CN115542629A - Phase amplification method, system and test method based on nonlinear optical harmonic - Google Patents
Phase amplification method, system and test method based on nonlinear optical harmonic Download PDFInfo
- Publication number
- CN115542629A CN115542629A CN202211478791.XA CN202211478791A CN115542629A CN 115542629 A CN115542629 A CN 115542629A CN 202211478791 A CN202211478791 A CN 202211478791A CN 115542629 A CN115542629 A CN 115542629A
- Authority
- CN
- China
- Prior art keywords
- light
- polarization
- reflector
- wave plate
- beam splitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 73
- 230000003321 amplification Effects 0.000 title claims abstract description 54
- 238000003199 nucleic acid amplification method Methods 0.000 title claims abstract description 54
- 238000000034 method Methods 0.000 title claims abstract description 33
- 238000010998 test method Methods 0.000 title claims description 6
- 230000010287 polarization Effects 0.000 claims abstract description 123
- 238000012360 testing method Methods 0.000 claims description 57
- 239000013078 crystal Substances 0.000 claims description 33
- XBJJRSFLZVLCSE-UHFFFAOYSA-N barium(2+);diborate Chemical compound [Ba+2].[Ba+2].[Ba+2].[O-]B([O-])[O-].[O-]B([O-])[O-] XBJJRSFLZVLCSE-UHFFFAOYSA-N 0.000 claims description 15
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 claims description 15
- 238000006073 displacement reaction Methods 0.000 claims description 14
- 239000000919 ceramic Substances 0.000 claims description 10
- 238000001914 filtration Methods 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 2
- 230000019771 cognition Effects 0.000 abstract description 2
- 230000008859 change Effects 0.000 description 19
- 238000005259 measurement Methods 0.000 description 15
- 230000008569 process Effects 0.000 description 10
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000011160 research Methods 0.000 description 4
- 238000010587 phase diagram Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 230000005610 quantum mechanics Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
- G02F1/354—Third or higher harmonic generation
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/39—Non-linear optics for parametric generation or amplification of light, infrared or ultraviolet waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0261—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods polarised
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Lasers (AREA)
Abstract
The phase amplification method based on the nonlinear optical harmonic waves comprises the steps of carrying out polarization beam splitting on reference light to obtain light beams a and light beams b with different polarization states, carrying out interference on the light beams a and the light beams b after m times of frequency doubling to obtain interference light, and enabling the phase of the interference light to be 2 times of that of the reference light m And (4) doubling. The phase amplification method breaks through the cognition that the traditional frequency doubling module is used for adjusting the optical frequency, applies the frequency doubling module to the optical interference technology, and realizes the amplification of the laser interference phase. The phase amplification method provided by the invention provides a new direction and thought for phase amplification, and can greatly promote the field of phase measurementResearch and development of science and application of the domain.
Description
Technical Field
The invention relates to the technical fields of laser technology, nonlinear optical physical technology, optical measurement and the like, in particular to a phase amplification method, a system and a test method based on nonlinear optical harmonic waves.
Background
Phase is one of the most important parameters in wave optics and quantum mechanics. The relative phase between two optical fields in an interferometer or between superposition states in quantum mechanics is very important, because dynamic changes of many physical quantities, including displacement, temperature, electric and magnetic fields, can be translated into changes in the relative phase between optical fields or wave functions. Most of the high-precision measurement tasks can be converted into the measurement of phase change in a specific physical process. The change in the relative phase between the two light fields is the basic principle of measuring the physical quantity that guides this change. Therefore, it would be advantageous if the relative phase could be amplified to improve measurement resolution.
The traditional MZ interferometer is a linear interferometer, only one wavelength of light inside the interferometer runs, and a frequency doubling module is not arranged in the interferometer structure. In the past, the research on the nonlinear optical interferometer is to improve the measurement capability of the interferometer by amplifying the amplitude of a signal (ideally, under the premise of amplifying the signal with high gain, the noise level of an optical gain process can be completely inhibited). The method is mainly based on a nonlinear gain amplification technology, combines a nonlinear beam splitting and combining technology, and improves the measurement capacity of the interferometer through the interference detection of correlation detection.
In quantum optics, one well-known method of achieving phase amplification is based on the number of multiple photons and the entangled state of the multiple paths, i.e., the NOON state. The NOON state contains N equally-superimposed indistinguishable particles, all in either path A or B. In the NOON state interference process, the speed of phase change is N times of the phase of a single photon. Since the effective de broglie wavelength of N photons is 1/N of a single photon, this enables phase super-resolution in precision measurements.
Although the NOON state is useful for phase amplification and precision metrology applications, it is very difficult to prepare a high photon count NOON state. The NOON state of the highest photon count produced to date is 10 photons. Furthermore, when N is large, the probability of detection is low and the high photon count NOON state is very sensitive to any optical loss experienced by the photons.
Therefore, the phase amplification method is an important means for improving the resolution of phase measurement, and establishing a more robust phase amplification method than using the NOON state has important research and application significance.
Disclosure of Invention
In order to overcome the defects of the phase amplification technology in the prior art, the invention provides a phase amplification method based on nonlinear optical harmonic, which realizes the phase amplification of light by frequency doubling before light interference and has the characteristics of strong robustness, convenient and stable measurement and easy expansion.
The invention provides a phase amplification method based on nonlinear optical harmonic, which is characterized in that polarized beam splitting is carried out on reference light to obtain light beams a and light beams b with different polarization states, the light beams a and the light beams b are subjected to m times of frequency doubling and then are subjected to beam combining and interference to obtain light beams a and light beams b, and the light beams a and the light beams b are respectively subjected to 2 times of frequency doubling and then subjected to beam combining and interference m The combined beam after the sub-harmonic is interfered light, so that the phase of the interfered light is 2 of the reference light m And (4) multiplying.
Preferably, the paths of the polarization-separated light beams a and b are the same.
