (en) * 2009-06-15 2012-11-07 上海华魏光纤传感技术有限公司 Distributed optical fiber vibration sensing system based on polarization beam splitting detection and sensing method
CN104819935A (en) * 2014-09-24 2015-08-05 绍兴文理学院 Micro-cantilever heat vibration signal measuring device
CN105203199A (en) * 2015-06-30 2015-12-30 庄重 Ultra-high sensitivity vibration sensor based on micro-nano scale material optical mechanical and electrical system
CN106338334A (en) * 2016-09-26 2017-01-18 中北大学 Dual acousto-optic modulation phase conjugate heterodyne detection device
CN110346304A (en) * 2019-06-26 2019-10-18 华中科技大学 A kind of optical fiber polarisation spectrum analysis system based on timeslot multiplex

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101620764B (en) * 2009-06-15 2012-11-07 上海华魏光纤传感技术有限公司 Distributed optical fiber vibration sensing system based on polarization beam splitting detection and sensing method
CN104819935A (en) * 2014-09-24 2015-08-05 绍兴文理学院 Micro-cantilever heat vibration signal measuring device
CN104819767A (en) * 2014-09-24 2015-08-05 绍兴文理学院 Low noise micro-cantilever beam thermal vibration signal measuring device
CN105203199A (en) * 2015-06-30 2015-12-30 庄重 Ultra-high sensitivity vibration sensor based on micro-nano scale material optical mechanical and electrical system
CN106338334A (en) * 2016-09-26 2017-01-18 中北大学 Dual acousto-optic modulation phase conjugate heterodyne detection device
CN106338334B (en) * 2016-09-26 2019-01-15 中北大学 A kind of dual-acousto-optic phase modulation conjugation heterodyne detection device
CN110346304A (en) * 2019-06-26 2019-10-18 华中科技大学 A kind of optical fiber polarisation spectrum analysis system based on timeslot multiplex

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