Preferably, the optical field of the interference light after n harmonics is:
E NL (nω)=E 1 '(nω)+e inΦ(ω)+iΔΦ(nω) E 2 '(nω)；
the interference intensity distribution of the interference light after n harmonics is as follows:
I(nω){1+cos[nΦ(ω)+ΔΦ(nω)]}；
wherein E is NL (n ω) represents the light field of the combined beam obtained by subjecting the reference light polarization-divided beam a and the reference light polarization-divided beam b to n harmonics, respectively, E 1 ' (n ω) represents the light field of the light beam a after passing through the n-th harmonic, E 2 ' (n ω) denotes the optical field of beam b after n harmonics; Φ (ω) represents a phase difference between the light beam a and the light beam b; delta phi (n omega) is a phase offset parameter after the light beam a and the light beam b respectively pass through n harmonics, e represents a natural constant, and i represents an imaginary number;
i (n ω) is the intensity of the polarized beam-split light after n harmonics.
The invention also provides a phase amplification system based on nonlinear optical harmonics, which is used for realizing the phase amplification method based on the nonlinear optical harmonics, and the system comprises: the device comprises a polarization beam splitting and combining device, a frequency doubling module and an interference module;
the polarization beam splitting and combining device is used for receiving the reference light, and splitting the reference light after polarization to form a light beam a and a light beam b;
the frequency doubling module is arranged on the propagation paths of the light beam a and the light beam b and is used for performing frequency doubling treatment on the light beam a and the light beam b, and the frequency doubling times of the light beam a and the light beam b are the same;
the interference module is used for receiving the light beam a and the light beam b after frequency doubling processing and carrying out polarization interference.
Preferably, the light beams a and b have the same propagation path, and a plurality of frequency doubling modules are sequentially arranged on the light path.
Preferably, the polarization beam splitting and combining device comprises: the device comprises a half wave plate, a polarization beam splitter, a first quarter wave plate, a first reflector, a second quarter wave plate and a second reflector;
the half-wave plate is arranged at the incident end of the polarization beam splitter and is used for adjusting the splitting power proportion of the polarization beam splitter; the polarization beam splitter is used for carrying out polarization beam splitting on the light beam after the polarization of the light beam is adjusted by the half-wave plate;
the first reflector is arranged on a reflected light propagation path of the polarization beam splitter, the first quarter wave plate is arranged on an incident surface of the first reflector, and the first quarter wave plate is used for adjusting the polarization of reflected light of the polarization beam splitter; the first reflector is used for reflecting the light passing through the first quarter-wave plate;
the second reflector is arranged on the transmission light propagation path of the polarization beam splitter, and the second quarter wave plate is arranged on the incident surface of the second reflector; the second quarter-wave plate is used for adjusting the polarization of the transmitted light of the polarization beam splitter, so that the light reflected by the second reflector is reflected on the polarization beam splitter.
Preferably, the polarization beam splitting and combining device further comprises a displacement table and piezoelectric ceramics; the displacement table is used for bearing the first reflecting mirror and is installed in a sliding mode;
the half-wave plate, the polarization beam splitter, the first quarter-wave plate, the first reflector, the displacement table, the second quarter-wave plate, the second reflector and the piezoelectric ceramic are combined into the polarization beam splitting Michelson interferometer, and the displacement table is used for correcting the arm difference of the polarization beam splitting Michelson interferometer; and the piezoelectric ceramic is arranged on the back surface of the second reflecting mirror and is used for scanning the arm difference of the polarization beam splitting Michelson interferometer.
Preferably, the interference module comprises an aperture unit and a first polarizer; the aperture unit is positioned on the light-emitting direction of the last frequency doubling module on the light path, and the first polarizer is used for receiving emergent light passing through the aperture unit, performing polarization interference and outputting the emergent light.
Preferably, the device further comprises a laser, wherein the laser is used for emitting reference light;
the frequency doubling module comprises: the device comprises a first focusing lens, a dichroic mirror, a bicolor polarization beam splitter, a bicolor half-wave plate, a third reflector, a periodically polarized lithium niobate crystal, a fourth reflector and a first collimating lens;
the first focusing lens is arranged in the incident direction of the dichroic mirror and used for focusing incident light, so that the focused light beams are transmitted on the incident surface of the dichroic mirror;
the dichroic mirror is arranged in the transmission direction of the dichroic mirror, and the first collimating lens is arranged in the reflection direction of the dichroic mirror;
the dichroic half-wave plate and the third reflector are sequentially arranged in the outgoing direction of transmitted light of the dichroic polarization beam splitter, and the fourth reflector is arranged in the outgoing direction of reflected light of the dichroic polarization beam splitter; the periodically poled lithium niobate crystal is arranged between the third reflector and the fourth reflector;
the transmitted light emitted by the bicolor polarization beam splitter is subjected to polarization state adjustment by a bicolor half-wave plate, reflected by a third reflector to the periodically polarized lithium niobate crystal for frequency doubling treatment, reflected by a fourth reflector back to the bicolor polarization beam splitter, and reflected by the bicolor polarization beam splitter back to the dichroic mirror;
reflected light emitted by the two-color polarization beam splitter is reflected to the periodically polarized lithium niobate crystal by the fourth reflector for frequency doubling treatment, is projected to a two-color half-wave plate by the third reflector to adjust the polarization state, and is transmitted back to the two-color mirror by the two-color polarization beam splitter;
the light beams projected to the dichroic mirror by the dichroic polarizing beam splitter are reflected to a first collimating lens for collimating;
or the frequency doubling module comprises a second focusing lens, a beta barium borate crystal, a second collimating lens and a band-pass filter which are sequentially arranged along the light propagation direction, and the incident light is focused by the second focusing lens, frequency-doubled by the beta barium borate crystal, collimated by the second collimating lens and then projected to the band-pass filter for spatial filtering.
In order to verify the effectiveness of the phase amplification method based on the nonlinear optical harmonic wave, the invention also provides a phase amplification system test method based on the nonlinear optical harmonic wave, which comprises the following steps:
s1, building the phase amplification system based on the nonlinear optical harmonic;
s2, setting a test position at an incident end of each frequency doubling module along the light propagation direction of the light path;
s3, testing the phase of the interference light passing through the interference module, and testing the phase of the light beam at each testing position after polarization interference;
when the testing position is tested, the testing reflector is arranged at the testing position, the testing polarizer and the testing optical power meter are sequentially arranged in the light outgoing direction of the testing reflector, the testing polarizer is used for carrying out polarization interference on the light beam a and the light beam b reflected by the testing reflector, and the testing optical power meter is used for measuring the power and the phase of interference light passing through the testing polarizer.
The invention has the advantages that:
(1) The phase amplification method based on the nonlinear optical harmonic breaks the cognition that the traditional frequency doubling module is used for adjusting the optical frequency, applies the frequency doubling module to the optical interference technology, and realizes the amplification of the interference optical phase. The phase amplification method provided by the invention provides a new direction and thought for phase amplification, and can greatly promote the research and development of science and application in the field of phase measurement.
(2) In the invention, the split light beams can be transmitted through the same path, which is beneficial to simplifying the light path and saving the cost.
(3) The phase amplification system based on the nonlinear optical harmonic wave is essentially a Michelson interferometer added with a frequency doubling module, and through the addition of the frequency doubling module, the traditional interferometer has a phase amplification function, and a new research direction is provided for the improvement of the measurement precision of the interferometer.
(4) According to the invention, the frequency doubling module is added in the interferometer, so that the second harmonic generation process of nonlinear optics in the interferometer is realized, and the multi-stage second harmonic process is introduced in the interferometer, so that the phase amplification of interference waveforms relative to reference light is realized at the output end of the interferometer. The phase amplification method has great application potential in various precise measurement scenes that optical characteristics such as dispersion and absorption of transparent materials and other displacement, angle, electric field and the like can be converted into optical phase, and plays an important role in scientific and application research in the field of future precise measurement.
(5) In the invention, the paths of the two split beams are the same, namely the two arms of the polarization beam splitting and combining device, namely the Michelson interferometer, travel the same path, thereby realizing better phase difference stability. Meanwhile, two paths are distinguished by polarization, so that the system can accurately identify the two beams of light, the respective frequency doubling of the two beams of light is realized, and the interference precision is improved.
(6) According to the invention, through the arrangement of the mobile platform and the piezoelectric ceramic, the arm difference of the polarization beam splitting and combining device, namely the Michelson interferometer, can be adjusted, and the system precision is further improved.
(7) The frequency doubling module in the invention selects a frequency doubling module based on a Sagnac structure or a frequency doubling module based on a beta barium borate crystal, thereby ensuring the frequency doubling stability and realizing higher frequency doubling efficiency. In particular, in the embodiment of the invention, the phase matching of the 0-type quasi-phase of the two frequency doubling modules PPLN is matched with the phase matching of the I-type birefringence of the BBO, so that the frequency doubling efficiency and stability are further improved.
(8) The invention carries out light beam filtering through the small hole unit, optimizes the spatial mode of the light beam and is beneficial to improving the interference intensity.
(9) According to the phase amplification system testing method based on the nonlinear optical harmonic wave, provided by the invention, the reflector is adopted to configure the testing module so as to obtain the wave forms of the light beams before and after each frequency doubling, the phase amplification theory based on the nonlinear optical harmonic wave is verified under the condition of not changing the light path, the verification process is reliable, the result is reliable, and a foundation is laid for the popularization of the phase amplification based on the nonlinear optical harmonic wave provided by the invention.
Drawings
FIG. 1 (a) is a schematic diagram of a phase amplification method based on nonlinear optical harmonics according to the present invention;
FIG. 1 (b) is a schematic diagram of a conventional interferometer;
FIG. 2 is a block diagram of an embodiment of a nonlinear optical harmonic based phase amplification system;
FIG. 3 (a) is a block diagram of a nonlinear optical harmonic based phase amplification system in an embodiment;
FIG. 3 (b) is a schematic view of a first testing position in the example;
FIG. 3 (c) is a schematic view of a second testing position in the example;
fig. 4 is a waveform diagram of interference light corresponding to different frequency doubling times.
100. A beam splitter I; 200. a frequency doubling module a; 300. a frequency doubling module b; 400. a beam splitter II; 500. a reflector I; 600. a reflector II;
1. a laser; 2. a half-wave plate; 3. a polarizing beam splitter; 4. a first quarter wave plate; 5. a first reflecting mirror; 6. a displacement stage; 7. a second quarter wave plate; 8. a second reflector; 9. piezoelectric ceramics; 10. a first test mirror; 11. a first test polarizer; 12. a first test optical power meter; 13. a fifth mirror; 14. a first focusing lens; 15. a dichroic mirror; 16. a dichroic polarizing beam splitter; 17. a dichroic half-wave plate; 18. a third reflector; 19. periodically polarizing the lithium niobate crystal; 20. a fourth mirror; 21. a first collimating lens; 22. a second test mirror; 23. a second test polarizer; 24. a second test optical power meter; 25. a second focusing lens; 26. beta barium borate crystal; 27. a second collimating lens; 28. a band-pass filter; 29. an orifice unit; 30. a first polarizer; 31. a first optical power meter.
The noun explains:
first-order frequency-doubling light interference intensity: the interference intensity of the light of the two beams of split reference light after primary frequency doubling is respectively obtained;
interference intensity of m-order frequency-doubled light: the interference intensity of the light of the two beams of split reference light after m times of frequency doubling is respectively obtained; multiplication number m equal to 2 m A sub-harmonic;
reference light interference intensity: reference light split light interference intensity of the light of the direct-coupled beam;
reference light polarization-divided light: and the polarization states of the two beams of light are respectively a vertical state and a horizontal state.
Detailed Description
The principle of the phase amplification method based on nonlinear optical harmonics is shown in fig. 1 (a), and is equivalent to a MZ (mach-zehnder) interferometer with a frequency doubling module, in which reference light is divided into polarization beams, frequency doubling is performed on each beam m times, the beams are combined and subjected to polarization interference, and the phase of the obtained interference light is 2 times of the phase of the reference light m And m is more than or equal to 1.
Example 1: phase amplification system based on nonlinear optical harmonic
Referring to fig. 2 and 3 (a), in this embodiment, a phase amplification system based on nonlinear optical harmonics is provided, which includes a laser 1, a polarization beam splitting and combining device, a first frequency doubling module, a second frequency doubling module, and an interference module.
In this embodiment, the polarization beam splitting and combining device adopts a polarization beam splitting michelson interferometer, which includes: the device comprises a half-wave plate 2, a polarization beam splitter 3, a first quarter-wave plate 4, a first reflecting mirror 5, a displacement table 6, a second quarter-wave plate 7, a second reflecting mirror 8 and piezoelectric ceramics 9.
The first frequency doubling module consists of a fifth reflector 13, a first focusing lens 14, a dichroic mirror 15, a two-color polarization beam splitter 16, a two-color half-wave plate 17, a third reflector 18, a periodically polarized lithium niobate crystal 19, a fourth reflector 20 and a first collimating lens 21; the second frequency doubling module is composed of a second focusing lens 25, a beta barium borate crystal 26, a second collimating lens 27 and a band-pass filter 28. The interference module consists of an aperture unit 29, a first polarizer 30 and a first optical power meter 31.
In this embodiment, the roles and parameters of the optical device are selected as follows.
The laser adopts a 1560nm femtosecond pulse laser, the central wavelength of the laser is 1560nm, the pulse repetition frequency is 80MHz, the output power is more than 1W, and the pulse width is 150 femtoseconds. The pulse laser output by the laser 1 is used as the pump light of the polarization beam splitting michelson interferometer, the first frequency doubling module and the second frequency doubling module.
The half-wave plate 2 is a half-wave plate with the working wavelength of 1560nm and is used for adjusting the light splitting power proportion on the polarization beam splitter 3;
the polarization beam splitter 3 is used for polarization beam splitting of the pulse laser after polarization adjustment by the half-wave plate 2.
The first quarter-wave plate 4 is used to adjust the polarization of the reflected light of the polarization beam splitter 3, so that the polarization state of the pulse laser light reflected by the first mirror 5 is changed to horizontal polarization to be transmitted on the polarization beam splitter 3.
The first reflector 5 is used for reflecting the pulse laser passing through the first quarter-wave plate 4;
the displacement stage 6 is used to correct the arm difference of the polarizing beam splitting michelson interferometer.
The second quarter-wave plate 7 is used to adjust the polarization of the transmitted light of the polarization beam splitter 3 so that the polarization state of the pulse laser light reflected by the second mirror 8 becomes vertically polarized to be reflected on the polarization beam splitter 3.
The second mirror 8 is used for reflecting the pulse laser passing through the second quarter wave plate 7.
The fifth reflector 13 is used for deflecting the pulse laser output by the polarization beam splitting michelson interferometer;
the first focusing lens 14 focuses the pulsed laser light reflected by the fifth reflecting mirror 13 so that the pulsed laser light is focused within the periodically poled lithium niobate crystal 19.
The pulse laser light of @780nm and 1560nm is transmitted through dichroic mirror 15, and the pulse laser light of 780nm is reflected by dichroic mirror 15.
The two-color polarization beam splitter 16 is mainly characterized in that polarization beam splitting can be performed on 1560nm and 780nm pulse laser light, and is used for polarization beam splitting of the 1560nm laser light input by the dichroic mirror 15 and polarization beam splitting of the 780nm laser light generated by the periodically polarized lithium niobate crystal 19.
The double-color half-wave plate 17 is mainly characterized in that the double-color half-wave plate can play a role of a half-wave plate for 1560nm and 780nm pulse laser and is used for carrying out polarization adjustment on the 1560nm and 780nm pulse laser.
The third mirror 18 is used to reflect 1560nm and 780nm pulsed laser light.
The periodically polarized lithium niobate crystal 19 is a nonlinear optical crystal, has the cross section size of 1mm x 2mm and the length of 5mm, is matched with the quasi-phase matching condition of a 0-type frequency doubling process of 1560nm-780nm, and is used for changing 1560nm laser into 780nm laser through frequency doubling.
The fourth mirror 20 is used to reflect 1560nm and 780nm pulsed laser light.
The first collimating lens 21 is for collimating the 780nm laser light reflected off the dichroic mirror 15.
And a second focusing lens 25 for focusing the pulsed laser collimated by the first collimating lens 21 to focus the light beam to the beta barium borate crystal 26.
The beta barium borate crystal 26 is a group of two orthogonally bonded type I (ooe) birefringent phase-matched beta barium borate crystals BBO crystals, each BBO crystal is 0.5mm thick, the phase matching angle is 30 degrees, the overall thickness is 1mm, and the beta barium borate crystal is used for doubling the frequency of 780nm pulse laser to 390nm.
The second collimating lens 27 is used for collimating the pulsed laser light after passing through the beta barium borate crystal 26.
The band-pass filter 28 has a center wavelength of 390nm and a bandwidth of 10nm, and is configured to filter 780nm fundamental frequency light after the β barium borate crystal 26 and retain 390nm frequency doubled light.
The pinhole unit 29 is used to provide pinholes for spatial filtering, optimizing the spatial mode of the pulsed laser.
And a first polarizer 30 for polarization interference of the pulsed laser light after passing through the pinhole unit 29.
A first optical power meter 31 for measuring the optical power after passing through the first polarizer 30.
Specifically, a vertical 1560nm light beam in the 1560nm pulse laser is reflected by the polarization beam splitter 3, passes through the first quarter wave plate 4, the first reflector 5 and the first quarter wave plate 4, is changed into a horizontal 1560nm light beam, is transmitted out of the polarization beam splitter 3, and is used as a horizontal emergent light of the polarization beam splitting and combining device; the 1560nm horizontal light beam in the 1560nm pulse laser is transmitted through the second quarter wave plate 7, the second reflecting mirror 8 and the second quarter wave plate 7 by the polarization beam splitter 3, then is changed into a 1560nm vertical light beam, is reflected out by the polarization beam splitter 3, and is used as the vertical emergent light of the polarization beam splitting and combining device; the light emitted by the polarization beam splitting and combining device is 1560nm light beams in a horizontal state and 1560nm light beams in a vertical state.
The 1560nm horizontal light beam and the 1560nm vertical light beam are reflected by the fifth mirror 13 as fundamental frequency light to the first focusing lens 14, and the first focusing lens 14 projects the focused light beams to the dichroic mirror 15 and transmits them. The 1560nm light beam in the horizontal state transmitted by the dichroic mirror 15 is transmitted at the dichroic polarizing beam splitter 16 and is projected at the dichroic half-wave plate 17 to become a 1560nm light beam in the vertical state, the 1560nm light beam in the vertical state is reflected to the periodically polarized lithium niobate crystal 19 through the third reflecting mirror 18, the frequency doubling is performed to obtain a 780nm light beam in the vertical state, and the 780nm light beam in the vertical state is reflected back to the dichroic mirror 15 through the fourth reflecting mirror 20 and the dichroic polarizing beam splitter 16. The 1560nm light beam in the vertical state transmitted by the dichroic mirror 15 is reflected to the periodically polarized lithium niobate crystal 19 through the dichroic polarizing beam splitter 16 and the fourth reflecting mirror 20, the frequency multiplication is performed to obtain 780nm light beam in the vertical state, the 780nm light beam in the vertical state is reflected to the bicolor half-wave plate 17 through the third reflecting mirror 18 to be changed into 780nm light beam in the horizontal state, and the 780nm light beam in the horizontal state is transmitted to the dichroic mirror 15 through the dichroic polarizing beam splitter 16.
The horizontal 780nm light beam and the vertical 780nm light beam transmitted to the dichroic mirror 15 by the dichroic mirror 15 are reflected by the dichroic mirror 15 to the first collimating lens 21 for collimation. The emergent light of the first collimating lens 21 is the emergent light of the first frequency doubling module.
The emergent light of the first frequency doubling module is filtered by a band-pass filter 28 and then output after being sequentially subjected to focusing treatment by a second focusing lens 25, frequency doubling treatment by a beta barium borate crystal 26 and collimation treatment by a second collimating lens. The beta barium borate crystal 26 doubles the frequency of 780nm light beams into 390nm light beams, and after filtering through the band-pass filter 28, the light beams output by the second frequency doubling module are 390nm light beams in a horizontal state and 390nm light beams in a vertical state. The horizontal 390nm light beam and the vertical 390nm light beam are optimized by the pinhole unit 29 and then projected to the first polarizer 30 for polarization interference. The structure of measuring the interference light emitted from the first polarizer 30 by the first optical power meter 31 is shown as a waveform (c) in fig. 4.
Example 2: phase amplification system test method based on nonlinear optical harmonic
In this embodiment, the phase amplification system based on nonlinear optical harmonics provided in the embodiment is tested to detect the change of the phase caused by the beam combination interference after the pulse laser passes through the polarized beam splitting light and is frequency-doubled.
In this embodiment, the incident ends of the first frequency doubling module and the second frequency doubling module are respectively provided with a test position to obtain the front and back optical phases of each frequency doubling module, so as to perform comparison.
It should be noted that, in order to not change the structure of the phase amplification system based on nonlinear optical harmonics during testing, each test position can only be tested one by one.
In this embodiment, when a first test position, that is, an incident end of the first frequency doubling module is tested, referring to fig. 3 (b), a first test mirror 10, a first test polarizer 11, and a first test optical power meter 12 are provided. The first test mirror 10 is used to reflect the two beams of light emitted from the polarization beam splitter 3 to the first test polarizer 11 for polarization interference, and the first test optical power meter 12 is used to receive the light emitted from the first test polarizer 11 and measure power and phase, where the measurement result is shown as a waveform (a) in fig. 4.
In this embodiment, when the second test position, that is, the incident end of the second frequency doubling module is tested, the second test mirror 22, the second test polarizer 23, and the second test optical power meter 24 are provided with reference to fig. 3 (c). The second test reflector 22 is configured to reflect two beams of light emitted from the first frequency doubling module of the polarization beam splitter to the second test polarizer 23 for polarization interference, the second test optical power meter 24 is configured to receive the emitted light from the second test polarizer 23 and measure power and phase, and the measurement structure is shown as a waveform (b) in fig. 4.
In fig. 4, a waveform (a) is a phase diagram of interference light obtained by directly combining beams and performing polarization interference after polarization beam splitting of reference light; in fig. 4, the waveform (b) is a phase diagram of interference light obtained by polarizing and splitting reference light, performing frequency doubling on each beam of light, combining the beams of light, and performing polarization interference; in fig. 4, the waveform (c) can be known as a phase diagram of the interference light obtained by polarization interference after each beam of reference light is polarized and split, and then each beam of reference light is subjected to secondary frequency multiplication and then is combined.
As can be seen from the waveforms (a), (b), and (c) in fig. 4, the period of change in the interference intensity of the combined light becomes 1/2 of the original period of change in the interference intensity with each increase in the frequency multiplication of the polarized and split light, and since the phase of the light beam and the period of change in the interference intensity are in an inversely proportional relationship, the phase =2 pi/T, and T represents the period of change in the interference intensity. It can be seen that, each time the polarized and split light is multiplied, the change speed of the interference intensity of the combined beam light is increased to 2 times before the frequency multiplication, i.e. the phase change speed of the interference intensity of the combined beam light is 2 times of the phase change speed of the interference intensity of the reference beam light split direct-coupled beam light after the polarized and split light, i.e. the reference beam light split is multiplied m times m And (4) doubling.
The principle of the conventional MZ (mach-zehnder) interferometer is shown in fig. 1 (b), and includes a beam splitter i 100, a beam splitter ii 400, a mirror i 500, and a mirror ii 600, and the operating principle is as follows: the beam splitter I100 receives the laser emitted by the laser 1 and carries out the laser translationThe light fields of the two split beams are respectively marked as E 1 (omega) and E 2 (ω) that are redirected through mirror I500 and mirror II 600 and combined at beamsplitter II 400. At this time, light field E of outgoing light from beam splitter II 400 L (ω) is calculated according to the following equation:
E L (ω)=E 1 (ω)+e iΦ(ω) E 2 (ω)；
the interference intensity distribution of the emergent light of the beam splitter II 400 is as follows:
I(ω){1+cos[Φ(ω)]}；
wherein, E L (omega) represents the light field of the emergent light of the beam splitter II 400, phi (omega) represents the phase difference between the two beams of light split by the beam splitter I100, e represents a natural constant, I represents an imaginary number, I (omega) represents the light intensity of the reference light, and phi (omega) represents the phase change speed of the interference intensity of the two beams of light split by the beam splitter I100 without direct interference of frequency doubling, namely the phase difference of the two beams of light split by the beam splitter I100.
As can be seen from fig. 4, after the first frequency doubling, the phase difference between the two paths of the interferometer is amplified from Φ (ω) to 2 × Φ (ω), the period of change of the interference intensity of the first frequency doubling light becomes half of the period of change of the interference intensity of the reference light, and the phase difference is amplified by 2 times.
As can be seen from the experimental results shown in FIG. 4, the light field in FIG. 1 (a) is E 1 (omega) and E 2 Two beams of light of (omega) are subjected to frequency multiplication by the frequency multiplication module a200 and the frequency multiplication module b300 respectively and then are combined at the beam splitter II 400, and the process of carrying out primary frequency multiplication on the light beams by the frequency multiplication module a200 and the frequency multiplication module b300 is the process of carrying out 2-order harmonic on the light beams. At this time, the light field E of the emergent light of the frequency doubled beam splitter II 400 NL (2 ω) is calculated according to the following formula:
E NL (2ω)=E 1 '(2ω)+e i2Φ(ω)+iΔΦ(2ω) E 2 '(2ω)；
the interference intensity distribution of emergent light of the frequency-doubled beam splitter II 400 is as follows:
I(2ω){1+cos[2Φ(ω)+ΔΦ(2ω)]}；
wherein E is 1 ' (2. Omega.) denotes the light field as E 1 The light field E of the light beam after the frequency doubling module b300 frequency-doubled 1 ' (2. Omega.) and E 1 The square of (ω) is in direct proportion; e 2 ' (2. Omega.) denotes the light field as E 2 (omega) light beam passing through the frequency doubling module a200 to obtain light field of frequency doubled light beam, E 2 ' (2. Omega.) and E 2 The square of (ω) is in direct proportion; i (2 ω) represents the light intensity of the light polarized and split by the reference light after passing through the first frequency doubling, and 2 Φ (ω) represents the phase difference between the light beam frequency-doubled by the frequency doubling module a200 and the light beam frequency-doubled by the frequency doubling module b300, that is, the phase difference of the light polarized and split by the reference light after passing through the first frequency doubling; Δ Φ (2 ω) represents a frequency doubling offset parameter after the polarized split light of the reference light passes through the frequency doubling module a200 and the frequency doubling module b300, respectively.
It is further derived that, if the MZ interferometer includes an nth harmonic generation process,
then pass through the n harmonic, log 2 Output light field E after n times of frequency multiplication NL (ω) is calculated according to the following equation:
E NL (nω)=E 1 '(nω)+e inΦ(ω)+iΔΦ(nω) E 2 '(nω)；
the interference intensity distribution of the output light after n harmonics is as follows:
I(nω){1+cos[nΦ(ω)+ΔΦ(nω)]}；
wherein n Φ (ω) represents a phase difference of two beam-splitting paths, that is, a phase difference of light after n harmonics of the light polarized and split by the reference light; the phase difference of the two beams of light after passing through n-th harmonic waves is amplified by n times compared with the phase difference phi (omega) of the light after polarization splitting of the reference light. I (n ω) is the intensity of light after n harmonics of the light polarized and split by the reference light, and the phase change speed of the interference intensity of the combined light after n harmonics is proportional to n Φ (ω) and is n times the phase change speed Φ (ω) of the interference intensity of the light directly combined after polarization splitting by the reference light. And delta phi (n omega) is a phase offset parameter of the combined beam after the light subjected to the polarization splitting of the reference light passes through n-th harmonic waves respectively, is an optical harmonic phase difference term introduced by all frequency doubling modules and comprises the phase difference of the light beams from 2-th harmonic waves to n-th harmonic waves.
The phase change of the light beam in fig. 1 (a) and 1 (b) can be obtained by a detection module 700, and the detection module 700 can specifically use an optical power meter.
The present invention is not limited to the above embodiments, and any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A phase amplification method based on nonlinear optical harmonic waves is characterized in that polarized beam splitting is carried out on reference light to obtain light beams a and light beams b with different polarization states, the light beams a and the light beams b are subjected to m-time frequency multiplication and then combined and interfered to obtain light beams a and light beams b, and the light beams a and the light beams b respectively pass through 2 times m The combined beam after the sub-harmonic is interfered light, so that the phase of the interfered light is 2 of the reference light m And (4) doubling.
2. The nonlinear optical harmonic based phase amplification method according to claim 1, wherein the propagation paths of the polarization-divided light beam a and the polarization-divided light beam b are the same.
3. The nonlinear optical harmonic based phase amplification method of claim 1, wherein the optical field of the combined beam after n harmonics is:
E NL (nω)=E 1 '(nω)+e inΦ(ω)+iΔΦ(nω) E 2 '(nω)；
the interference intensity distribution of the beam combining light after n harmonics is as follows:
I(nω){1+cos[nΦ(ω)+ΔΦ(nω)]}；
wherein E is NL (n ω) represents the light field of the combined beam obtained by subjecting the reference light polarization-divided beam a and the reference light polarization-divided beam b to n harmonics, respectively, E 1 ' (n ω) denotes the light field of the light beam a after passing through the n-th harmonic, E 2 ' (n ω) denotes the optical field of beam b after n harmonics; Φ (ω) represents the phase difference between beam a and beam b; delta phi (n omega) is a phase offset parameter of the light beam a and the light beam b after passing through n harmonics respectively, e represents a natural constant, and i represents an imaginaryCounting;
i (n ω) is the intensity of the polarized beam-split light after n harmonics.
4. A nonlinear optical harmonic based phase amplification system for implementing the nonlinear optical harmonic based phase amplification method of claim 1 or 3, the system comprising: the device comprises a polarization beam splitting and combining device, a frequency doubling module and an interference module;
the polarization beam splitting and combining device is used for receiving the reference light, and splitting the reference light after polarization to form a light beam a and a light beam b;
the frequency doubling module is arranged on the propagation paths of the light beam a and the light beam b and is used for carrying out frequency doubling treatment on the light beam a and the light beam b, and the frequency doubling times of the light beam a and the light beam b are the same;
the interference module is used for receiving the light beam a and the light beam b after frequency doubling processing and carrying out polarization interference.
5. The nonlinear optical harmonic based phase amplification system of claim 4, wherein the propagation paths of the light beams a and b are the same, and the plurality of frequency doubling modules are sequentially disposed on the light path.
6. The nonlinear optical harmonic based phase amplification system of claim 4, wherein the polarization beam splitting and combining means comprises: the device comprises a half-wave plate (2), a polarization beam splitter (3), a first quarter-wave plate (4), a first reflector (5), a second quarter-wave plate (7) and a second reflector (8);
the half-wave plate (2) is arranged at the incident end of the polarization beam splitter (3) and is used for adjusting the splitting power proportion of the polarization beam splitter (3); the polarization beam splitter (3) is used for carrying out polarization beam splitting on the light beam after the polarization of the light beam is adjusted by the half-wave plate (2);
the first reflector (5) is arranged on a reflected light propagation path of the polarization beam splitter (3), the first quarter wave plate (4) is arranged on an incident surface of the first reflector (5), and the first quarter wave plate (4) is used for adjusting the polarization of the reflected light of the polarization beam splitter (3); the first reflector (5) is used for reflecting the light passing through the first quarter-wave plate (4);
the second reflector (8) is arranged on the transmission light propagation path of the polarization beam splitter (3), and the second quarter wave plate (7) is arranged on the incident surface of the second reflector (8); the second quarter wave plate (7) is used for adjusting the polarization of the transmitted light of the polarization beam splitter (3) so that the light reflected by the second reflecting mirror (8) is reflected on the polarization beam splitter (3).
7. The nonlinear optical harmonic based phase amplification system of claim 5, wherein the polarization beam splitting and combining device further comprises a displacement stage (6) and a piezoelectric ceramic (9); the displacement table (6) is used for bearing the first reflector (5), and the displacement table (6) is installed in a sliding mode;
the half-wave plate (2), the polarization beam splitter (3), the first quarter-wave plate (4), the first reflector (5), the displacement table (6), the second quarter-wave plate (7), the second reflector (8) and the piezoelectric ceramic (9) are combined to form the polarization beam splitting Michelson interferometer, and the displacement table (6) is used for correcting the arm difference of the polarization Michelson interferometer; the piezoelectric ceramic (9) is arranged on the back surface of the second reflecting mirror (8) and is used for scanning the arm difference of the polarization Michelson interferometer.
8. The nonlinear optical harmonic based phase amplification system of claim 4, wherein the interference module comprises an aperture unit (29) and a first polarizer (30); the pinhole unit (29) is positioned on the light-emitting direction of the last frequency doubling module on the light path, and the first polarizer (30) is used for receiving emergent light passing through the pinhole unit (29), performing polarization interference and outputting the emergent light.
9. Phase amplification system based on nonlinear optical harmonics according to claim 4, further comprising a laser (1), the laser (1) being adapted to emit reference light;
the frequency doubling module comprises: the device comprises a first focusing lens (14), a dichroic mirror (15), a two-color polarization beam splitter (16), a two-color half-wave plate (17), a third reflector (18), a periodically polarized lithium niobate crystal (19), a fourth reflector (20) and a first collimating lens (21);
the first focusing lens (14) is arranged in the incident direction of the dichroic mirror (15), and the first focusing lens (14) is used for focusing incident light so that the focused light beams are transmitted on the incident surface of the dichroic mirror (15);
the dichroic polarizing beam splitter (16) is arranged in the transmission direction of the dichroic mirror (15), and the first collimating lens (21) is arranged in the reflection direction of the dichroic mirror (15);
the dichroic half-wave plate (17) and the third reflector (18) are sequentially arranged in the outgoing direction of the transmitted light of the dichroic polarization beam splitter (16), and the fourth reflector (20) is arranged in the outgoing direction of the reflected light of the dichroic polarization beam splitter (16); a periodically poled lithium niobate crystal (19) is arranged between the third mirror (18) and the fourth mirror (20);
transmitted light emitted by the dichroic polarizing beam splitter (16) is subjected to polarization state adjustment by a dichroic half-wave plate (17), then is reflected to a periodically polarized lithium niobate crystal (19) by a third reflector (18) for frequency doubling treatment, then is reflected back to the dichroic mirror (15) by a fourth reflector (20), and is reflected back to the dichroic mirror (15) by the dichroic polarizing beam splitter (16);
reflected light emitted by the dichroic polarizing beam splitter (16) is reflected to the periodically polarized lithium niobate crystal (19) by the fourth reflector (20) for frequency doubling treatment, is projected to the dichroic half-wave plate (17) by the third reflector (18) to adjust the polarization state, and is transmitted back to the dichroic mirror (15) by the dichroic polarizing beam splitter (16);
the light beams projected to the dichroic mirror (15) by the dichroic polarizing beam splitter (16) are reflected to a first collimating lens (21) for collimation treatment;
or the frequency doubling module comprises a second focusing lens (25), a beta barium borate crystal (26), a second collimating lens (27) and a band-pass filter (28) which are sequentially arranged along the light propagation direction, incident light is focused by the second focusing lens (25), frequency doubled by the beta barium borate crystal (26), collimated by the second collimating lens (27) and then projected to the band-pass filter (28) for spatial filtering.
10. A phase amplification system test method based on nonlinear optical harmonics is characterized by comprising the following steps:
s1, building a nonlinear optical harmonic based phase amplification system according to any one of claims 4-9;
s2, setting a test position at the incident end of each frequency doubling module along the light propagation direction of the light path;
s3, testing the phase of the interference light passing through the interference module, and testing the phase of the light beam at each testing position after polarization interference;
when a test position is tested, the test reflector is arranged at the test position, the test polarizer and the test light power meter are sequentially arranged in the light outgoing direction of the test reflector, the test polarizer is used for carrying out polarization interference on the light beam a and the light beam b reflected by the test reflector, and the test light power meter is used for measuring the power and the phase of interference light passing through the test polarizer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211478791.XA CN115542629A (en) | 2022-11-24 | 2022-11-24 | Phase amplification method, system and test method based on nonlinear optical harmonic |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211478791.XA CN115542629A (en) | 2022-11-24 | 2022-11-24 | Phase amplification method, system and test method based on nonlinear optical harmonic |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115542629A true CN115542629A (en) | 2022-12-30 |
Family
ID=84721193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211478791.XA Pending CN115542629A (en) | 2022-11-24 | 2022-11-24 | Phase amplification method, system and test method based on nonlinear optical harmonic |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115542629A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116379961A (en) * | 2023-06-05 | 2023-07-04 | 广东普洛宇飞生物科技有限公司 | Phase measurement system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1773359A (en) * | 2004-11-12 | 2006-05-17 | 中国科学院光电技术研究所 | Efficient laser frequency doubler |
| CN110908216A (en) * | 2019-12-18 | 2020-03-24 | 青岛鲲腾量子应用技术有限公司 | Vector beam-based nonlinear frequency conversion device |
| CN114333522A (en) * | 2021-12-16 | 2022-04-12 | 青岛鲲腾量子应用技术有限公司 | Single-photon and double-photon interference device and control method thereof |
-
2022
- 2022-11-24 CN CN202211478791.XA patent/CN115542629A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1773359A (en) * | 2004-11-12 | 2006-05-17 | 中国科学院光电技术研究所 | Efficient laser frequency doubler |
| CN110908216A (en) * | 2019-12-18 | 2020-03-24 | 青岛鲲腾量子应用技术有限公司 | Vector beam-based nonlinear frequency conversion device |
| CN114333522A (en) * | 2021-12-16 | 2022-04-12 | 青岛鲲腾量子应用技术有限公司 | Single-photon and double-photon interference device and control method thereof |
Non-Patent Citations (1)
| Title |
|---|
| WU-ZHEN LI、 CHEN YANG、ZHI-YUAN ZHOU ET AL.: "《Harmonics-assisted optical phase amplifier》", 《 LIGHT: SCIENCE & APPLICATIONS》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116379961A (en) * | 2023-06-05 | 2023-07-04 | 广东普洛宇飞生物科技有限公司 | Phase measurement system and method |
| CN116379961B (en) * | 2023-06-05 | 2023-08-11 | 广东普洛宇飞生物科技有限公司 | Phase measurement system and method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0194941B1 (en) | Heterodyne interferometer system | |
| CN109839644B (en) | Real-time absolute ranging method and system based on single-cavity double-femtosecond optical comb cross-correlation analysis | |
| US8228507B2 (en) | Quantum entanglement generating system and method, and quantum entanglement generating and detecting system and method | |
| US20060192975A1 (en) | Surface shape measuring apparatus | |
| CN101216350B (en) | High power ultra-short laser pulse contrast measuring apparatus and measurement method | |
| Chen et al. | Remote distribution of a mode-locked pulse train with sub 40-as jitter | |
| Middleton et al. | Polarization shaping in the mid-IR and polarization-based balanced heterodyne detection with application to 2D IR spectroscopy | |
| CN111721732B (en) | Device for measuring infrared multidimensional spectrum of gas based on multi-optical comb system and working method | |
| CN115542629A (en) | Phase amplification method, system and test method based on nonlinear optical harmonic | |
| EP1027756A1 (en) | Apparatus for generating orthogonally polarized beams having different frequencies | |
| US6813951B2 (en) | Laser-ultrasonic testing system | |
| WO2021143580A1 (en) | Measuring instrument and method for ultrashort pulse laser | |
| CN215339483U (en) | Gas molecule absorption signal enhancement system | |
| CN201166588Y (en) | Apparatus for measuring high power ultra-short laser pulse contrast | |
| US5852620A (en) | Tunable time plate | |
| Glöckl et al. | Verifying continuous-variable entanglement of intense light pulses | |
| US6108085A (en) | Interferometric auto-correlator using third-order nonlinearity | |
| Mezrich et al. | Ultrasonic waves: their interferometric measurement and display | |
| JP3533651B1 (en) | Time-resolved nonlinear susceptibility measurement system | |
| CN112098736A (en) | Method for measuring phase of microwave electric field | |
| CN201107265Y (en) | Collinear femtosecond laser polarization pumping probe system | |
| Antończak et al. | Laser Doppler vibrometry with a single-frequency microchip green laser | |
| CN103048843B (en) | Continuous variable quantum state frequency transformation device | |
| CN111060896A (en) | Large-range and high-precision absolute distance measuring instrument based on OEO (optical output interface) quick switching | |
| Okada et al. | Interference method of accurate determination of the relative magnitude of nonlinear optical coefficients |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20221230 |
|
| RJ01 | Rejection of invention patent application after publication |